{"id":"https://openalex.org/W2051488363","doi":"https://doi.org/10.1109/ets.2012.6233052","title":"FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design","display_name":"FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2051488363","doi":"https://doi.org/10.1109/ets.2012.6233052","mag":"2051488363"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233052","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233052","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Estonia","Department of Computer Engineering , Tallinn University of Technology, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Department of Computer Engineering , Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5010286547"],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11218476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7511798143386841},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.7207149267196655},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6054384708404541},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.598209023475647},{"id":"https://openalex.org/keywords/diamond","display_name":"Diamond","score":0.5716640949249268},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.503635585308075},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.48620858788490295},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.4623047411441803},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.44712620973587036},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.3229658603668213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2897805869579315},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.17438051104545593},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.11659613251686096},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11150556802749634},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.09632900357246399},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09342661499977112}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7511798143386841},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.7207149267196655},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6054384708404541},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.598209023475647},{"id":"https://openalex.org/C2776921476","wikidata":"https://www.wikidata.org/wiki/Q5283","display_name":"Diamond","level":2,"score":0.5716640949249268},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.503635585308075},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.48620858788490295},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.4623047411441803},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.44712620973587036},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.3229658603668213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2897805869579315},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.17438051104545593},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.11659613251686096},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11150556802749634},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09632900357246399},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09342661499977112},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233052","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233052","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6499999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3126131865","https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2110991008","https://openalex.org/W2061536619","https://openalex.org/W2149051075","https://openalex.org/W2394408226","https://openalex.org/W2141072664"],"abstract_inverted_index":{"DIAMOND":[0,45,86],"project":[1,21,119],"is":[2,65],"set":[3],"to":[4,31,66],"cut":[5],"development":[6],"costs":[7],"for":[8,76],"Europe's":[9],"nanoelectronics":[10],"industry":[11],"by":[12,26],"simplifying":[13],"error":[14,52,55],"diagnosis":[15,77],"and":[16,33,57,72,78,94,104,108],"correction":[17,34,79],"in":[18,59],"systems.":[19],"The":[20,63,85],"reaches":[22],"beyond":[23],"current":[24],"state-of-the-art":[25],"taking":[27],"an":[28,73],"integrated":[29,74],"approach":[30],"localization":[32],"of":[35,38,80,83,117],"different":[36,81],"kinds":[37],"errors":[39],"at":[40],"various":[41],"levels.":[42],"In":[43],"particular,":[44],"has":[46],"a":[47,68],"focus":[48],"on":[49],"automated":[50],"design":[51],"debug,":[53],"soft":[54],"analysis":[56],"post-silicon":[58],"situ":[60],"debug":[61],"fields.":[62],"aim":[64],"provide":[67],"holistic,":[69],"systematic":[70],"methodology":[71],"environment":[75],"types":[82],"errors.":[84],"consortium":[87],"includes":[88],"universities":[89],"from":[90],"Estonia,":[91],"Sweden,":[92],"Germany":[93],"Austria":[95],"as":[96,98],"well":[97],"large":[99],"companies":[100],"like":[101],"IBM,":[102],"Ericsson":[103],"two":[105],"SMEs":[106],"TransEDA":[107],"Testonica":[109],"Lab.":[110],"Here,":[111],"we":[112],"summarize":[113],"the":[114,118],"main":[115],"achievements":[116],"so":[120],"far.":[121]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}