{"id":"https://openalex.org/W1994136514","doi":"https://doi.org/10.1109/ets.2013.6569375","title":"Novel approach to reduce power droop during scan-based logic BIST","display_name":"Novel approach to reduce power droop during scan-based logic BIST","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1994136514","doi":"https://doi.org/10.1109/ets.2013.6569375","mag":"1994136514"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2013.6569375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569375","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019220326","display_name":"M. Oma\u00f1a","orcid":"https://orcid.org/0000-0001-8976-5365"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Omana","raw_affiliation_strings":["ARCES-DEI, University of Bologna, Bologna, Italy","ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ARCES-DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076546330","display_name":"Daniele Rossi","orcid":"https://orcid.org/0000-0002-9487-378X"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Rossi","raw_affiliation_strings":["ARCES-DEI, University of Bologna, Bologna, Italy","ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ARCES-DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037339015","display_name":"Filippo Fuzzi","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Fuzzi","raw_affiliation_strings":["ARCES-DEI, University of Bologna, Bologna, Italy","ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ARCES-DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010725489","display_name":"Cecilia Metra","orcid":"https://orcid.org/0000-0002-1408-5725"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Metra","raw_affiliation_strings":["ARCES-DEI, University of Bologna, Bologna, Italy","ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ARCES-DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES - DEI, Univ. of Bologna Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111879846","display_name":"C. Tirumurti","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Tirumurti","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp. Santa Clara, Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp. Santa Clara, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050864687","display_name":"R. Galivache","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Galivache","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp. Santa Clara, Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp. Santa Clara, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5572,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.8256442,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.8755733966827393},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6845678091049194},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6499818563461304},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.6401660442352295},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6213327050209045},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5985503196716309},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5526149272918701},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5429617166519165},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5059093832969666},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.5029248595237732},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49168020486831665},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.4868883192539215},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.48418739438056946},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.48272988200187683},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40688636898994446},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.38266468048095703},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3460795283317566},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3051316738128662},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3006174564361572},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2925911545753479},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.14904409646987915},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.140985369682312},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07013121247291565}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.8755733966827393},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6845678091049194},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6499818563461304},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.6401660442352295},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6213327050209045},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5985503196716309},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5526149272918701},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5429617166519165},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5059093832969666},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.5029248595237732},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49168020486831665},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.4868883192539215},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.48418739438056946},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.48272988200187683},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40688636898994446},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.38266468048095703},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3460795283317566},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3051316738128662},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3006174564361572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2925911545753479},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.14904409646987915},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.140985369682312},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07013121247291565},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/ets.2013.6569375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569375","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.soton.ac.uk:368918","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},{"id":"pmh:oai:arpi.unipi.it:11568/1065970","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/6569375","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:cris.unibo.it:11585/256487","is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/256487","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1628577686","https://openalex.org/W1867538663","https://openalex.org/W1900996732","https://openalex.org/W1905213452","https://openalex.org/W2025698297","https://openalex.org/W2039868523","https://openalex.org/W2090728180","https://openalex.org/W2102355929","https://openalex.org/W2108471909","https://openalex.org/W2111531873","https://openalex.org/W2111755940","https://openalex.org/W2119521940","https://openalex.org/W2139356796","https://openalex.org/W2141866079","https://openalex.org/W2163950950","https://openalex.org/W2497555727","https://openalex.org/W3140239545","https://openalex.org/W6639759450"],"related_works":["https://openalex.org/W2122643352","https://openalex.org/W2888456858","https://openalex.org/W2098411556","https://openalex.org/W2078848070","https://openalex.org/W2131499522","https://openalex.org/W2354343740","https://openalex.org/W2101853736","https://openalex.org/W2074302528","https://openalex.org/W2154314512","https://openalex.org/W2154529098"],"abstract_inverted_index":{"Significant":[0],"peak":[1,99],"power":[2,5],"(PP),":[3],"thus":[4,61],"droop":[6,101],"(PD),":[7],"during":[8,23,77,102],"test":[9,27,38,59,78,103,137,151],"is":[10,128],"a":[11,31,50,94,143,155],"serious":[12],"concern":[13],"for":[14,86],"modern,":[15],"complex":[16],"ICs.":[17,88],"In":[18,89,111],"fact,":[19],"the":[20,24,35,71,75,116,120],"PD":[21,76],"originated":[22],"application":[25],"of":[26,49,56,79,104,119,136,161],"vectors":[28],"may":[29,43],"produce":[30],"delay":[32,51],"effect":[33],"on":[34,147],"circuit":[36],"under":[37],"signal":[39],"transitions.":[40],"This":[41,127],"event":[42],"be":[44],"erroneously":[45],"recognized":[46],"as":[47],"presence":[48],"fault,":[52],"with":[53,107],"consequent":[54],"generation":[55,133],"an":[57,131],"erroneous":[58],"fail,":[60],"increasing":[62],"yield":[63],"loss.":[64],"Several":[65],"solutions":[66],"have":[67],"been":[68],"proposed":[69,140],"in":[70,159],"literature":[72],"to":[73,97],"reduce":[74,98],"combinational":[80],"ICs,":[81],"while":[82,153],"fewer":[83],"approaches":[84],"exist":[85],"sequential":[87,105],"this":[90],"paper,":[91],"we":[92],"propose":[93],"novel":[95],"approach":[96,114,141],"power/power":[100],"circuits":[106],"scan-based":[108],"Logic":[109],"GIST.":[110],"particular,":[112],"our":[113],"reduces":[115],"switching":[117],"activity":[118],"scan":[121],"chains":[122],"between":[123],"following":[124],"capture":[125],"cycles.":[126],"achieved":[129],"by":[130],"original":[132],"and":[134,150],"arrangement":[135],"vectors.":[138],"The":[139],"presents":[142],"very":[144,156],"low":[145,157],"impact":[146],"fault":[148],"coverage":[149],"time,":[152],"requiring":[154],"cost":[158],"terms":[160],"area":[162],"overhead.":[163]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2016-06-24T00:00:00"}