{"id":"https://openalex.org/W1971693660","doi":"https://doi.org/10.1109/etfa.2012.6489593","title":"IGBT fault detection for three phase motor drives using neural networks","display_name":"IGBT fault detection for three phase motor drives using neural networks","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W1971693660","doi":"https://doi.org/10.1109/etfa.2012.6489593","mag":"1971693660"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2012.6489593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2012.6489593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103413322","display_name":"Marjan Alavi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091207","display_name":"Singapore Institute of Manufacturing Technology","ror":"https://ror.org/00f44np30","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Marjan Alavi","raw_affiliation_strings":["Nanyang Technological University, Singapore","Singapore Institute of Manufacturing Technology, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Singapore Institute of Manufacturing Technology, Singapore","institution_ids":["https://openalex.org/I4210091207"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101440398","display_name":"Ming Luo","orcid":"https://orcid.org/0000-0002-6156-6230"},"institutions":[{"id":"https://openalex.org/I4210091207","display_name":"Singapore Institute of Manufacturing Technology","ror":"https://ror.org/00f44np30","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ming Luo","raw_affiliation_strings":["Singapore Institute of Manufacturing Technology, Singapore"],"affiliations":[{"raw_affiliation_string":"Singapore Institute of Manufacturing Technology, Singapore","institution_ids":["https://openalex.org/I4210091207"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083472752","display_name":"Danwei Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Danwei Wang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018537668","display_name":"Haonan Bai","orcid":"https://orcid.org/0000-0002-8748-4479"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Haonan Bai","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103413322"],"corresponding_institution_ids":["https://openalex.org/I172675005","https://openalex.org/I4210091207"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.76989659,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.8599346280097961},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6883851289749146},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5301146507263184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5269178748130798},{"id":"https://openalex.org/keywords/induction-motor","display_name":"Induction motor","score":0.5056412220001221},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48009541630744934},{"id":"https://openalex.org/keywords/three-phase","display_name":"Three-phase","score":0.4499720335006714},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.430447518825531},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4029378294944763},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3512836992740631}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.8599346280097961},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6883851289749146},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5301146507263184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5269178748130798},{"id":"https://openalex.org/C80962145","wikidata":"https://www.wikidata.org/wiki/Q207450","display_name":"Induction motor","level":3,"score":0.5056412220001221},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48009541630744934},{"id":"https://openalex.org/C173871940","wikidata":"https://www.wikidata.org/wiki/Q471846","display_name":"Three-phase","level":3,"score":0.4499720335006714},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.430447518825531},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4029378294944763},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3512836992740631},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/etfa.2012.6489593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2012.6489593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)","raw_type":"proceedings-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/102805","is_oa":false,"landing_page_url":"http://hdl.handle.net/10220/16439","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1118806","https://openalex.org/W98416746","https://openalex.org/W1964445582","https://openalex.org/W2063936106","https://openalex.org/W2080449109","https://openalex.org/W2099111195","https://openalex.org/W2099383324","https://openalex.org/W2113001322","https://openalex.org/W2114732982","https://openalex.org/W2118095060","https://openalex.org/W2122714101","https://openalex.org/W2124800817","https://openalex.org/W2142351866","https://openalex.org/W2146615496","https://openalex.org/W2156740116","https://openalex.org/W2920943913","https://openalex.org/W4205778870"],"related_works":["https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2417422674","https://openalex.org/W4313395906","https://openalex.org/W2136835438","https://openalex.org/W2374781202","https://openalex.org/W2543288774","https://openalex.org/W2135300732","https://openalex.org/W3010712631","https://openalex.org/W2003111335"],"abstract_inverted_index":{"Motor":[0],"drives":[1,19],"are":[2,35,80,106],"widely":[3],"used":[4],"in":[5,17,44,66],"industry":[6],"for":[7],"controlling":[8],"the":[9,38,74,78,85,93],"speed":[10],"of":[11,37,41,77,84],"three":[12,68],"phase":[13,69,86],"AC":[14],"motors.":[15],"Faults":[16],"motor":[18,21,47],"degrade":[20],"performance":[22],"and":[23,46,62,88,98,101],"can":[24],"cause":[25],"catastrophic":[26],"failures.":[27],"IGBT":[28],"(Insulated":[29],"Gate":[30],"Bipolar":[31],"Transistor)":[32],"switch":[33,64,94,104],"faults":[34,43,65,105],"one":[36],"main":[39],"roots":[40],"electrical":[42],"inverters":[45],"drives.":[48],"In":[49],"this":[50,109],"paper,":[51],"a":[52,67],"method":[53],"based":[54],"on":[55],"neural":[56],"network":[57],"is":[58,90],"implemented":[59],"to":[60],"detect":[61],"isolate":[63],"voltage":[70,89],"source":[71],"inverter.":[72],"Only":[73],"output":[75],"signals":[76],"inverter":[79],"monitored.":[81],"The":[82],"entropy":[83],"current":[87],"selected":[91],"as":[92],"fault":[95],"feature.":[96],"Single":[97],"multiple":[99],"short":[100],"open":[102],"circuit":[103],"isolable":[107],"with":[108],"method.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}