{"id":"https://openalex.org/W2069347356","doi":"https://doi.org/10.1109/ets.2013.6569364","title":"Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis","display_name":"Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2069347356","doi":"https://doi.org/10.1109/ets.2013.6569364","mag":"2069347356"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2013.6569364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018889229","display_name":"Fangming Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fangming Ye","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101914136","display_name":"Zhaobo Zhang","orcid":"https://orcid.org/0000-0002-8883-3191"},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhaobo Zhang","raw_affiliation_strings":["Huawei Technologies Company Limited, Santa Clara, CA, USA","Huawei Technol. Co. Ltd., Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huawei Technologies Company Limited, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technol. Co. Ltd., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014106133","display_name":"Xinli Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinli Gu","raw_affiliation_strings":["Huawei Technologies Company Limited, Santa Clara, CA, USA","Huawei Technol. Co. Ltd., Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huawei Technologies Company Limited, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technol. Co. Ltd., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.5921,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.95238272,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.8391334414482117},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.7221446633338928},{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.6780998706817627},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.639648973941803},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6300249099731445},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5977209210395813},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5758957266807556},{"id":"https://openalex.org/keywords/relevance","display_name":"Relevance (law)","score":0.5287527441978455},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4952372610569},{"id":"https://openalex.org/keywords/root","display_name":"Root (linguistics)","score":0.44614332914352417},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.42734256386756897},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3814706802368164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21665501594543457}],"concepts":[{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.8391334414482117},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.7221446633338928},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.6780998706817627},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.639648973941803},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6300249099731445},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5977209210395813},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5758957266807556},{"id":"https://openalex.org/C158154518","wikidata":"https://www.wikidata.org/wiki/Q7310970","display_name":"Relevance (law)","level":2,"score":0.5287527441978455},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4952372610569},{"id":"https://openalex.org/C171078966","wikidata":"https://www.wikidata.org/wiki/Q111029","display_name":"Root (linguistics)","level":2,"score":0.44614332914352417},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.42734256386756897},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3814706802368164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21665501594543457},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2013.6569364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1497704817","https://openalex.org/W1520077640","https://openalex.org/W1548802052","https://openalex.org/W1963862877","https://openalex.org/W1971688816","https://openalex.org/W1995219977","https://openalex.org/W2024681686","https://openalex.org/W2031248101","https://openalex.org/W2045500376","https://openalex.org/W2097898932","https://openalex.org/W2099111195","https://openalex.org/W2119884533","https://openalex.org/W2128469382","https://openalex.org/W2128663511","https://openalex.org/W2135743693","https://openalex.org/W2154053567","https://openalex.org/W2154749389","https://openalex.org/W2168344315","https://openalex.org/W2478708596","https://openalex.org/W3146003712","https://openalex.org/W4211083646","https://openalex.org/W4240038564","https://openalex.org/W4298266977","https://openalex.org/W6656660989","https://openalex.org/W6821893607"],"related_works":["https://openalex.org/W2030594396","https://openalex.org/W2535098331","https://openalex.org/W2202104725","https://openalex.org/W4255366506","https://openalex.org/W2056250485","https://openalex.org/W4280640835","https://openalex.org/W2885334669","https://openalex.org/W2111856191","https://openalex.org/W4230518569","https://openalex.org/W4230900947"],"abstract_inverted_index":{"High-volume":[0],"manufacturing":[1],"of":[2,40,48,54,100,114,167],"complex":[3],"electronic":[4],"products":[5],"involves":[6],"functional":[7],"test":[8,41,134],"at":[9],"board":[10,141],"level":[11],"to":[12,28,136,163],"ensure":[13],"low":[14],"defect":[15],"escapes.":[16],"Machine-learning":[17],"techniques":[18],"have":[19],"recently":[20],"been":[21],"proposed":[22,127,169],"for":[23,81,133],"reasoning-based":[24],"functional-fault":[25],"diagnosis":[26,31,83],"system":[27],"achieve":[29],"high":[30],"accuracy.":[32],"However,":[33],"machine":[34,67],"learning":[35,68],"requires":[36],"a":[37,45,97,116],"rich":[38],"set":[39,99],"items":[42],"(syndromes)":[43],"and":[44,60,74,87,105,148],"sizable":[46],"database":[47],"faulty":[49],"boards.":[50],"An":[51],"insufficient":[52],"number":[53],"failed":[55],"boards,":[56],"ambiguous":[57],"root-cause":[58,88],"identification,":[59],"redundant":[61],"or":[62],"irrelevant":[63],"syndromes":[64,101],"can":[65,129],"render":[66],"ineffective.":[69],"We":[70],"propose":[71],"an":[72,149],"evaluation":[73],"enhancement":[75],"framework":[76,128],"based":[77,92,153],"on":[78,93,154],"information":[79],"theory":[80],"guiding":[82],"systems":[84],"using":[85],"syndrome":[86],"analysis.":[89],"Syndrome":[90],"analysis":[91,109],"subset":[94],"selection":[95],"provides":[96],"representative":[98],"with":[102],"minimum":[103],"redundancy":[104],"maximum":[106],"relevance.":[107],"Root-cause":[108],"measures":[110],"the":[111,126,165,168],"discriminative":[112],"ability":[113],"differentiating":[115],"given":[117],"root":[118],"cause":[119],"from":[120,125,142,157],"others.":[121],"The":[122],"metrics":[123],"obtained":[124],"also":[130],"provide":[131],"guidelines":[132],"redesign":[135],"enhance":[137],"diagnosis.":[138],"A":[139],"real":[140,159],"industry,":[143],"currently":[144],"in":[145],"volume":[146],"production,":[147],"additional":[150],"synthetic":[151],"board,":[152,160],"data":[155],"extrapolated":[156],"another":[158],"are":[161],"used":[162],"demonstrate":[164],"effectiveness":[166],"framework.":[170]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}