{"id":"https://openalex.org/W2003026405","doi":"https://doi.org/10.1109/ets.2012.6233012","title":"Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation","display_name":"Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2003026405","doi":"https://doi.org/10.1109/ets.2012.6233012","mag":"2003026405"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064797552","display_name":"Fabian Oboril","orcid":"https://orcid.org/0000-0002-2647-4824"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Fabian Oboril","raw_affiliation_strings":["Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology, Karlsruhe, Germany","Chair of Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"],"affiliations":[{"raw_affiliation_string":"Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Chair of Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology, Karlsruhe, Germany","Chair of Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"],"affiliations":[{"raw_affiliation_string":"Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Chair of Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5064797552"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.77535126,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.713011622428894},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6908940076828003},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5455446243286133},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5364196300506592},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.5362662076950073},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5302310585975647},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4987201690673828},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.4747360646724701},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.43364205956459045},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.42315980792045593},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4001760482788086},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14169254899024963},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13325563073158264}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.713011622428894},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6908940076828003},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5455446243286133},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5364196300506592},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.5362662076950073},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5302310585975647},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4987201690673828},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.4747360646724701},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.43364205956459045},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.42315980792045593},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4001760482788086},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14169254899024963},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13325563073158264},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1989662831","https://openalex.org/W2044206819","https://openalex.org/W2048816638","https://openalex.org/W2059193309","https://openalex.org/W2079706534","https://openalex.org/W2099746875","https://openalex.org/W2102352834","https://openalex.org/W2104114347","https://openalex.org/W2105561360","https://openalex.org/W2111538921","https://openalex.org/W2120143168","https://openalex.org/W2125169487","https://openalex.org/W2126652127","https://openalex.org/W2127877371","https://openalex.org/W2129181227","https://openalex.org/W2129960401","https://openalex.org/W2136066624","https://openalex.org/W2142082169","https://openalex.org/W2143821614","https://openalex.org/W2158520623","https://openalex.org/W2170333286","https://openalex.org/W2170382128","https://openalex.org/W3145727536","https://openalex.org/W4229927883"],"related_works":["https://openalex.org/W2443567922","https://openalex.org/W2141691012","https://openalex.org/W2158554422","https://openalex.org/W782195220","https://openalex.org/W2070191702","https://openalex.org/W2587244181","https://openalex.org/W4254521933","https://openalex.org/W1976634368","https://openalex.org/W2351391311","https://openalex.org/W2129260891"],"abstract_inverted_index":{"With":[0],"shrinking":[1],"feature":[2],"sizes,":[3],"transistor":[4],"aging":[5],"becomes":[6],"a":[7,33,63],"reliability":[8],"challenge":[9],"for":[10,32],"embedded":[11],"processors.":[12],"Processes":[13],"such":[14],"as":[15,109,111],"NBTI":[16],"and":[17,24,46,54,78,87,113],"HCI":[18],"lead":[19],"to":[20,29,40,103],"increasing":[21],"gate":[22],"delays":[23],"eventually":[25],"reduced":[26],"lifetime.":[27],"Currently,":[28],"ensure":[30],"functionality":[31],"certain":[34],"lifetime,":[35,51],"safety":[36],"margins":[37],"are":[38,116],"added":[39],"the":[41,58,106],"design,":[42],"which":[43,68],"means":[44],"overdesign":[45],"increased":[47],"costs.":[48],"To":[49],"extend":[50],"reduce":[52],"power":[53,77,112],"heat,":[55],"while":[56,105],"maintaining":[57],"required":[59,107],"performance":[60,108],"we":[61],"propose":[62],"dynamic":[64,85],"runtime":[65,72],"adaptation":[66],"approach,":[67],"is":[69],"based":[70],"on":[71],"monitoring":[73],"of":[74],"temperature,":[75],"performance,":[76],"wearout":[79],"in":[80,94],"combination":[81],"with":[82],"fine-grained":[83],"proactive":[84],"voltage":[86],"frequency":[88],"scaling.":[89],"The":[90],"experimental":[91],"results":[92],"presented":[93],"this":[95],"work":[96],"show":[97],"lifetime":[98],"improvements":[99],"between":[100],"63%":[101],"up":[102],"5\u00d7,":[104],"well":[110],"temperature":[114],"constraints":[115],"maintained.":[117]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}