{"id":"https://openalex.org/W3092440164","doi":"https://doi.org/10.1109/etfa46521.2020.9212026","title":"Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems","display_name":"Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems","publication_year":2020,"publication_date":"2020-09-01","ids":{"openalex":"https://openalex.org/W3092440164","doi":"https://doi.org/10.1109/etfa46521.2020.9212026","mag":"3092440164"},"language":"en","primary_location":{"id":"doi:10.1109/etfa46521.2020.9212026","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa46521.2020.9212026","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082531315","display_name":"Francisco Arellano-Espitia","orcid":"https://orcid.org/0000-0001-5841-0561"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francisco Arellano-Espitia","raw_affiliation_strings":["MCIA Research Center, Technical University of Catalonia, Terrassa, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MCIA Research Center, Technical University of Catalonia, Terrassa, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045800045","display_name":"Artvin-Darien Gonzalez-Abreu","orcid":"https://orcid.org/0000-0002-8436-0972"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Artvin Darien Gonzalez-Abreu","raw_affiliation_strings":["MCIA Research Center, Technical University of Catalonia, Terrassa, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MCIA Research Center, Technical University of Catalonia, Terrassa, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078539665","display_name":"Miguel Delgado-Prieto","orcid":"https://orcid.org/0000-0001-9282-838X"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Miguel Delgado Prieto","raw_affiliation_strings":["MCIA Research Center, Technical University of Catalonia, Terrassa, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MCIA Research Center, Technical University of Catalonia, Terrassa, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038708149","display_name":"Juan Jos\u00e9 Saucedo-Dorantes","orcid":"https://orcid.org/0000-0001-9026-6694"},"institutions":[{"id":"https://openalex.org/I157492648","display_name":"Autonomous University of Queretaro","ror":"https://ror.org/00v8fdc16","country_code":"MX","type":"education","lineage":["https://openalex.org/I157492648"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Juan Jose Saucedo-Dorantes","raw_affiliation_strings":["HSPdigital CA-Mecatronica, Engineering Faculty, Autonomous, University of Queretaro, San Juan del Rio, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HSPdigital CA-Mecatronica, Engineering Faculty, Autonomous, University of Queretaro, San Juan del Rio, Mexico","institution_ids":["https://openalex.org/I157492648"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046490122","display_name":"Roque A. Osornio\u2010Rios","orcid":"https://orcid.org/0000-0003-0868-2918"},"institutions":[{"id":"https://openalex.org/I157492648","display_name":"Autonomous University of Queretaro","ror":"https://ror.org/00v8fdc16","country_code":"MX","type":"education","lineage":["https://openalex.org/I157492648"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Roque Alfredo Osornio-Rios","raw_affiliation_strings":["HSPdigital CA-Mecatronica, Engineering Faculty, Autonomous, University of Queretaro, San Juan del Rio, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HSPdigital CA-Mecatronica, Engineering Faculty, Autonomous, University of Queretaro, San Juan del Rio, Mexico","institution_ids":["https://openalex.org/I157492648"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1489,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.46769919,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1419","last_page":"1422"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.6496179103851318},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.614948034286499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5729433298110962},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.5634856224060059},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5288704037666321},{"id":"https://openalex.org/keywords/complex-system","display_name":"Complex system","score":0.45464026927948},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41330811381340027},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3791637420654297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35532015562057495},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08587771654129028}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.6496179103851318},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.614948034286499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5729433298110962},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.5634856224060059},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5288704037666321},{"id":"https://openalex.org/C47822265","wikidata":"https://www.wikidata.org/wiki/Q854457","display_name":"Complex system","level":2,"score":0.45464026927948},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41330811381340027},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3791637420654297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35532015562057495},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08587771654129028}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/etfa46521.2020.9212026","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa46521.2020.9212026","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"},{"id":"pmh:oai:upcommons.upc.edu:2117/330308","is_oa":false,"landing_page_url":"http://hdl.handle.net/2117/330308","pdf_url":null,"source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference report"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.5899999737739563,"display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2065194550","https://openalex.org/W2092484276","https://openalex.org/W2311135600","https://openalex.org/W2515930229","https://openalex.org/W2540488895","https://openalex.org/W2559999082","https://openalex.org/W2602460809","https://openalex.org/W2767234670","https://openalex.org/W2783885350","https://openalex.org/W2798712787","https://openalex.org/W2810292802"],"related_works":["https://openalex.org/W4389116644","https://openalex.org/W2153315159","https://openalex.org/W3103844505","https://openalex.org/W259157601","https://openalex.org/W4205463238","https://openalex.org/W2761785940","https://openalex.org/W1482209366","https://openalex.org/W2110523656","https://openalex.org/W2521627374","https://openalex.org/W2981954115"],"abstract_inverted_index":{"In":[0,58],"the":[1,5,21,28,39,44,61,65,68,73,100],"modern":[2],"industry":[3],"framework,":[4],"application":[6],"of":[7,24,35,67,102,104],"condition":[8],"monitoring":[9,32],"schemes":[10],"over":[11,38],"electromechanical":[12,83],"systems":[13,84],"is":[14],"being":[15],"subjected":[16],"to":[17,81,91],"demanding":[18],"requirements.":[19],"Currently,":[20],"massive":[22],"digitalization":[23],"industrial":[25],"assets":[26],"allows":[27],"investigation":[29],"towards":[30],"multiple":[31,97],"strategies":[33],"capable":[34],"emphasize":[36],"deviations":[37],"nominal":[40],"system":[41],"operation.":[42],"However,":[43],"most":[45],"prominent":[46],"techniques,":[47],"such":[48],"as":[49,125],"Machine":[50],"Learning,":[51],"present":[52],"great":[53],"challenges":[54],"in":[55],"complex":[56,82],"systems.":[57],"this":[59],"regard,":[60],"proposed":[62],"study":[63],"presents":[64],"analysis":[66],"diagnostic":[69],"capabilities":[70,118],"resulting":[71],"from":[72],"classical":[74],"approaches":[75],"based":[76],"on":[77],"machine":[78],"learning":[79],"facing":[80],"that":[85],"implies":[86],"a":[87],"working":[88],"environment":[89],"subject":[90],"different":[92,105],"operation":[93],"condition,":[94],"configurations":[95],"with":[96],"components":[98],"and":[99,119],"presence":[101],"faults":[103],"nature":[106],"(mechanical,":[107],"electrical,":[108],"electromagnetic),":[109],"under":[110],"isolated":[111],"or":[112],"combined":[113],"scenarios.":[114],"Discriminative":[115],"feature":[116],"extraction":[117],"classification":[120],"accuracy":[121],"will":[122],"be":[123],"analyzed":[124],"performance":[126],"measures.":[127]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}