{"id":"https://openalex.org/W2495687267","doi":"https://doi.org/10.1109/ets.2016.7519284","title":"Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC","display_name":"Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2495687267","doi":"https://doi.org/10.1109/ets.2016.7519284","mag":"2495687267"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2016.7519284","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519284","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030175469","display_name":"Gian Mayuga","orcid":"https://orcid.org/0000-0002-3951-6480"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Gian Mayuga","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113798957","display_name":"Yuta Yamato","orcid":null},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Yamato","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078779439","display_name":"Tomokazu Yoneda","orcid":null},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomokazu Yoneda","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964875","display_name":"Yasuo Sat\u00f4","orcid":"https://orcid.org/0000-0002-7556-5159"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuo Sato","raw_affiliation_strings":["Kyushu Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070572924","display_name":"Michiko Inoue","orcid":"https://orcid.org/0000-0002-9837-5147"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michiko Inoue","raw_affiliation_strings":["Nara Institute of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology","institution_ids":["https://openalex.org/I75917431"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8073,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63560364,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8280524611473083},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7382726669311523},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6137318015098572},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6076456308364868},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5147071480751038},{"id":"https://openalex.org/keywords/word","display_name":"Word (group theory)","score":0.4849286377429962},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3719775080680847},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12398263812065125}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8280524611473083},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7382726669311523},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6137318015098572},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6076456308364868},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5147071480751038},{"id":"https://openalex.org/C90805587","wikidata":"https://www.wikidata.org/wiki/Q10944557","display_name":"Word (group theory)","level":2,"score":0.4849286377429962},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3719775080680847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12398263812065125},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2016.7519284","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2016.7519284","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1582612119","https://openalex.org/W2035025053","https://openalex.org/W2061180973","https://openalex.org/W2119482888","https://openalex.org/W6659174997","https://openalex.org/W6677993950"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Reliability":[0],"of":[1,8,21,34,48],"memory":[2,24,36],"is":[3,29],"crucial":[4],"to":[5,31,70],"overall":[6],"reliability":[7,16,43],"SoCs.":[9],"In":[10,38],"our":[11],"previous":[12],"work,":[13,40],"we":[14,41],"enhanced":[15],"through":[17],"an":[18],"adaptive":[19],"combination":[20],"repair":[22,72],"and":[23,67],"word":[25],"correction,":[26],"however,":[27],"it":[28],"restricted":[30],"the":[32],"identification":[33,47],"faulty":[35,51,68],"words.":[37],"this":[39],"enhance":[42],"further":[44],"by":[45],"considering":[46],"not":[49],"only":[50],"words,":[52],"but":[53],"aged":[54,66],"words":[55,69],"as":[56],"well.":[57],"We":[58],"propose":[59],"a":[60],"novel":[61],"method":[62],"that":[63],"adaptively":[64],"assigns":[65],"functional":[71],"or":[73],"correction":[74],"based":[75],"on":[76],"their":[77],"vulnerabilities.":[78]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}