{"id":"https://openalex.org/W2143417371","doi":"https://doi.org/10.1109/ets.2013.6569357","title":"Adaptive quality binning for analog circuits","display_name":"Adaptive quality binning for analog circuits","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2143417371","doi":"https://doi.org/10.1109/ets.2013.6569357","mag":"2143417371"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2013.6569357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108524932","display_name":"Ender Y\u0131lmaz","orcid":"https://orcid.org/0009-0004-0254-5845"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ender Yilmaz","raw_affiliation_strings":["Arizona State University, USA","Arizona State University , Tempe , AZ , USA"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University , Tempe , AZ , USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Arizona State University, USA","Arizona State University , Tempe , AZ , USA"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University , Tempe , AZ , USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110130179","display_name":"Kenneth M. Butler","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth M. Butler","raw_affiliation_strings":["Texas Instruments, USA","**Texas Instruments, Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"**Texas Instruments, Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108524932"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.6304,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.71770378,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6824507713317871},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6287150979042053},{"id":"https://openalex.org/keywords/bin","display_name":"Bin","score":0.6101082563400269},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5900259613990784},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5319849252700806},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.45345115661621094},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1621803641319275},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11120593547821045}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6824507713317871},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6287150979042053},{"id":"https://openalex.org/C156273044","wikidata":"https://www.wikidata.org/wiki/Q4913766","display_name":"Bin","level":2,"score":0.6101082563400269},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5900259613990784},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5319849252700806},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.45345115661621094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1621803641319275},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11120593547821045},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2013.6569357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2013.6569357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1686846969","https://openalex.org/W2009958999","https://openalex.org/W2064766354","https://openalex.org/W2098407885","https://openalex.org/W2107262883","https://openalex.org/W2129690060","https://openalex.org/W2131610230","https://openalex.org/W2136007135","https://openalex.org/W2139497890","https://openalex.org/W2143192260","https://openalex.org/W2145344136","https://openalex.org/W2147198689","https://openalex.org/W2147916294","https://openalex.org/W2147930497","https://openalex.org/W2162433349","https://openalex.org/W2169677645","https://openalex.org/W3147819520","https://openalex.org/W4247409213","https://openalex.org/W4250066186","https://openalex.org/W6653111559"],"related_works":["https://openalex.org/W2107701374","https://openalex.org/W1616588898","https://openalex.org/W4395000504","https://openalex.org/W4249504934","https://openalex.org/W2183416055","https://openalex.org/W2568867011","https://openalex.org/W1994114538","https://openalex.org/W2413205705","https://openalex.org/W2735644334","https://openalex.org/W2352015183"],"abstract_inverted_index":{"Manufactured":[0],"devices":[1,33,57,74,155],"have":[2,59],"a":[3,28,45,115,145],"diverse":[4],"performance/quality":[5],"profile":[6],"due":[7],"to":[8,35,101,109,157],"process":[9,86,121],"variations.":[10],"Devices":[11],"with":[12],"superior":[13],"performance":[14,37,105],"and":[15,43,66,79,87,122,162],"quality":[16,62,160],"are":[17,63,98],"of":[18,49,104,134,137],"higher":[19],"value":[20],"while":[21],"the":[22,76,83,89,94,110,120,127,131,138,154,158,164],"rest":[23],"can":[24],"be":[25],"sold":[26],"for":[27],"lower":[29],"price.":[30],"Separating":[31],"manufactured":[32],"according":[34,100,108,156],"their":[36],"is":[38,44,70],"defined":[39],"as":[40],"quality/performance":[41],"binning":[42],"very":[46],"effective":[47],"way":[48],"lowering":[50],"average":[51,61],"device":[52,68,116],"cost.":[53],"In":[54,140],"this":[55,141],"manner,":[56],"that":[58,151],"below":[60],"not":[64,125],"wasted":[65],"therefore":[67],"cost":[69],"reduced.":[71],"Quality":[72],"binned":[73,99],"share":[75],"same":[77,84,90],"design":[78],"typically":[80,107,123],"go":[81],"through":[82],"manufacturing":[85],"even":[88],"test":[91,149,166],"process.":[92,139],"After":[93],"testing":[95],"step,":[96],"they":[97],"different":[102],"sets":[103],"criteria,":[106],"customer":[111],"specifications.":[112],"The":[113],"bin":[114],"falls":[117],"depends":[118],"on":[119],"does":[124],"match":[126],"amount":[128],"requested":[129],"by":[130],"customers":[132],"because":[133],"uncertainty":[135],"(variation)":[136],"work,":[142],"we":[143],"present":[144],"multi-bin":[146],"quality-oriented":[147],"adaptive":[148],"method":[150],"efficiently":[152],"classifies":[153],"desired":[159],"criteria":[161],"minimizes":[163],"overall":[165],"time.":[167]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}