{"id":"https://openalex.org/W2004016279","doi":"https://doi.org/10.1109/ets.2014.6847818","title":"INL systematic reduced-test technique for Pipeline ADCs","display_name":"INL systematic reduced-test technique for Pipeline ADCs","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2004016279","doi":"https://doi.org/10.1109/ets.2014.6847818","mag":"2004016279"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2014.6847818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847818","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091600572","display_name":"E. Peral\u00edas","orcid":"https://orcid.org/0000-0003-0629-0785"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Eduardo Peralias","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]},{"raw_affiliation_string":"Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072282417","display_name":"Antonio Gin\u00e9s","orcid":"https://orcid.org/0000-0001-5272-5802"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Antonio Gines","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]},{"raw_affiliation_string":"Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066990447","display_name":"A. Rueda","orcid":"https://orcid.org/0000-0003-4564-9359"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Adoracion Rueda","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (CNM-CSIC), Universidad de Sevilla (USE), Seville, SPAIN","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]},{"raw_affiliation_string":"Inst. de Microelectron. de Sevilla (CNM-CSIC), Univ. de Sevilla (USE), Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8014,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.82273803,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.7599754333496094},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7311697602272034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6227194666862488},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6080034375190735},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.571071982383728},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.5252810716629028},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.49419596791267395},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4924260079860687},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4486244320869446},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.417590856552124},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3469843864440918},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32286137342453003},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2202725112438202},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19208312034606934},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.18739160895347595},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.07879644632339478}],"concepts":[{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.7599754333496094},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7311697602272034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6227194666862488},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6080034375190735},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.571071982383728},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.5252810716629028},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.49419596791267395},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4924260079860687},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4486244320869446},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.417590856552124},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3469843864440918},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32286137342453003},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2202725112438202},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19208312034606934},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.18739160895347595},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.07879644632339478},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2014.6847818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2014.6847818","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1776750336","https://openalex.org/W1907528811","https://openalex.org/W1965108392","https://openalex.org/W2006786321","https://openalex.org/W2022977241","https://openalex.org/W2030783736","https://openalex.org/W2032514868","https://openalex.org/W2033845134","https://openalex.org/W2034467026","https://openalex.org/W2038372383","https://openalex.org/W2038932764","https://openalex.org/W2063724383","https://openalex.org/W2065670053","https://openalex.org/W2083193340","https://openalex.org/W2098852797","https://openalex.org/W2099885537","https://openalex.org/W2102764330","https://openalex.org/W2103367702","https://openalex.org/W2106243952","https://openalex.org/W2109640989","https://openalex.org/W2111032961","https://openalex.org/W2115269638","https://openalex.org/W2116154931","https://openalex.org/W2127867803","https://openalex.org/W2129523661","https://openalex.org/W2131477866","https://openalex.org/W2134974905","https://openalex.org/W2137446533","https://openalex.org/W2139475822","https://openalex.org/W2140351762","https://openalex.org/W2141855747","https://openalex.org/W2150395713","https://openalex.org/W2151822540","https://openalex.org/W2157683703","https://openalex.org/W2159959111","https://openalex.org/W2162485497","https://openalex.org/W2170274989","https://openalex.org/W3149710202","https://openalex.org/W4230446214","https://openalex.org/W4247489657","https://openalex.org/W4249261768","https://openalex.org/W6637936845","https://openalex.org/W6639903313","https://openalex.org/W6675359846","https://openalex.org/W6681928805","https://openalex.org/W6683814262"],"related_works":["https://openalex.org/W4280522623","https://openalex.org/W2789062182","https://openalex.org/W2144928230","https://openalex.org/W2168668096","https://openalex.org/W2159533852","https://openalex.org/W2154916972","https://openalex.org/W2595218477","https://openalex.org/W2015667454","https://openalex.org/W1990158658","https://openalex.org/W2016292766"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,7,44,84],"procedure":[4],"to":[5,52,56,75,87],"implement":[6],"high":[8],"efficient":[9],"test":[10,25,66],"of":[11,16,24,31,38,64,92],"the":[12,35,41,47,50,59,69,76,90,101],"Integral":[13],"Non-linearity":[14],"(INL)":[15],"Pipeline":[17],"ADCs":[18],"using":[19],"an":[20],"extremely":[21],"reduced":[22],"set":[23],"input":[26,70],"amplitude":[27],"levels":[28,55],"(one":[29],"order":[30],"magnitude":[32],"lower":[33],"than":[34],"total":[36],"number":[37],"codes":[39],"in":[40,110,126],"ADC).":[42],"For":[43],"given":[45],"architecture,":[46],"method":[48,118],"provides":[49],"way":[51],"determine":[53],"these":[54],"robustly":[57],"capture":[58],"nonlinearity":[60],"information.":[61],"The":[62,116],"location":[63],"each":[65],"level":[67],"within":[68],"range":[71],"has":[72,119],"low":[73],"sensitivity":[74],"internal":[77],"ADC":[78],"noise,":[79],"and":[80,95,107,113],"therefore,":[81],"they":[82],"are":[83],"good":[85],"basis":[86],"continuously":[88],"monitor":[89],"impact":[91],"process,":[93],"aging":[94],"environment":[96],"conditions":[97],"variations":[98],"(PVT)":[99],"on":[100],"non-linearity,":[102],"as":[103,105],"well":[104],"miscalibration":[106],"possible":[108],"failures":[109],"both":[111],"foreground":[112],"background":[114],"applications.":[115],"proposed":[117],"been":[120],"validated":[121],"by":[122],"realistic":[123],"behavioral":[124],"models":[125],"several":[127],"examples.":[128]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}