{"id":"https://openalex.org/W2077540528","doi":"https://doi.org/10.1109/ets.2012.6233000","title":"Power-aware testing: The next stage","display_name":"Power-aware testing: The next stage","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2077540528","doi":"https://doi.org/10.1109/ets.2012.6233000","mag":"2077540528"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2012.6233000","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233000","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Fukuoka, Japan","Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5084697545"],"corresponding_institution_ids":["https://openalex.org/I207014233"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.13715571,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.71033775806427},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6084958910942078},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5769672989845276},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5655527710914612},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2880218029022217}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.71033775806427},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6084958910942078},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5769672989845276},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5655527710914612},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2880218029022217},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2012.6233000","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2012.6233000","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 17th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8600000143051147,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2161338410","https://openalex.org/W3035062237","https://openalex.org/W3210820645"],"related_works":["https://openalex.org/W2381070337","https://openalex.org/W2605403672","https://openalex.org/W1992148151","https://openalex.org/W4252286421","https://openalex.org/W2096934588","https://openalex.org/W2389260891","https://openalex.org/W2367590023","https://openalex.org/W3205508524","https://openalex.org/W2047082046","https://openalex.org/W2354188322"],"abstract_inverted_index":{"Complex":[0],"power":[1,13,16,46,79,84],"management":[2],"circuitry":[3],"in":[4,33,41],"low-power":[5],"designs":[6],"and":[7,14,22,52],"the":[8,34,59,64],"excessive":[9],"gap":[10],"between":[11],"functional":[12],"test":[15,23,45,50,54,78,83],"have":[17],"made":[18,32],"power-aware":[19,67],"testing":[20],"(DFT":[21],"generation)":[24],"a":[25,72],"must.":[26],"Although":[27],"significant":[28],"progress":[29],"has":[30],"been":[31],"past":[35],"decade,":[36],"more":[37],"is":[38],"still":[39],"needed":[40],"order":[42],"to":[43,63,81],"achieve":[44],"safety":[47],"while":[48],"maximizing":[49],"quality":[51],"minimizing":[53],"cost.":[55],"This":[56],"paper":[57],"highlights":[58],"needs":[60],"for":[61],"moving":[62],"next-stage":[65],"of":[66,74],"testing,":[68],"primarily":[69],"characterized":[70],"by":[71],"shift":[73],"focus":[75],"from":[76],"global":[77],"reduction":[80],"pinpoint":[82],"management.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}