{"id":"https://openalex.org/W2090601222","doi":"https://doi.org/10.1109/ets.2014.6847835","title":"GPU-based timing-aware test generation for small delay defects","display_name":"GPU-based timing-aware test generation for small delay defects","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2090601222","doi":"https://doi.org/10.1109/ets.2014.6847835","mag":"2090601222"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2014.6847835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072149250","display_name":"Kuan-Yu Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuan-Yu Liao","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081780454","display_name":"Po\u2010Juei Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Po-Juei Chen","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023149924","display_name":"Ang-Feng Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ang-Feng Lin","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017361488","display_name":"James Chien-Mo Li","orcid":"https://orcid.org/0000-0002-4393-5186"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"James Chien-Mo Li","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan#TAB#","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Blacksburg, VA, USA","[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109249989","display_name":"Laung\u2010Terng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laung-Terng Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, CA, USA","SynTest Technol., Inc., Sunnyvale, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technol., Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9430105686187744},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.8086574077606201},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7652541399002075},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7558635473251343},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.627521276473999},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.5758141875267029},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5743017196655273},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.526260495185852},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4672161340713501},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.46351635456085205},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4410456717014313},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3694550395011902},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.34750208258628845},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.128243088722229},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.11435547471046448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0734667181968689}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9430105686187744},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.8086574077606201},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7652541399002075},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7558635473251343},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.627521276473999},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.5758141875267029},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5743017196655273},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.526260495185852},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4672161340713501},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46351635456085205},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4410456717014313},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3694550395011902},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.34750208258628845},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.128243088722229},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11435547471046448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0734667181968689},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2014.6847835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1575729896","https://openalex.org/W1988641939","https://openalex.org/W2105017305","https://openalex.org/W2127774081","https://openalex.org/W2162139917","https://openalex.org/W4242961060"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2535245920","https://openalex.org/W2128148266"],"abstract_inverted_index":{"A":[0],"GPU-based":[1,54],"timing-aware":[2,49],"ATPG":[3],"is":[4],"proposed":[5,53],"to":[6],"generate":[7],"a":[8],"compact":[9],"high-quality":[10],"test":[11,14,27,36,58],"set.":[12],"The":[13],"generation":[15],"algorithm":[16],"backtraces":[17],"and":[18,42],"propagates":[19],"along":[20],"multiple":[21],"long":[22],"paths":[23],"so":[24],"that":[25],"many":[26],"patterns":[28,37],"are":[29,38],"generated":[30],"at":[31],"the":[32,52,66,71],"same":[33],"time.":[34],"Generated":[35],"then":[39],"fault":[40],"simulated":[41],"selected.":[43],"Compared":[44],"with":[45],"an":[46],"8-core":[47],"CPU-based":[48],"commercial":[50],"ATPG,":[51],"technique":[55],"achieved":[56],"36%":[57],"length":[59],"reductions":[60],"on":[61],"large":[62],"benchmark":[63],"circuits":[64],"while":[65],"SDQL":[67],"quality":[68],"remains":[69],"almost":[70],"same.":[72]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}