{"id":"https://openalex.org/W1539077232","doi":"https://doi.org/10.1109/ets.2015.7138768","title":"Re-using BIST for circuit aging monitoring","display_name":"Re-using BIST for circuit aging monitoring","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1539077232","doi":"https://doi.org/10.1109/ets.2015.7138768","mag":"1539077232"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2015.7138768","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2015.7138768","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 20th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018615087","display_name":"Farshad Firouzi","orcid":"https://orcid.org/0000-0002-8359-4304"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Farshad Firouzi","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018889229","display_name":"Fangming Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fangming Ye","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032226035","display_name":"Arunkumar Vijayan","orcid":"https://orcid.org/0000-0002-6915-6084"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Arunkumar Vijayan","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049240930","display_name":"Abhishek Koneru","orcid":"https://orcid.org/0000-0002-3808-7303"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhishek Koneru","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]},{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany","Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.205,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.81103932,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7956849336624146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6650224924087524},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6314074397087097},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5078242421150208},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47378110885620117},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4342440962791443},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4219246506690979},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37622421979904175},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3486020565032959},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21008893847465515},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07803347706794739}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7956849336624146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6650224924087524},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6314074397087097},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5078242421150208},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47378110885620117},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4342440962791443},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4219246506690979},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37622421979904175},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3486020565032959},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21008893847465515},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07803347706794739},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2015.7138768","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2015.7138768","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 20th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1966986741","https://openalex.org/W1991891926","https://openalex.org/W2033750734","https://openalex.org/W2104677471","https://openalex.org/W2110283673","https://openalex.org/W2134869654","https://openalex.org/W2141565132","https://openalex.org/W2153635508","https://openalex.org/W2164529645","https://openalex.org/W4232751114","https://openalex.org/W4236432903"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W2121910908","https://openalex.org/W4400235630"],"abstract_inverted_index":{"Bias":[0],"Temperature":[1],"Instability":[2],"(BTI)-induced":[3],"transistor":[4],"aging":[5,116],"degrades":[6],"path":[7],"delay":[8,29],"over":[9],"time":[10],"and":[11,49,70],"may":[12],"eventually":[13],"induce":[14],"circuit":[15],"failure":[16],"due":[17],"to":[18,27,39,58,86,113],"timing":[19],"violations.":[20],"Chip":[21],"health":[22],"monitoring":[23,109],"is":[24,84,96],"therefore":[25],"necessary":[26],"track":[28,59],"changes":[30],"on":[31,106],"a":[32,37,74,87],"per-chip":[33],"basis.":[34],"We":[35],"propose":[36],"method":[38],"accurately":[40],"predict":[41],"the":[42,60,125,128],"fine-grained":[43],"circuit-delay":[44],"degradation":[45],"with":[46],"minimal":[47],"area":[48],"performance":[50],"overhead.":[51],"It":[52],"re-uses":[53],"on-chip":[54],"design-for-test":[55],"(DfT)":[56],"infrastructure":[57],"severity":[61],"of":[62,127],"run-time":[63,107],"stress":[64,82,108],"by":[65],"periodiclly":[66],"capturing":[67],"system":[68],"state":[69],"compacting":[71],"it":[72],"using":[73,99],"multiple":[75],"input":[76],"signature":[77],"register":[78],"(MISR).":[79],"The":[80,93],"captured":[81],"information":[83],"fed":[85],"software-based":[88],"prediction":[89,94,104],"model":[90,95],"in":[91],"realtime.":[92],"trained":[97],"offline":[98],"support":[100],"vector":[101],"regression.":[102],"Aging":[103],"based":[105],"can":[110],"be":[111],"used":[112],"proactively":[114],"activate":[115],"mitigation":[117],"techniques.":[118],"Experimental":[119],"results":[120],"for":[121],"benchmark":[122],"circuits":[123],"highlight":[124],"accuracy":[126],"proposed":[129],"approach.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}