{"id":"https://openalex.org/W2072078150","doi":"https://doi.org/10.1109/ets.2012.6233054","title":"Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale","display_name":"Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2072078150","doi":"https://doi.org/10.1109/ets.2012.6233054","mag":"2072078150"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233054","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["Department of Electronic Engineering, University of Roma Tor Vergata, Rome, Italy","Department of Electronic Engineering, University of Rome - Tor Vergata, ROME -, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Roma Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]},{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome - Tor Vergata, ROME -, ITALY","institution_ids":["https://openalex.org/I116067653"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5048232172"],"corresponding_institution_ids":["https://openalex.org/I116067653"],"apc_list":null,"apc_paid":null,"fwci":0.21871674,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60464022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9800999760627747,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.8824622631072998},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5257222056388855},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.4963224530220032},{"id":"https://openalex.org/keywords/core-competency","display_name":"Core competency","score":0.44400155544281006},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.36180463433265686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2566574811935425},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.21392673254013062},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.21331652998924255},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07912668585777283}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.8824622631072998},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5257222056388855},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.4963224530220032},{"id":"https://openalex.org/C164065428","wikidata":"https://www.wikidata.org/wiki/Q1201929","display_name":"Core competency","level":2,"score":0.44400155544281006},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.36180463433265686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2566574811935425},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.21392673254013062},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.21331652998924255},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07912668585777283},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets.2012.6233054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233054","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:art.torvergata.it:2108/93955","is_oa":false,"landing_page_url":"http://hdl.handle.net/2108/93955","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2169628522","https://openalex.org/W4252527915","https://openalex.org/W2409287660","https://openalex.org/W2233357156","https://openalex.org/W1976489385","https://openalex.org/W4256317220","https://openalex.org/W1506225852","https://openalex.org/W2141414364"],"abstract_inverted_index":{"The":[0],"MEDIAN":[1],"(ManufacturablE":[2],"and":[3,24,39],"Dependable":[4],"multI-core":[5],"Architectures":[6],"at":[7,17],"Nanoscale)":[8],"project":[9],"is":[10],"a":[11,19],"EU":[12],"funded":[13],"COST":[14],"Action":[15],"aimed":[16],"creating":[18],"European":[20],"network":[21],"of":[22,30],"competence":[23],"experts":[25],"on":[26],"all":[27],"dependability":[28],"aspects":[29],"future":[31],"digital":[32],"systems":[33],"development,":[34],"promoting":[35],"collaboration":[36],"between":[37],"industry":[38],"research.":[40]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-02-09T09:26:11.010843","created_date":"2025-10-10T00:00:00"}