{"id":"https://openalex.org/W2810128013","doi":"https://doi.org/10.1109/ets.2018.8400700","title":"Challenges in Cell-Aware Test","display_name":"Challenges in Cell-Aware Test","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2810128013","doi":"https://doi.org/10.1109/ets.2018.8400700","mag":"2810128013"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2018.8400700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2018.8400700","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036014072","display_name":"Shreyas Pramod Dixit","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shreyas Pramod Dixit","raw_affiliation_strings":["Arm Embedded Technologies Pvt. Ltd., Bengaluru, Karnataka, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arm Embedded Technologies Pvt. Ltd., Bengaluru, Karnataka, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040174801","display_name":"Divyeshkumar Dhanjibhai Vora","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Divyeshkumar Dhanjibhai Vora","raw_affiliation_strings":["Arm Embedded Technologies Pvt. Ltd., Bengaluru, Karnataka, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arm Embedded Technologies Pvt. Ltd., Bengaluru, Karnataka, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101499823","display_name":"Ke Peng","orcid":"https://orcid.org/0000-0002-4972-6457"},"institutions":[{"id":"https://openalex.org/I4210156213","display_name":"American Rock Mechanics Association","ror":"https://ror.org/05vfrxy92","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210156213"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ke Peng","raw_affiliation_strings":["Arm Inc, Austin, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arm Inc, Austin, Texas, USA","institution_ids":["https://openalex.org/I4210156213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8884245157241821},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7518526315689087},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6100517511367798},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.59173983335495},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5513331294059753},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5323911905288696},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.5283641815185547},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5027635097503662},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.461615651845932},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44519925117492676},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4449065029621124},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.43872085213661194},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4328119456768036},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4051271677017212},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3033818006515503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2356995940208435},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17355585098266602},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14338141679763794},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11261609196662903}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8884245157241821},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7518526315689087},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6100517511367798},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.59173983335495},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5513331294059753},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5323911905288696},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.5283641815185547},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5027635097503662},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.461615651845932},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44519925117492676},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4449065029621124},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.43872085213661194},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4328119456768036},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4051271677017212},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3033818006515503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2356995940208435},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17355585098266602},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14338141679763794},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11261609196662903},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2018.8400700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2018.8400700","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2008990681","https://openalex.org/W2034030717","https://openalex.org/W2061946964","https://openalex.org/W2096007426","https://openalex.org/W2120349980","https://openalex.org/W2120956034","https://openalex.org/W2124692465","https://openalex.org/W2127145135","https://openalex.org/W2149917222","https://openalex.org/W3147331103"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W3147038789","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W2568949342","https://openalex.org/W4253743993","https://openalex.org/W1923485359"],"abstract_inverted_index":{"Physical":[0],"defects":[1,6,97,116,124],"like":[2,27],"opens":[3],"and":[4,31,37,62,86,175,185,192,232,241,258],"bridging":[5],"can":[7,112],"occur":[8,98],"during":[9],"the":[10,42,52,89,100,173,182,186,203,207,226,255,261],"fabrication":[11],"process":[12],"of":[13,20,96,147,150,172,206,221,260],"integrated":[14],"circuits.":[15],"The":[16,71,235],"logic":[17],"level":[18],"abstraction":[19],"these":[21,59],"physical":[22],"defects,":[23,159],"named":[24],"fault":[25,60,78],"models":[26,61,79],"stuck-at,":[28],"transition,":[29],"bridge,":[30],"small-delay":[32],"defect,":[33],"have":[34],"been":[35],"proposed,":[36],"are":[38,67,103,179],"widely":[39],"used":[40],"in":[41,237],"industry":[43],"for":[44,155,189],"Automatic":[45],"Test":[46,127],"Pattern":[47],"Generation":[48],"(ATPG).":[49],"However,":[50],"as":[51],"technology":[53],"moves":[54],"to":[55,130,199,229,246],"increasingly":[56],"smaller":[57],"geometries,":[58],"their":[63],"associated":[64],"test":[65,114,242],"patterns":[66,120,177],"becoming":[68],"less":[69],"effective.":[70],"reason":[72],"behind":[73],"this":[74,132],"is":[75,142,250],"that":[76,178],"existing":[77],"only":[80],"consider":[81],"faults":[82],"on":[83,202],"cell":[84,193],"inputs":[85],"outputs,":[87],"plus":[88],"interconnects":[90],"between":[91],"them.":[92],"A":[93],"growing":[94],"number":[95],"within":[99],"cells,":[101],"which":[102,121,160,224,253],"not":[104],"explicitly":[105],"targeted":[106],"by":[107,117,134,181,214],"traditional":[108,187,265],"ATPG.":[109,266],"N-detect":[110],"algorithms":[111],"potentially":[113],"such":[115],"generating":[118],"multiple":[119],"detect":[122],"cell-internal":[123],"randomly.":[125],"Cell-Aware":[126],"(CAT)":[128],"tries":[129],"solve":[131],"problem":[133],"uniquely":[135],"targeting":[136],"every":[137],"possible":[138,152,158],"internal":[139],"defect.":[140],"This":[141,167,195],"done":[143],"via":[144],"a":[145,163,170],"series":[146],"analog":[148,222],"simulations":[149],"all":[151,156],"input":[153],"combinations":[154],"identified":[157],"come":[161],"at":[162],"significant":[164],"runtime":[165],"penalty.":[166],"paper":[168,196],"shows":[169],"comparison":[171],"static":[174],"transition":[176],"generated":[180,208],"CAT":[183,262],"methodology":[184],"ATPG":[188],"different":[190,219],"library":[191],"parameters.":[194],"also":[197,251],"aims":[198],"throw":[200],"light":[201],"quality":[204],"concerns":[205],"User":[209],"Defined":[210],"Fault":[211],"Model":[212],"(UDFM)":[213],"comparing":[215],"results":[216],"while":[217],"varying":[218],"parameters":[220],"simulations,":[223],"reflect":[225],"variation":[227],"due":[228],"Process,":[230],"Voltage":[231],"Temperature":[233],"(PVT).":[234],"increase":[236],"performance,":[238],"pattern":[239],"count":[240],"coverage":[243],"with":[244],"respect":[245],"two":[247],"Arm":[248],"designs":[249],"presented,":[252],"reflects":[254],"actual":[256],"cost":[257],"gains":[259],"model":[263],"over":[264]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}