{"id":"https://openalex.org/W2898762770","doi":"https://doi.org/10.1109/etfa.2018.8502604","title":"Fault Detection Assessment Architectures based on Classification Methods and Information Fusion","display_name":"Fault Detection Assessment Architectures based on Classification Methods and Information Fusion","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2898762770","doi":"https://doi.org/10.1109/etfa.2018.8502604","mag":"2898762770"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2018.8502604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2018.8502604","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089792616","display_name":"Fernando Ar\u00e9valo","orcid":"https://orcid.org/0000-0001-8664-2626"},"institutions":[{"id":"https://openalex.org/I3130920692","display_name":"South Westphalia University of Applied Sciences","ror":"https://ror.org/04t5phd24","country_code":"DE","type":"education","lineage":["https://openalex.org/I3130920692"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Fernando Arevalo","raw_affiliation_strings":["Department of Automation Technology, South Westphalia University of Applied Sciences, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Automation Technology, South Westphalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I3130920692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041843588","display_name":"Juan Rernenteria","orcid":null},"institutions":[{"id":"https://openalex.org/I3130920692","display_name":"South Westphalia University of Applied Sciences","ror":"https://ror.org/04t5phd24","country_code":"DE","type":"education","lineage":["https://openalex.org/I3130920692"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Juan Rernenteria","raw_affiliation_strings":["Department of Automation Technology, South Westphalia University of Applied Sciences, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Automation Technology, South Westphalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I3130920692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025397538","display_name":"Andreas Schwung","orcid":"https://orcid.org/0000-0001-8405-0977"},"institutions":[{"id":"https://openalex.org/I3130920692","display_name":"South Westphalia University of Applied Sciences","ror":"https://ror.org/04t5phd24","country_code":"DE","type":"education","lineage":["https://openalex.org/I3130920692"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andreas Schwung","raw_affiliation_strings":["Department of Automation Technology, South Westphalia University of Applied Sciences, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Automation Technology, South Westphalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I3130920692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5089792616"],"corresponding_institution_ids":["https://openalex.org/I3130920692"],"apc_list":null,"apc_paid":null,"fwci":0.1839,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.51299143,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"12","issue":null,"first_page":"1343","last_page":"1350"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9797999858856201,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11063","display_name":"Rough Sets and Fuzzy Logic","score":0.9775999784469604,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6951274871826172},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.657461941242218},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.654267430305481},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.6515025496482849},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.6341608762741089},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6160932779312134},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5880410671234131},{"id":"https://openalex.org/keywords/information-fusion","display_name":"Information fusion","score":0.5337516069412231},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.49797940254211426},{"id":"https://openalex.org/keywords/dempster\u2013shafer-theory","display_name":"Dempster\u2013Shafer theory","score":0.475988507270813},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4635350704193115},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.444486141204834},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.42966142296791077},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.328000545501709},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20325183868408203}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6951274871826172},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.657461941242218},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.654267430305481},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.6515025496482849},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.6341608762741089},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6160932779312134},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5880410671234131},{"id":"https://openalex.org/C2982962833","wikidata":"https://www.wikidata.org/wiki/Q17092450","display_name":"Information fusion","level":2,"score":0.5337516069412231},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.49797940254211426},{"id":"https://openalex.org/C178011137","wikidata":"https://www.wikidata.org/wiki/Q285997","display_name":"Dempster\u2013Shafer theory","level":2,"score":0.475988507270813},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4635350704193115},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.444486141204834},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.42966142296791077},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.328000545501709},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20325183868408203},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2018.8502604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2018.8502604","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W575847903","https://openalex.org/W1965484410","https://openalex.org/W2041286561","https://openalex.org/W2061012176","https://openalex.org/W2091285843","https://openalex.org/W2101234009","https://openalex.org/W2462494186","https://openalex.org/W2598908240","https://openalex.org/W2772949188","https://openalex.org/W2779622286","https://openalex.org/W2783070384","https://openalex.org/W2783205090","https://openalex.org/W2784250530","https://openalex.org/W2795411881","https://openalex.org/W4250664506","https://openalex.org/W6675354045"],"related_works":["https://openalex.org/W2067330150","https://openalex.org/W2375966783","https://openalex.org/W2377368844","https://openalex.org/W2360003067","https://openalex.org/W1971957814","https://openalex.org/W2113463819","https://openalex.org/W2363160655","https://openalex.org/W4200472336","https://openalex.org/W2364976037","https://openalex.org/W2136123817"],"abstract_inverted_index":{"Classifiers":[0],"based":[1,61],"on":[2,18,62],"machine":[3],"learning":[4],"are":[5,97],"popular":[6],"in":[7,9,45,79],"literature,":[8],"order":[10,46,80],"to":[11,47,81,99],"support":[12],"predictive":[13],"maintenance":[14],"of":[15,51,72,86,95,107,140],"machinery.":[16],"Depending":[17],"the":[19,35,49,70,83,87,101,110,114,130,137,141],"process":[20],"data,":[21],"one":[22],"classifier":[23],"can":[24],"assess":[25],"target":[26],"classes":[27],"better":[28],"than":[29],"others.":[30],"It":[31,68],"often":[32],"happens":[33],"that":[34,129],"classifiers":[36,115],"complement":[37],"each":[38,52],"other.":[39],"A":[40,117],"fusion":[41,64,74,132],"strategy":[42],"is":[43,124],"needed":[44],"exploit":[48],"strength":[50],"classifier.":[53],"This":[54],"paper":[55],"presents":[56],"fault":[57,88,142],"detection":[58,89,143],"assessment":[59],"architectures":[60,123,135],"information":[63,73,131],"and":[65,76,92,121],"classification":[66,102],"methods.":[67],"proposes":[69],"use":[71],"methods":[75],"different":[77],"architectures,":[78],"improve":[82,109],"overall":[84,138],"result":[85],"assessment.":[90,144],"Dempster-Shafer":[91],"Yager":[93],"rules":[94,106],"combination":[96,108],"used":[98],"fuse":[100],"method":[103],"predictions.":[104],"The":[105,126],"results":[111,127],"by":[112],"complementing":[113],"performance.":[116],"comparison":[118],"between":[119],"centralized":[120],"decentralized":[122,134],"presented.":[125],"show":[128],"using":[133],"improves":[136],"performance":[139]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}