{"id":"https://openalex.org/W2123290596","doi":"https://doi.org/10.1109/ets.2012.6233044","title":"Embedded synthetic instruments for Board-Level testing","display_name":"Embedded synthetic instruments for Board-Level testing","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2123290596","doi":"https://doi.org/10.1109/ets.2012.6233044","mag":"2123290596"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233044","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Testonica Laboratory O\u00dc, Tallinn, Estonia","Testonica Lab O\u00dc, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Testonica Laboratory O\u00dc, Tallinn, Estonia","institution_ids":[]},{"raw_affiliation_string":"Testonica Lab O\u00dc, Tallinn, Estonia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054970559","display_name":"Sergei Devadze","orcid":"https://orcid.org/0000-0001-7445-3801"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Sergei Devadze","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Tallinn Univ. of Technology, Dept. of Comp. Engineering, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Tallinn Univ. of Technology, Dept. of Comp. Engineering, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021757495","display_name":"Igor Aleksejev","orcid":"https://orcid.org/0000-0001-5931-0167"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Igor Aleksejev","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Tallinn Univ. of Technology, Dept. of Comp. Engineering, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Tallinn Univ. of Technology, Dept. of Comp. Engineering, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101639458","display_name":"Thomas Wenzel","orcid":"https://orcid.org/0009-0003-7642-7991"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Thomas Wenzel","raw_affiliation_strings":["Goepel Electronic GmbH, Jena, Germany"],"affiliations":[{"raw_affiliation_string":"Goepel Electronic GmbH, Jena, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5059021602"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3546,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65366302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7290925979614258},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6501837968826294},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.56461101770401},{"id":"https://openalex.org/keywords/section","display_name":"Section (typography)","score":0.546360194683075},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3610091805458069},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3565278649330139},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3489148020744324},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.32101646065711975},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10640290379524231}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7290925979614258},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6501837968826294},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.56461101770401},{"id":"https://openalex.org/C2780129039","wikidata":"https://www.wikidata.org/wiki/Q1931107","display_name":"Section (typography)","level":2,"score":0.546360194683075},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3610091805458069},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3565278649330139},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3489148020744324},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.32101646065711975},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10640290379524231}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233044","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6399999856948853}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321018","display_name":"Eesti Teadusfondi","ror":"https://ror.org/00jjeja18"},{"id":"https://openalex.org/F4320338388","display_name":"Eurostars","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1767301357","https://openalex.org/W2063755166","https://openalex.org/W2094703454","https://openalex.org/W2117130279"],"related_works":["https://openalex.org/W2560853036","https://openalex.org/W2566696415","https://openalex.org/W4249026152","https://openalex.org/W1563787543","https://openalex.org/W2993874308","https://openalex.org/W2363498374","https://openalex.org/W2152596889","https://openalex.org/W2489600020","https://openalex.org/W1497201623","https://openalex.org/W1549180838"],"abstract_inverted_index":{"The":[0],"main":[1],"purpose":[2],"of":[3,11,43],"this":[4],"paper":[5],"is":[6],"to":[7,28,39],"refine":[8],"the":[9,12,41],"benefits":[10],"FPGA-based":[13],"synthetic":[14],"instrumentation":[15],"concept":[16],"(see":[17,46],"Section":[18,47],"1)":[19],"proposed":[20],"by":[21],"us":[22],"earlier":[23],"[1]":[24],"as":[25,27],"well":[26],"provide":[29],"some":[30],"new":[31],"experimental":[32],"data":[33],"based":[34],"on":[35],"real":[36],"industrial":[37],"designs":[38],"show":[40],"efficiency":[42],"our":[44],"methodology":[45],"2).":[48]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}