{"id":"https://openalex.org/W2013568003","doi":"https://doi.org/10.1109/ets.2012.6233029","title":"Diagnostic system based on support-vector machines for board-level functional diagnosis","display_name":"Diagnostic system based on support-vector machines for board-level functional diagnosis","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2013568003","doi":"https://doi.org/10.1109/ets.2012.6233029","mag":"2013568003"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233029","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101914137","display_name":"Zhaobo Zhang","orcid":"https://orcid.org/0000-0003-3449-796X"},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhaobo Zhang","raw_affiliation_strings":["Huawei Technologies, Co. Ltd., Santa Clara, CA","Huawei Technologies Co., Ltd., Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co. Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technologies Co., Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014106133","display_name":"Xinli Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinli Gu","raw_affiliation_strings":["Huawei Technologies, Co. Ltd., Santa Clara, CA","Huawei Technologies Co., Ltd., Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co. Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technologies Co., Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078464746","display_name":"Yaohui Xie","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yaohui Xie","raw_affiliation_strings":["Huawei Technologies, Co. Ltd., Santa Clara, CA","Huawei Technologies Co., Ltd., Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co. Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technologies Co., Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100462292","display_name":"Zhiyuan Wang","orcid":"https://orcid.org/0000-0002-5990-9193"},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhiyuan Wang","raw_affiliation_strings":["Huawei Technologies, Co. Ltd., Santa Clara, CA","Huawei Technologies Co., Ltd., Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co. Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technologies Co., Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120391297","display_name":"Zhong Lin Wang","orcid":"https://orcid.org/0000-0002-5530-0380"},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhanglei Wang","raw_affiliation_strings":["Huawei Technologies, Co. Ltd., Santa Clara, CA","Huawei Technologies Co., Ltd., Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co. Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei Technologies Co., Ltd., Santa Clara, CA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["ECE Dept., Duke University, Durham, NC, USA","ECE Department, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"ECE Dept., Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"ECE Department, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101914137"],"corresponding_institution_ids":["https://openalex.org/I4210146936"],"apc_list":null,"apc_paid":null,"fwci":2.9006,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.90622072,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7489557862281799},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.6906558871269226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6403597593307495},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5552197694778442},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.522881269454956},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4919013977050781},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48230838775634766},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.47859498858451843},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.4689825177192688},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37215375900268555},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2944665253162384},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2834382653236389}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7489557862281799},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.6906558871269226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6403597593307495},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5552197694778442},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.522881269454956},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4919013977050781},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48230838775634766},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.47859498858451843},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.4689825177192688},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37215375900268555},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2944665253162384},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2834382653236389},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233029","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W67365798","https://openalex.org/W175058090","https://openalex.org/W600570876","https://openalex.org/W1497704817","https://openalex.org/W1520077640","https://openalex.org/W1541807484","https://openalex.org/W1621394419","https://openalex.org/W1802689519","https://openalex.org/W1891950198","https://openalex.org/W2008059741","https://openalex.org/W2024681686","https://openalex.org/W2081044639","https://openalex.org/W2096751652","https://openalex.org/W2111182024","https://openalex.org/W2119884533","https://openalex.org/W2122935113","https://openalex.org/W2126326837","https://openalex.org/W2128469382","https://openalex.org/W2135743693","https://openalex.org/W2156909104","https://openalex.org/W2167045917","https://openalex.org/W2172000360","https://openalex.org/W6602714980","https://openalex.org/W6638568169"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2480201319","https://openalex.org/W2387706296","https://openalex.org/W2155788121","https://openalex.org/W4235469518","https://openalex.org/W2294325978","https://openalex.org/W2111708921"],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1,30,80],"is":[2,14,118],"critical":[3],"for":[4],"improving":[5],"product":[6],"yield":[7],"and":[8,37,93,144],"reducing":[9],"manufacturing":[10],"cost.":[11,47],"However,":[12],"it":[13],"very":[15],"challenging":[16],"to":[17,33,99,104,120],"identify":[18],"the":[19,45,71,105,122,125,133],"root":[20],"cause":[21],"of":[22,96,124],"failures":[23],"on":[24],"a":[25],"complex":[26],"circuit":[27],"board.":[28],"Ambiguous":[29],"results":[31,130],"lead":[32,98],"long":[34],"debug":[35,63],"times":[36],"even":[38],"wrong":[39],"repair":[40,46],"actions,":[41],"which":[42],"significantly":[43],"increases":[44],"We":[48],"propose":[49],"an":[50,84,145],"automatic":[51],"diagnostic":[52,101,135,142,147],"system":[53,61,136],"using":[54],"support":[55],"vector":[56],"machines":[57],"(SVMs).":[58],"The":[59,90],"proposed":[60,126],"acquires":[62],"knowledge":[64,75],"from":[65],"empirical":[66],"data;":[67],"this":[68],"strategy":[69],"avoids":[70],"difficulties":[72],"involved":[73],"in":[74,77,88],"acquisition":[76],"traditional":[78],"fault":[79],"methods.":[81],"SVMs":[82,97],"provide":[83],"optimal":[85,91],"separating":[86],"hyperplane":[87],"classification.":[89],"solution":[92],"generalization":[94],"ability":[95],"higher":[100],"accuracy,":[102],"compared":[103],"classical":[106],"learning":[107],"approaches":[108],"such":[109],"as":[110],"artificial":[111],"neural":[112],"networks":[113],"(ANNs).":[114],"An":[115],"industrial":[116],"board":[117],"used":[119],"validate":[121],"effectiveness":[123],"system.":[127,148],"Extensive":[128],"simulation":[129],"demonstrate":[131],"that":[132],"SVMs-based":[134],"provides":[137],"quantifiable":[138],"improvement":[139],"over":[140],"current":[141],"software":[143],"ANN-based":[146]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}