{"id":"https://openalex.org/W2550696815","doi":"https://doi.org/10.1109/etfa.2016.7733676","title":"Fault injection for IEC 61499 applications","display_name":"Fault injection for IEC 61499 applications","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2550696815","doi":"https://doi.org/10.1109/etfa.2016.7733676","mag":"2550696815"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2016.7733676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2016.7733676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058752760","display_name":"Bernd Glatz","orcid":null},"institutions":[{"id":"https://openalex.org/I121760703","display_name":"University of Applied Sciences Technikum Wien","ror":"https://ror.org/04jsx0x49","country_code":"AT","type":"education","lineage":["https://openalex.org/I121760703"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernd Glatz","raw_affiliation_strings":["Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria","institution_ids":["https://openalex.org/I121760703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071640705","display_name":"Harald Schuster","orcid":"https://orcid.org/0000-0003-4206-4128"},"institutions":[{"id":"https://openalex.org/I121760703","display_name":"University of Applied Sciences Technikum Wien","ror":"https://ror.org/04jsx0x49","country_code":"AT","type":"education","lineage":["https://openalex.org/I121760703"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Harald Schuster","raw_affiliation_strings":["Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria","institution_ids":["https://openalex.org/I121760703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028034207","display_name":"Martin Horauer","orcid":"https://orcid.org/0000-0001-6835-0662"},"institutions":[{"id":"https://openalex.org/I121760703","display_name":"University of Applied Sciences Technikum Wien","ror":"https://ror.org/04jsx0x49","country_code":"AT","type":"education","lineage":["https://openalex.org/I121760703"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Martin Horauer","raw_affiliation_strings":["Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Embedded Systems, University of Applied Sciences Technikum Wien, Vienna, Austria","institution_ids":["https://openalex.org/I121760703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080769390","display_name":"T. Rauscher","orcid":"https://orcid.org/0000-0002-1266-0642"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Thomas Rauscher","raw_affiliation_strings":["LOYTEC electronics GmbH, Vienna, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LOYTEC electronics GmbH, Vienna, Austria","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007015294","display_name":"Roman Obermaisser","orcid":"https://orcid.org/0009-0002-4483-1503"},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Roman Obermaisser","raw_affiliation_strings":["University of Siegen, Siegen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Siegen, Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"61499","issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11125","display_name":"Petri Nets in System Modeling","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6691655516624451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6342241168022156},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5976929664611816},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5684078335762024},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.46308380365371704},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.4594178795814514},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4355143904685974},{"id":"https://openalex.org/keywords/industrial-control-system","display_name":"Industrial control system","score":0.4323248267173767},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.42733532190322876},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4232245087623596},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.41363582015037537},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.39551079273223877},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2736686170101166},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11814996600151062},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06470608711242676}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6691655516624451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6342241168022156},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5976929664611816},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5684078335762024},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.46308380365371704},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.4594178795814514},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4355143904685974},{"id":"https://openalex.org/C40071531","wikidata":"https://www.wikidata.org/wiki/Q2513962","display_name":"Industrial control system","level":3,"score":0.4323248267173767},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.42733532190322876},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4232245087623596},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.41363582015037537},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.39551079273223877},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2736686170101166},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11814996600151062},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06470608711242676},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2016.7733676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2016.7733676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1530804449","https://openalex.org/W1974457026","https://openalex.org/W1976288471","https://openalex.org/W2013206563","https://openalex.org/W2018578257","https://openalex.org/W2021772199","https://openalex.org/W2104848200","https://openalex.org/W2148968057","https://openalex.org/W2229371417","https://openalex.org/W2469855547"],"related_works":["https://openalex.org/W4256621493","https://openalex.org/W2486991799","https://openalex.org/W2110796433","https://openalex.org/W2382834095","https://openalex.org/W1993066969","https://openalex.org/W2615607975","https://openalex.org/W2004472153","https://openalex.org/W2113352170","https://openalex.org/W44994412","https://openalex.org/W1986502878"],"abstract_inverted_index":{"Distributed":[0],"control":[1,19,24],"systems":[2],"relying":[3],"on":[4],"IEC":[5],"61499":[6],"are":[7],"a":[8,33],"common":[9],"engineering":[10],"approach":[11],"for":[12,48],"various":[13],"application":[14],"domains":[15],"ranging":[16],"from":[17],"industrial":[18],"to":[20,37,50,55],"the":[21,39],"management":[22],"and":[23],"of":[25,41],"modern":[26],"buildings.":[27],"In":[28],"this":[29],"paper":[30],"we":[31],"propose":[32],"generic":[34],"fault-injection":[35],"concept":[36],"support":[38],"verification":[40],"applications.":[42],"A":[43],"potential":[44],"use-case":[45],"therefore":[46],"is,":[47],"example,":[49],"stress":[51],"measures":[52],"that":[53],"aim":[54],"improve":[56],"their":[57],"reliability.":[58]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}