{"id":"https://openalex.org/W2487440925","doi":"https://doi.org/10.1109/ets.2016.7519295","title":"On coverage of timing related faults at board level","display_name":"On coverage of timing related faults at board level","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2487440925","doi":"https://doi.org/10.1109/ets.2016.7519295","mag":"2487440925"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2016.7519295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519295","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Testonica Lab, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Testonica Lab, Tallinn, Estonia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021757495","display_name":"Igor Aleksejev","orcid":"https://orcid.org/0000-0001-5931-0167"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Igor Aleksejev","raw_affiliation_strings":["Dept. of Comp. Engineering, Tallinn Univ. of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Comp. Engineering, Tallinn Univ. of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054970559","display_name":"Sergei Devadze","orcid":"https://orcid.org/0000-0001-7445-3801"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Sergei Devadze","raw_affiliation_strings":["Dept. of Comp. Engineering, Tallinn Univ. of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Comp. Engineering, Tallinn Univ. of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7172836661338806},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6775846481323242},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.6018028855323792},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5200814604759216},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5085872411727905},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4610769748687744},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34244680404663086},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.34039998054504395},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3218131363391876},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19249621033668518},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12967133522033691},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08277997374534607},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.0694303810596466}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7172836661338806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6775846481323242},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.6018028855323792},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5200814604759216},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5085872411727905},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4610769748687744},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34244680404663086},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.34039998054504395},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3218131363391876},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19249621033668518},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12967133522033691},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08277997374534607},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0694303810596466},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2016.7519295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519295","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1547098962","https://openalex.org/W1879900893","https://openalex.org/W2121331887","https://openalex.org/W2546836747","https://openalex.org/W4242674290","https://openalex.org/W4246818326"],"related_works":["https://openalex.org/W3077060396","https://openalex.org/W2383699822","https://openalex.org/W3148278272","https://openalex.org/W4282961407","https://openalex.org/W2097349963","https://openalex.org/W2145224123","https://openalex.org/W2021253405","https://openalex.org/W1969564587","https://openalex.org/W1559766497","https://openalex.org/W2122562527"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,46],"demonstrate":[4],"a":[5],"clear":[6],"gap":[7],"in":[8],"board":[9],"level":[10],"test":[11,63],"coverage":[12,34,64,70],"under":[13],"category":[14],"of":[15,40,71],"timing":[16],"related":[17],"faults":[18],"(TRFs).":[19],"Although":[20],"there":[21,30],"are":[22,25],"techniques":[23],"that":[24],"capable":[26],"to":[27,36],"detect":[28],"TRFs,":[29],"is":[31],"no":[32],"fault":[33,51],"metrics":[35],"quantify":[37],"the":[38],"quality":[39],"these":[41],"techniques.":[42],"To":[43],"do":[44],"that,":[45],"propose":[47],"an":[48],"easy-to-implement":[49],"interconnect-level":[50],"model":[52],"extension":[53,57],"towards":[54],"TRFs.":[55],"This":[56],"can":[58],"be":[59],"integrated":[60],"into":[61],"existing":[62],"models":[65],"providing":[66],"additional":[67],"information":[68],"on":[69],"timing-related":[72],"faults.":[73]},"counts_by_year":[{"year":2017,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}