{"id":"https://openalex.org/W2496663820","doi":"https://doi.org/10.1109/ets.2016.7519296","title":"A low-cost susceptibility analysis methodology to selectively harden logic circuits","display_name":"A low-cost susceptibility analysis methodology to selectively harden logic circuits","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2496663820","doi":"https://doi.org/10.1109/ets.2016.7519296","mag":"2496663820"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2016.7519296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048854634","display_name":"Imran Wali","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"I. Wali","raw_affiliation_strings":["LIRMM University of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108141542","display_name":"Bastien Deveautour","orcid":"https://orcid.org/0000-0003-1055-2696"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Deveautour","raw_affiliation_strings":["LIRMM University of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Virazel","raw_affiliation_strings":["LIRMM University of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bosio","raw_affiliation_strings":["LIRMM University of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["LIRMM University of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Torino, Piemonte, IT"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Piemonte, IT","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5048854634"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":0.5593,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.71115095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7399923801422119},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5734862089157104},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5319231748580933},{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.5172170400619507},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.4914900064468384},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4598354697227478},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.44931429624557495},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4437706172466278},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.44093257188796997},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.41969186067581177},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4142526090145111},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2704685926437378},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2302233874797821},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13116559386253357}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7399923801422119},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5734862089157104},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5319231748580933},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.5172170400619507},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.4914900064468384},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4598354697227478},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.44931429624557495},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4437706172466278},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.44093257188796997},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.41969186067581177},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4142526090145111},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2704685926437378},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2302233874797821},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13116559386253357},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets.2016.7519296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01444734v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01444734","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ets16.nl/","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1499133740","https://openalex.org/W1999799697","https://openalex.org/W2004688003","https://openalex.org/W2104122494","https://openalex.org/W2128248970","https://openalex.org/W2146543277"],"related_works":["https://openalex.org/W2098419840","https://openalex.org/W1966764473","https://openalex.org/W2789349722","https://openalex.org/W4281558578","https://openalex.org/W1985308002","https://openalex.org/W2766377030","https://openalex.org/W1977171228","https://openalex.org/W2121963733","https://openalex.org/W2170504327","https://openalex.org/W2041787842"],"abstract_inverted_index":{"Selecting":[0],"the":[1,45,66],"ideal":[2],"trade-off":[3],"between":[4],"reliability":[5],"and":[6,56,85],"cost":[7],"associated":[8],"with":[9,29,52,80],"a":[10,37,81],"fault":[11],"tolerant":[12],"architecture":[13],"generally":[14],"involves":[15],"an":[16],"extensive":[17],"design":[18,30],"space":[19],"exploration.":[20],"Employing":[21],"state-of-the-art":[22],"susceptibility":[23,39],"estimation":[24],"methods":[25],"makes":[26],"it":[27],"unscalable":[28],"complexity.":[31],"In":[32],"this":[33],"paper":[34],"we":[35],"introduce":[36],"low-cost":[38],"analysis":[40],"methodology":[41,67],"that":[42,65],"helps":[43],"identifying":[44],"most":[46],"vulnerable":[47],"circuit":[48],"elements":[49],"for":[50],"hardening":[51],"less":[53],"computational":[54,74],"effort":[55,75],"orders":[57],"of":[58,73,91],"magnitude":[59],"faster.":[60],"Our":[61],"experimental":[62],"results":[63,87],"show":[64],"offers":[68],"huge":[69],"gain":[70],"in":[71,78],"terms":[72],"(2,500\u00d7":[76],"faster)":[77],"comparison":[79],"fault-injection":[82],"based":[83],"method":[84],"produces":[86],"within":[88],"acceptable":[89],"degree":[90],"accuracy.":[92]},"counts_by_year":[{"year":2017,"cited_by_count":3}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2016-08-23T00:00:00"}