{"id":"https://openalex.org/W2085209126","doi":"https://doi.org/10.1109/etfa.2010.5641267","title":"Combination of weak classifiers for metallic corrosion detection and guided crack location","display_name":"Combination of weak classifiers for metallic corrosion detection and guided crack location","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W2085209126","doi":"https://doi.org/10.1109/etfa.2010.5641267","mag":"2085209126"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2010.5641267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2010.5641267","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044830323","display_name":"Francisco Bonnin\u2010Pascual","orcid":"https://orcid.org/0000-0002-4215-3764"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"F Bonnin-Pascual","raw_affiliation_strings":["Department of Mathematics and Computer Science, University of Balearic Islands, Spain","Dep. of Mathematics and Computer Science, University of Balearic Islands, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Computer Science, University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"Dep. of Mathematics and Computer Science, University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009268269","display_name":"Alberto Ortiz","orcid":"https://orcid.org/0000-0002-8253-7455"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A Ortiz","raw_affiliation_strings":["Department of Mathematics and Computer Science, University of Balearic Islands, Spain","Dep. of Mathematics and Computer Science, University of Balearic Islands, Spain"],"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Computer Science, University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"Dep. of Mathematics and Computer Science, University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5044830323"],"corresponding_institution_ids":["https://openalex.org/I50441567"],"apc_list":null,"apc_paid":null,"fwci":2.4472,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.89507745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"20","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10310","display_name":"Corrosion Behavior and Inhibition","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/false-positive-paradox","display_name":"False positive paradox","score":0.8526614904403687},{"id":"https://openalex.org/keywords/corrosion","display_name":"Corrosion","score":0.6801838278770447},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6464713215827942},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.577860414981842},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5619884729385376},{"id":"https://openalex.org/keywords/hull","display_name":"Hull","score":0.5389410257339478},{"id":"https://openalex.org/keywords/true-positive-rate","display_name":"True positive rate","score":0.4936612546443939},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.48767220973968506},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4851742386817932},{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.4785390794277191},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4627058804035187},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.39607274532318115},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3542565703392029},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28677764534950256},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.23610162734985352},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1957588791847229},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.10221460461616516},{"id":"https://openalex.org/keywords/marine-engineering","display_name":"Marine engineering","score":0.09109941124916077}],"concepts":[{"id":"https://openalex.org/C64869954","wikidata":"https://www.wikidata.org/wiki/Q1859747","display_name":"False positive paradox","level":2,"score":0.8526614904403687},{"id":"https://openalex.org/C20625102","wikidata":"https://www.wikidata.org/wiki/Q137056","display_name":"Corrosion","level":2,"score":0.6801838278770447},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6464713215827942},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.577860414981842},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5619884729385376},{"id":"https://openalex.org/C37423430","wikidata":"https://www.wikidata.org/wiki/Q6750281","display_name":"Hull","level":2,"score":0.5389410257339478},{"id":"https://openalex.org/C2989486834","wikidata":"https://www.wikidata.org/wiki/Q3808900","display_name":"True positive rate","level":2,"score":0.4936612546443939},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.48767220973968506},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4851742386817932},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.4785390794277191},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4627058804035187},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.39607274532318115},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3542565703392029},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28677764534950256},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.23610162734985352},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1957588791847229},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.10221460461616516},{"id":"https://openalex.org/C199104240","wikidata":"https://www.wikidata.org/wiki/Q118291","display_name":"Marine engineering","level":1,"score":0.09109941124916077},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2010.5641267","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2010.5641267","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Life below water","id":"https://metadata.un.org/sdg/14"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2076807998","https://openalex.org/W2091149439","https://openalex.org/W2128272608","https://openalex.org/W2911709767"],"related_works":["https://openalex.org/W2027184711","https://openalex.org/W1557094818","https://openalex.org/W4287692494","https://openalex.org/W3129715955","https://openalex.org/W3047594718","https://openalex.org/W2953243682","https://openalex.org/W3027053746","https://openalex.org/W4299651861","https://openalex.org/W4386222044","https://openalex.org/W2099261052"],"abstract_inverted_index":{"Periodic":[0],"visual":[1],"inspection":[2,25,38],"of":[3,9,29,32,74],"the":[4,24,72,75,92],"internal":[5],"and":[6,57],"external":[7],"parts":[8],"vessels":[10],"hull":[11],"is":[12,78,87],"typically":[13],"performed":[14],"by":[15,27,71],"trained":[16],"surveyors":[17],"at":[18],"great":[19],"cost.":[20,39],"Assisting":[21],"them":[22],"during":[23],"process":[26],"means":[28],"mechanisms":[30],"capable":[31],"defect":[33],"detection":[34,48,68],"would":[35],"certainly":[36],"decrease":[37],"With":[40],"this":[41,43],"aim,":[42],"paper":[44],"presents":[45],"a":[46,52,63,66,82],"corrosion":[47,76],"algorithm":[49],"built":[50],"around":[51],"weak":[53],"classifiers":[54],"cascade":[55],"scheme":[56],"reports":[58],"on":[59],"its":[60],"performance.":[61],"As":[62,81],"secondary":[64],"contribution,":[65],"crack":[67],"approach":[69],"guided":[70],"output":[73],"detector":[77],"also":[79],"proposed.":[80],"result,":[83],"false":[84],"positives":[85],"rate":[86],"reduced":[88],"as":[89,91],"well":[90],"computation":[93],"time.":[94]},"counts_by_year":[{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}