{"id":"https://openalex.org/W2736261391","doi":"https://doi.org/10.1109/ets.2017.7968209","title":"Mitigating read & write errors in STT-MRAM memories under DVS","display_name":"Mitigating read & write errors in STT-MRAM memories under DVS","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2736261391","doi":"https://doi.org/10.1109/ets.2017.7968209","mag":"2736261391"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2017.7968209","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2017.7968209","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071009840","display_name":"Elena Ioana Vatajelu","orcid":"https://orcid.org/0000-0002-4588-1812"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Elena Ioana Vatajelu","raw_affiliation_strings":["TIMA, CNRS, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA, CNRS, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047134367","display_name":"R. Rodr\u00edguez\u2010Monta\u00f1\u00e9s","orcid":"https://orcid.org/0000-0001-6231-0862"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Rosa Rodriguez-Montanes","raw_affiliation_strings":["Dept. of Electronic Engineering Barcelona, Universitat Polit\u00e8cnica de Catalunya, Spain","UPC - Universitat Polit\u00e8cnica de Catalunya =  Universit\u00e9 polytechnique de Catalogne  [Barcelona] (C./Jordi Girona, 1-3, 08034 Barcelona - Spain)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronic Engineering Barcelona, Universitat Polit\u00e8cnica de Catalunya, Spain","institution_ids":["https://openalex.org/I9617848"]},{"raw_affiliation_string":"UPC - Universitat Polit\u00e8cnica de Catalunya =  Universit\u00e9 polytechnique de Catalogne  [Barcelona] (C./Jordi Girona, 1-3, 08034 Barcelona - Spain)","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES","FR"],"is_corresponding":false,"raw_author_name":"Michel Renovell","raw_affiliation_strings":["Dept. of Electronic Engineering Barcelona, Universitat Polit\u00e8cnica de Catalunya, Spain","TEST - Test and dEpendability of microelectronic integrated SysTems (LIRMM, 161 rue Ada, 34000 Montpellier - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronic Engineering Barcelona, Universitat Polit\u00e8cnica de Catalunya, Spain","institution_ids":["https://openalex.org/I9617848"]},{"raw_affiliation_string":"TEST - Test and dEpendability of microelectronic integrated SysTems (LIRMM, 161 rue Ada, 34000 Montpellier - France)","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012439108","display_name":"Joan Figueras","orcid":"https://orcid.org/0000-0003-4203-0788"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES","FR"],"is_corresponding":false,"raw_author_name":"Joan Figueras","raw_affiliation_strings":["LIRMM (Universit\u00e9 Montpellier/CNRS, Montpellier, France","UPC - Universitat Polit\u00e8cnica de Catalunya =  Universit\u00e9 polytechnique de Catalogne  [Barcelona] (C./Jordi Girona, 1-3, 08034 Barcelona - Spain)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM (Universit\u00e9 Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"UPC - Universitat Polit\u00e8cnica de Catalunya =  Universit\u00e9 polytechnique de Catalogne  [Barcelona] (C./Jordi Girona, 1-3, 08034 Barcelona - Spain)","institution_ids":["https://openalex.org/I9617848"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.8577734231948853},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7687680721282959},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6458167433738708},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.641738772392273},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5755346417427063},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.48162907361984253},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39605584740638733},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.3857836127281189},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.26171404123306274},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24952885508537292},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15728583931922913},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1115155816078186}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.8577734231948853},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7687680721282959},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6458167433738708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.641738772392273},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5755346417427063},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.48162907361984253},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39605584740638733},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.3857836127281189},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.26171404123306274},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24952885508537292},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15728583931922913},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1115155816078186},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets.2017.7968209","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2017.7968209","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01525720v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01525720","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968209⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1974831841","https://openalex.org/W2002508292","https://openalex.org/W2006456384","https://openalex.org/W2138384063","https://openalex.org/W2337180699"],"related_works":["https://openalex.org/W2171162600","https://openalex.org/W2002108625","https://openalex.org/W2375427054","https://openalex.org/W2601736132","https://openalex.org/W1993178305","https://openalex.org/W2700018028","https://openalex.org/W2163958441","https://openalex.org/W2076707939","https://openalex.org/W1576547964","https://openalex.org/W2342993049"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"propose":[4],"a":[5,16,49],"methodology":[6,28],"for":[7,48],"reliability":[8,67],"evaluation,":[9],"failure":[10,13,36,46],"prediction,":[11],"and":[12],"mitigation":[14],"of":[15,34],"STT-MRAM":[17],"memory":[18,45,66],"under":[19],"different":[20],"supply":[21,61],"voltage":[22,62],"conditions":[23],"(i.e.,":[24],"DVS":[25,51],"scenarios).":[26],"The":[27,53],"is":[29,68],"based":[30],"on":[31],"the":[32,44,60,65],"design":[33],"read/write":[35],"predictor":[37],"registers":[38],"which":[39],"are":[40,56],"able":[41],"to":[42,58],"predict":[43],"probability":[47],"given":[50],"scenario.":[52],"predicted":[54],"results":[55],"used":[57],"re-tune":[59],"such":[63],"that":[64],"assured.":[69]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2017-07-21T00:00:00"}