{"id":"https://openalex.org/W2122511694","doi":"https://doi.org/10.1109/ets.2012.6233051","title":"Reducing test cost for mixed signal circuits “From TOETS to ELESIS”","display_name":"Reducing test cost for mixed signal circuits “From TOETS to ELESIS”","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2122511694","doi":"https://doi.org/10.1109/ets.2012.6233051","mag":"2122511694"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066211209","display_name":"M. Azimane","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Mohamed Azimane","raw_affiliation_strings":["NXP Semiconductors, Netherlands","NXP Semiconductors, the Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semiconductors, the Netherlands#TAB#","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5066211209"],"corresponding_institution_ids":["https://openalex.org/I109147379"],"apc_list":null,"apc_paid":null,"fwci":0.2901,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.59209294,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5975138545036316},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5528308749198914},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5189371109008789},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4883401095867157},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.48178741335868835},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4762844443321228},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.473977267742157},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.4724096357822418},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.4669412672519684},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.4530108869075775},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4364803731441498},{"id":"https://openalex.org/keywords/european-community","display_name":"European community","score":0.4123545289039612},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4020598530769348},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.33291417360305786},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3201289176940918},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2654821276664734},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.14666134119033813}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5975138545036316},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5528308749198914},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5189371109008789},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4883401095867157},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.48178741335868835},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4762844443321228},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.473977267742157},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.4724096357822418},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.4669412672519684},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.4530108869075775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4364803731441498},{"id":"https://openalex.org/C3018369621","wikidata":"https://www.wikidata.org/wiki/Q52847","display_name":"European community","level":2,"score":0.4123545289039612},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4020598530769348},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.33291417360305786},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3201289176940918},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2654821276664734},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.14666134119033813},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C155202549","wikidata":"https://www.wikidata.org/wiki/Q178803","display_name":"International trade","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2031235560","https://openalex.org/W2161335888","https://openalex.org/W2114773158","https://openalex.org/W2548106609","https://openalex.org/W1852277090","https://openalex.org/W1917800633","https://openalex.org/W1968696916","https://openalex.org/W2357284929","https://openalex.org/W2266281062","https://openalex.org/W2115378302"],"abstract_inverted_index":{"In":[0,63,136],"the":[1,13,17,99,146,171],"coming":[2],"years":[3],"European":[4,106,132,138],"Semiconductor":[5],"companies":[6,115],"will":[7,142],"bring":[8],"many":[9],"new":[10],"applications":[11,41],"to":[12,15,26,86,125,157],"market":[14],"improve":[16],"way":[18],"of":[19,61,66],"living":[20],"in":[21,58,116,167],"Europe.":[22],"Examples":[23],"are":[24,56,96,123],"linked":[25],"road":[27],"safety,":[28],"personal":[29],"health":[30],"care,":[31],"secured":[32],"wireless":[33],"communications,":[34],"and":[35,37,54,69,88,119,128,130,134,153,162,175],"lighting":[36],"consumer":[38],"electronics.":[39],"These":[40],"concern":[42],"very":[43],"complex":[44],"semiconductor":[45],"systems":[46],"with":[47],"highly":[48],"integrated":[49],"technologies":[50],"where":[51],"digital,":[52],"memories":[53],"analogue":[55],"funnelled":[57],"one":[59],"piece":[60],"silicon.":[62],"these":[64],"kind":[65],"applications,":[67],"reliability":[68],"trustability":[70],"is":[71],"a":[72,105],"key":[73],"factor":[74],"which":[75],"cannot":[76],"be":[77],"guaranteed":[78],"without":[79],"extensive":[80],"test":[81,90,127,148],"solutions.":[82],"This":[83],"may":[84],"lead":[85],"expensive":[87],"unreliable":[89],"solutions":[91],"when":[92],"necessary":[93],"preventive":[94],"efforts":[95],"omitted.":[97],"Within":[98],"ELESIS":[100],"project,":[101],"we":[102,141],"have":[103],"built":[104],"research":[107,139],"consortium":[108,173],"that":[109,122],"provides":[110],"cooperation":[111],"between":[112],"leading":[113,156],"semiconductors":[114,165],"Europe,":[117,168],"small":[118],"medium":[120],"enterprises":[121],"dedicated":[124],"system":[126],"tooling":[129],"well-recognized":[131],"Institutes":[133],"Universities.":[135],"this":[137],"consortium,":[140],"focus":[143],"on":[144,177],"improving":[145],"industrial":[147],"infrastructure":[149],"for":[150],"mixed":[151],"signal":[152],"analog":[154],"circuits,":[155],"safe,":[158],"reliable,":[159],"high":[160],"quality":[161],"low":[163],"cost":[164],"products":[166],"starting":[169],"from":[170],"TOETS":[172],"partners":[174],"experience":[176],"digital":[178],"circuits.":[179]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}