{"id":"https://openalex.org/W1991052649","doi":"https://doi.org/10.1109/ets.2012.6233048","title":"The impact of functional safety standards in the design and test of reliable and available integrated circuits","display_name":"The impact of functional safety standards in the design and test of reliable and available integrated circuits","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W1991052649","doi":"https://doi.org/10.1109/ets.2012.6233048","mag":"1991052649"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233048","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233048","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065080455","display_name":"Riccardo Mariani","orcid":"https://orcid.org/0000-0002-9128-973X"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Riccardo Mariani","raw_affiliation_strings":["Yogi Tech SpA, Pisa, Italy","YOGITECH SpA San Martino Ulmiano - Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Yogi Tech SpA, Pisa, Italy","institution_ids":[]},{"raw_affiliation_string":"YOGITECH SpA San Martino Ulmiano - Pisa, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5065080455"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7312,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.89648896,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9811000227928162,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.9708999991416931,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iec-61508","display_name":"IEC 61508","score":0.8898416757583618},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.8877484798431396},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6831482648849487},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6254450082778931},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5215834975242615},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49822425842285156},{"id":"https://openalex.org/keywords/functional-requirement","display_name":"Functional requirement","score":0.4644854664802551},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.44355687499046326},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3749259114265442},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.34094536304473877},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3309951424598694},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.23191633820533752},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.13428932428359985},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08335387706756592}],"concepts":[{"id":"https://openalex.org/C138267214","wikidata":"https://www.wikidata.org/wiki/Q1060017","display_name":"IEC 61508","level":3,"score":0.8898416757583618},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.8877484798431396},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6831482648849487},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6254450082778931},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5215834975242615},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49822425842285156},{"id":"https://openalex.org/C62235348","wikidata":"https://www.wikidata.org/wiki/Q3264234","display_name":"Functional requirement","level":2,"score":0.4644854664802551},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.44355687499046326},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3749259114265442},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.34094536304473877},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3309951424598694},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.23191633820533752},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.13428932428359985},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08335387706756592},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233048","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233048","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W165220300","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W4205326760","https://openalex.org/W2022575379","https://openalex.org/W1859113972","https://openalex.org/W2647065762","https://openalex.org/W2073789596","https://openalex.org/W2142266554","https://openalex.org/W2109422125","https://openalex.org/W2809220500","https://openalex.org/W2011154776","https://openalex.org/W1948102893"],"abstract_inverted_index":{"The":[0],"panel":[1],"gives":[2],"an":[3],"overview":[4],"of":[5,14,43],"requirements,":[6],"problems":[7],"and":[8,25,41],"solutions":[9],"related":[10],"to":[11,38],"the":[12,39],"application":[13],"ISO":[15],"26262":[16],"(the":[17,30],"international":[18,31],"norm":[19,32],"ruling":[20],"functional":[21],"safety":[22],"for":[23],"automotive)":[24],"IEC":[26],"61508":[27],"2nd":[28],"edition":[29],"widely":[33],"used":[34],"in":[35],"industrial":[36],"domain)":[37],"design":[40],"test":[42],"integrated":[44],"circuits.":[45]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}