{"id":"https://openalex.org/W1993879428","doi":"https://doi.org/10.1109/etfa.2012.6489543","title":"Fault-centric system modeling using SysML for reliability testing","display_name":"Fault-centric system modeling using SysML for reliability testing","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W1993879428","doi":"https://doi.org/10.1109/etfa.2012.6489543","mag":"1993879428"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2012.6489543","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2012.6489543","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103044561","display_name":"Andreas Thoma","orcid":"https://orcid.org/0000-0003-4477-7076"},"institutions":[{"id":"https://openalex.org/I4210157642","display_name":"Institute of Automation","ror":"https://ror.org/056qj1t15","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210157642","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Andreas Thoma","raw_affiliation_strings":["Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","institution_ids":["https://openalex.org/I4210157642","https://openalex.org/I62916508"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089035702","display_name":"Benjamin Kormann","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157642","display_name":"Institute of Automation","ror":"https://ror.org/056qj1t15","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210157642","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Benjamin Kormann","raw_affiliation_strings":["Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","institution_ids":["https://openalex.org/I4210157642","https://openalex.org/I62916508"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071323487","display_name":"Birgit Vogel\u2010Heuser","orcid":"https://orcid.org/0000-0003-2785-8819"},"institutions":[{"id":"https://openalex.org/I4210157642","display_name":"Institute of Automation","ror":"https://ror.org/056qj1t15","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210157642","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Birgit Vogel-Heuser","raw_affiliation_strings":["Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Automation and Information Systems (AIS), Technische Universit\u00e4t M\u00fcnchen, Garching, Germany","institution_ids":["https://openalex.org/I4210157642","https://openalex.org/I62916508"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen, Insitute of Automation and Information Systems (AIS), Boltzmannstra\u00dfe 15, 85748 Garching, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5103044561"],"corresponding_institution_ids":["https://openalex.org/I4210157642","https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":0.3933,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.6512409,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"14","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/systems-modeling-language","display_name":"Systems Modeling Language","score":0.8359423279762268},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7147301435470581},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6267390251159668},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6189092993736267},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5671522617340088},{"id":"https://openalex.org/keywords/iec-61508","display_name":"IEC 61508","score":0.5484423041343689},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5078330636024475},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.478739470243454},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.453095018863678},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.4474565386772156},{"id":"https://openalex.org/keywords/unified-modeling-language","display_name":"Unified Modeling Language","score":0.41718196868896484},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.4088042378425598},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3260740041732788},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29186272621154785}],"concepts":[{"id":"https://openalex.org/C21285288","wikidata":"https://www.wikidata.org/wiki/Q2117885","display_name":"Systems Modeling Language","level":4,"score":0.8359423279762268},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7147301435470581},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6267390251159668},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6189092993736267},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5671522617340088},{"id":"https://openalex.org/C138267214","wikidata":"https://www.wikidata.org/wiki/Q1060017","display_name":"IEC 61508","level":3,"score":0.5484423041343689},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5078330636024475},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.478739470243454},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.453095018863678},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.4474565386772156},{"id":"https://openalex.org/C145644426","wikidata":"https://www.wikidata.org/wiki/Q169411","display_name":"Unified Modeling Language","level":3,"score":0.41718196868896484},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.4088042378425598},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3260740041732788},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29186272621154785},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2012.6489543","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2012.6489543","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W118275423","https://openalex.org/W1523509419","https://openalex.org/W1538377194","https://openalex.org/W1964073704","https://openalex.org/W1964546727","https://openalex.org/W1986517062","https://openalex.org/W1994651680","https://openalex.org/W2013931216","https://openalex.org/W2060637901","https://openalex.org/W2061939755","https://openalex.org/W2078926706","https://openalex.org/W2080221300","https://openalex.org/W2111939355","https://openalex.org/W2119228412","https://openalex.org/W2148602057","https://openalex.org/W2157051858","https://openalex.org/W2186588049","https://openalex.org/W2539673756","https://openalex.org/W6632158880","https://openalex.org/W6670588329","https://openalex.org/W6670768130","https://openalex.org/W6686747482"],"related_works":["https://openalex.org/W4205326760","https://openalex.org/W2022575379","https://openalex.org/W2647065762","https://openalex.org/W2073789596","https://openalex.org/W2142266554","https://openalex.org/W2109422125","https://openalex.org/W2809220500","https://openalex.org/W4323821308","https://openalex.org/W1859113972","https://openalex.org/W2150895999"],"abstract_inverted_index":{"Current":[0],"production":[1],"plants":[2],"are":[3],"highly":[4],"customizable":[5],"and":[6],"flexible":[7],"in":[8,42,71,123],"their":[9],"processes.":[10],"This":[11],"flexibility":[12],"is":[13,90],"mainly":[14],"realized":[15],"by":[16],"software.":[17],"Standards":[18],"like":[19],"IEC":[20],"61508":[21],"for":[22,60,120],"functional":[23],"safety":[24],"demand":[25],"intensive":[26],"testing":[27],"efforts":[28],"to":[29,84,92],"ensure":[30],"a":[31,50,93,98],"certain":[32],"level":[33],"of":[34,97],"integrity.":[35],"The":[36,64,88],"uncertainty":[37],"about":[38],"system":[39,58],"behavior,":[40],"especially":[41],"fault":[43,54,66],"situations,":[44],"complicates":[45],"reliability":[46,124],"testing.":[47,125],"We":[48],"propose":[49],"concept":[51,89],"that":[52],"integrates":[53],"models":[55,59,67,115],"into":[56],"SysML":[57],"model":[61],"based":[62],"development.":[63],"introduced":[65],"can":[68,109,116],"be":[69],"designed":[70],"two":[72],"granularity":[73],"levels,":[74],"starting":[75],"with":[76],"coarse":[77],"information":[78],"at":[79],"early":[80],"development":[81],"phases":[82],"up":[83],"precise":[85],"mathematical":[86],"relations.":[87],"applied":[91],"component":[94],"(rotary":[95],"switch)":[96],"laboratory":[99],"plant,":[100],"which":[101],"connects":[102],"three":[103],"conveyor":[104],"bands":[105],"where":[106],"friction":[107],"deviation":[108],"occur":[110],"during":[111],"rotary":[112],"movement.":[113],"Such":[114],"build":[117],"the":[118],"foundation":[119],"test":[121],"generation":[122]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}