{"id":"https://openalex.org/W1975866473","doi":"https://doi.org/10.1109/ets.2012.6233016","title":"Functional test generation for hard to detect stuck-at faults using RTL model checking","display_name":"Functional test generation for hard to detect stuck-at faults using RTL model checking","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W1975866473","doi":"https://doi.org/10.1109/ets.2012.6233016","mag":"1975866473"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070833574","display_name":"Mahesh Prabhu","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mahesh Prabhu","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, USA","Computer Engineering Research Center University of Texas at Austin#TAB#"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center University of Texas at Austin#TAB#","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, USA","Computer Engineering Research Center University of Texas at Austin#TAB#"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center University of Texas at Austin#TAB#","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5070833574"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":2.3587,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.8800578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7464054822921753},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6431806683540344},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.6127698421478271},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5870003700256348},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5379775762557983},{"id":"https://openalex.org/keywords/satisfiability","display_name":"Satisfiability","score":0.5229983329772949},{"id":"https://openalex.org/keywords/satisfiability-modulo-theories","display_name":"Satisfiability modulo theories","score":0.48381680250167847},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.46533384919166565},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.45012569427490234},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.44593432545661926},{"id":"https://openalex.org/keywords/control-flow","display_name":"Control flow","score":0.42466455698013306},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3927015960216522},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.18433892726898193},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11878800392150879}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7464054822921753},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6431806683540344},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.6127698421478271},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5870003700256348},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5379775762557983},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.5229983329772949},{"id":"https://openalex.org/C164155591","wikidata":"https://www.wikidata.org/wiki/Q2067766","display_name":"Satisfiability modulo theories","level":2,"score":0.48381680250167847},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.46533384919166565},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.45012569427490234},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.44593432545661926},{"id":"https://openalex.org/C160191386","wikidata":"https://www.wikidata.org/wiki/Q868299","display_name":"Control flow","level":2,"score":0.42466455698013306},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3927015960216522},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.18433892726898193},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11878800392150879},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.4099999964237213,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1506588809","https://openalex.org/W1513300473","https://openalex.org/W1787074469","https://openalex.org/W1891950198","https://openalex.org/W1905213452","https://openalex.org/W1975112016","https://openalex.org/W2004437077","https://openalex.org/W2012039919","https://openalex.org/W2013634896","https://openalex.org/W2093916942","https://openalex.org/W2111785162","https://openalex.org/W2115180022","https://openalex.org/W2126042558","https://openalex.org/W2127005882","https://openalex.org/W2127936537","https://openalex.org/W2135613306","https://openalex.org/W2144375411","https://openalex.org/W2154711067","https://openalex.org/W2156710719","https://openalex.org/W2156747864","https://openalex.org/W2160444875","https://openalex.org/W2170296906","https://openalex.org/W3144091741","https://openalex.org/W4233176001","https://openalex.org/W4245022609","https://openalex.org/W6638020115","https://openalex.org/W6644164310","https://openalex.org/W6651354974","https://openalex.org/W6676649663"],"related_works":["https://openalex.org/W2019500818","https://openalex.org/W2360180534","https://openalex.org/W2127167802","https://openalex.org/W2109674123","https://openalex.org/W2165929878","https://openalex.org/W2146907344","https://openalex.org/W1840416799","https://openalex.org/W2604391196","https://openalex.org/W2545341068","https://openalex.org/W4256313551"],"abstract_inverted_index":{"At-speed":[0],"functional":[1,194],"testing":[2],"has":[3],"proven":[4],"to":[5,38,43,54,61,76,120,137,158,198],"be":[6],"very":[7],"effective":[8],"at":[9],"uncovering":[10],"defective":[11],"chips.":[12],"However":[13],"for":[14,21,59,192,196],"processor":[15],"testing,":[16],"generating":[17,193],"instruction":[18,56],"level":[19,57,73,151],"tests":[20,58,195],"covering":[22],"all":[23],"faults":[24,34,64],"is":[25,115,169,188],"a":[26,51,66,121,127,143],"challenge":[27],"given":[28,119],"the":[29,71,77,135,138,149,155,161,165],"issue":[30],"of":[31,103,145,160],"scalability.":[32],"Data-path":[33],"are":[35,95],"relatively":[36],"easier":[37],"control":[39],"and":[40,82,92,99,118,153,172,190],"observe":[41],"compared":[42],"control-path":[44,63],"faults.":[45,200],"In":[46],"this":[47],"paper":[48],"we":[49,140],"present":[50],"novel":[52],"method":[53,187],"generate":[55],"hard":[60,197],"detect":[62,199],"in":[65,164],"processor.":[67],"We":[68],"initially":[69],"map":[70],"gate":[72,150],"stuck-at":[74],"fault":[75,90,152,156],"Register":[78],"Transfer":[79],"Level":[80],"(RTL)":[81],"build":[83],"an":[84,106],"equivalent":[85],"faulty":[86],"RTL":[87,104],"model.":[88],"The":[89],"activation":[91],"propagation":[93],"constraints":[94],"captured":[96],"using":[97],"Control":[98],"Data":[100],"Flow":[101],"Graph":[102],"as":[105],"Liner":[107],"Temporal":[108],"Logic":[109],"(LTL)":[110],"property.":[111],"This":[112],"LTL":[113],"property":[114,139],"then":[116],"negated":[117],"Bounded":[122],"Model":[123],"Checker":[124],"based":[125],"on":[126],"Bit-Vector":[128],"Satisfiability":[129],"Module":[130],"Theories":[131],"(SMT)":[132],"solver.":[133],"From":[134],"counter-example":[136],"can":[141],"extract":[142],"sequence":[144],"instructions":[146],"that":[147,185],"activates":[148],"propagates":[154],"effect":[157],"one":[159],"observable":[162],"points":[163],"design.":[166],"Our":[167],"approach":[168],"completely":[170],"automatic":[171],"does":[173],"not":[174],"require":[175],"any":[176],"external":[177],"information":[178],"or":[179],"manual":[180],"intervention.":[181],"Experimental":[182],"results":[183],"show":[184],"our":[186],"robust":[189],"scalable":[191]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}