{"id":"https://openalex.org/W2046707229","doi":"https://doi.org/10.1109/ets.2012.6233017","title":"Exact stuck-at fault classification in presence of unknowns","display_name":"Exact stuck-at fault classification in presence of unknowns","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2046707229","doi":"https://doi.org/10.1109/ets.2012.6233017","mag":"2046707229"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059706318","display_name":"Stefan Hillebrecht","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Stefan Hillebrecht","raw_affiliation_strings":["University of Freiburg, Freiburg im Breisgau, Germany","University of Freiburg, Georges-K\u00f6hler-Allee 051, 79110 Freiburg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"University of Freiburg, Georges-K\u00f6hler-Allee 051, 79110 Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058173647","display_name":"Michael A. Kochte","orcid":"https://orcid.org/0000-0002-1228-3402"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael A. Kochte","raw_affiliation_strings":["ITI, University of Stuttgart, Stuttgart, Germany","ITI, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"ITI, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"ITI, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["ITI, University of Stuttgart, Stuttgart, Germany","ITI, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"ITI, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"ITI, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernd Becker","raw_affiliation_strings":["University of Freiburg, Freiburg im Breisgau, Germany","University of Freiburg, Georges-K\u00f6hler-Allee 051, 79110 Freiburg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"University of Freiburg, Georges-K\u00f6hler-Allee 051, 79110 Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5059706318"],"corresponding_institution_ids":["https://openalex.org/I161046081"],"apc_list":null,"apc_paid":null,"fwci":2.3369,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.88294314,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"1954","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.8180516362190247},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6965669989585876},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.6419398784637451},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6228610873222351},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6219098567962646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5422367453575134},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47446566820144653},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.467445969581604},{"id":"https://openalex.org/keywords/pessimism","display_name":"Pessimism","score":0.45954200625419617},{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.4240339398384094},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.41503891348838806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19306236505508423},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.06004464626312256}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.8180516362190247},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6965669989585876},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6419398784637451},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6228610873222351},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6219098567962646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5422367453575134},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47446566820144653},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.467445969581604},{"id":"https://openalex.org/C9992130","wikidata":"https://www.wikidata.org/wiki/Q484954","display_name":"Pessimism","level":2,"score":0.45954200625419617},{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.4240339398384094},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.41503891348838806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19306236505508423},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.06004464626312256},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets.2012.6233017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.261.3275","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.261.3275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2012/ETS_HilleKWB2012.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1593435444","https://openalex.org/W2069246068","https://openalex.org/W2078570404","https://openalex.org/W2079501290","https://openalex.org/W2080267935","https://openalex.org/W2101225425","https://openalex.org/W2103375392","https://openalex.org/W2108681270","https://openalex.org/W2119241964","https://openalex.org/W2120201314","https://openalex.org/W2121706505","https://openalex.org/W2130022711","https://openalex.org/W2133527541","https://openalex.org/W2137442640","https://openalex.org/W2139048240","https://openalex.org/W2153336129","https://openalex.org/W2169280266","https://openalex.org/W2171920205","https://openalex.org/W4241480126","https://openalex.org/W4245630182","https://openalex.org/W4252773126","https://openalex.org/W6678009535","https://openalex.org/W6679878532"],"related_works":["https://openalex.org/W4380987628","https://openalex.org/W2418537576","https://openalex.org/W2557514562","https://openalex.org/W214945085","https://openalex.org/W1987935396","https://openalex.org/W3126025002","https://openalex.org/W2354456418","https://openalex.org/W3197683035","https://openalex.org/W2006807542","https://openalex.org/W3214257365"],"abstract_inverted_index":{"Fault":[0],"simulation":[1,21,57,62],"is":[2,23,90,111],"an":[3],"essential":[4],"tool":[5],"in":[6,18,31,64,87,92],"electronic":[7],"design":[8],"automation.":[9],"The":[10,68,82,102],"accuracy":[11],"of":[12,15,35,40,60,66,104],"the":[13,36,45,53,93],"computation":[14],"fault":[16,56,74],"coverage":[17],"classic":[19,88],"n-valued":[20],"algorithms":[22,89],"compromised":[24],"by":[25],"unknown":[26,41],"(X)":[27,42],"values.":[28],"This":[29,50],"results":[30,95],"a":[32],"pessimistic":[33],"underestimation":[34],"coverage,":[37],"and":[38,47,75,79,99],"overestimation":[39],"values":[43],"at":[44],"primary":[46],"pseudo-primary":[48],"outputs.":[49],"work":[51],"proposes":[52],"first":[54],"stuck-at":[55],"algorithm":[58,70,106],"free":[59],"any":[61,73],"pessimism":[63,83],"presence":[65],"unknowns.":[67],"SAT-based":[69],"exactly":[71],"classifies":[72],"distinguishes":[76],"between":[77],"definite":[78],"possible":[80],"detects.":[81],"w.r.t.":[84],"unknowns":[85],"present":[86],"discussed":[91],"experimental":[94],"on":[96],"ISCAS":[97],"benchmark":[98],"industrial":[100,109],"circuits.":[101],"applicability":[103],"our":[105],"to":[107],"large":[108],"circuits":[110],"demonstrated.":[112]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}