{"id":"https://openalex.org/W2734950922","doi":"https://doi.org/10.1109/ets.2017.7968231","title":"Multiple-defect diagnosis for Logic Characterization Vehicles","display_name":"Multiple-defect diagnosis for Logic Characterization Vehicles","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2734950922","doi":"https://doi.org/10.1109/ets.2017.7968231","mag":"2734950922"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2017.7968231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2017.7968231","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003670191","display_name":"Ben Niewenhuis","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ben Niewenhuis","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011949952","display_name":"Soumya Mittal","orcid":"https://orcid.org/0000-0001-8262-3313"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soumya Mittal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039038157","display_name":"R. D. Blanton","orcid":"https://orcid.org/0000-0001-6108-2925"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. D. Blanton","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, US"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, US","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5003670191"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":1.1266,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.78795095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.6515746116638184},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.62618488073349},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.625961422920227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.617904007434845},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5645615458488464},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5104693174362183},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.486757755279541},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44547489285469055},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4425903856754303},{"id":"https://openalex.org/keywords/high-resolution","display_name":"High resolution","score":0.423970103263855},{"id":"https://openalex.org/keywords/logic-block","display_name":"Logic block","score":0.417648583650589},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.39767682552337646},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3584611713886261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24801144003868103},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21646246314048767},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16145306825637817},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1310025155544281},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.11889967322349548},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11740946769714355},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.08377227187156677}],"concepts":[{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.6515746116638184},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.62618488073349},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.625961422920227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.617904007434845},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5645615458488464},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5104693174362183},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.486757755279541},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44547489285469055},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4425903856754303},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.423970103263855},{"id":"https://openalex.org/C2778325283","wikidata":"https://www.wikidata.org/wiki/Q1125244","display_name":"Logic block","level":3,"score":0.417648583650589},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.39767682552337646},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3584611713886261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24801144003868103},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21646246314048767},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16145306825637817},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1310025155544281},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.11889967322349548},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11740946769714355},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.08377227187156677},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2017.7968231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2017.7968231","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1597295079","https://openalex.org/W1822750977","https://openalex.org/W2004516571","https://openalex.org/W2005960695","https://openalex.org/W2171908682","https://openalex.org/W2187831645","https://openalex.org/W2345901286","https://openalex.org/W2567791876","https://openalex.org/W2567901352","https://openalex.org/W6705108459"],"related_works":["https://openalex.org/W1977662468","https://openalex.org/W2249172363","https://openalex.org/W2182005210","https://openalex.org/W2384363195","https://openalex.org/W2166461639","https://openalex.org/W2375573551","https://openalex.org/W1573459484","https://openalex.org/W2977557576","https://openalex.org/W2371541858","https://openalex.org/W1990901299"],"abstract_inverted_index":{"Previous":[0],"work":[1],"on":[2],"the":[3,12,43,78,89,93,102],"Carnegie":[4],"Mellon":[5],"Logic":[6],"Characterization":[7],"Vehicle":[8],"(CM-LCV)":[9],"has":[10],"emphasized":[11],"diagnosability":[13],"properties":[14,41],"of":[15,19,42,68,77,82,88,96,105],"a":[16,32,62],"specific":[17],"class":[18],"regular":[20],"circuits":[21],"called":[22],"functional":[23],"unit":[24],"block":[25],"arrays":[26],"(FUB":[27],"arrays).":[28],"This":[29,50],"paper":[30],"describes":[31],"multiple-defect,":[33],"two-level":[34],"diagnosis":[35,52,60,72],"procedure":[36,53],"that":[37],"leverages":[38],"these":[39],"unique":[40],"FUB":[44],"array":[45],"to":[46],"significantly":[47],"improve":[48],"diagnosis.":[49],"custom":[51],"is":[54,73],"implemented":[55],"and":[56,99],"evaluated":[57],"against":[58],"commercial":[59,94],"using":[61],"simulated":[63],"fault-injection":[64],"experiment":[65],"involving":[66],"pairs":[67],"injected":[69],"faults.":[70],"Custom":[71],"accurate":[74,98],"in":[75],"98.2%":[76],"simulations":[79],"with":[80,101],"resolution":[81],"at":[83],"most":[84],"five":[85],"for":[86],"94.1%":[87],"simulations,":[90],"improving":[91],"upon":[92],"results":[95],"70.7%":[97],"85.0%":[100],"same":[103],"level":[104],"resolution.":[106]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}