{"id":"https://openalex.org/W2050644865","doi":"https://doi.org/10.1109/etfa.2010.5641069","title":"3D machine vision and artificial neural networks for quality inspection in mass production pieces","display_name":"3D machine vision and artificial neural networks for quality inspection in mass production pieces","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W2050644865","doi":"https://doi.org/10.1109/etfa.2010.5641069","mag":"2050644865"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2010.5641069","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2010.5641069","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091482754","display_name":"Alberto Tellaeche","orcid":"https://orcid.org/0000-0001-9236-1951"},"institutions":[{"id":"https://openalex.org/I4210165188","display_name":"Fundaci\u00f3n Teknon","ror":"https://ror.org/05r9t2t65","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210165188"]},{"id":"https://openalex.org/I4210136402","display_name":"Tekniker","ror":"https://ror.org/033vryh36","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"A Tellaeche","raw_affiliation_strings":["Fundaci\u00f2n Tekniker IK4, Gipuzkoa, Spain","Fundaci\u00f3n Tekniker - IK4, Avda. Otaola 20, Eibar, 20600, Gipuzkoa, Spain"],"affiliations":[{"raw_affiliation_string":"Fundaci\u00f2n Tekniker IK4, Gipuzkoa, Spain","institution_ids":["https://openalex.org/I4210136402"]},{"raw_affiliation_string":"Fundaci\u00f3n Tekniker - IK4, Avda. Otaola 20, Eibar, 20600, Gipuzkoa, Spain","institution_ids":["https://openalex.org/I4210165188","https://openalex.org/I4210136402"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112056022","display_name":"B. Robles","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136402","display_name":"Tekniker","ror":"https://ror.org/033vryh36","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]},{"id":"https://openalex.org/I4210165188","display_name":"Fundaci\u00f3n Teknon","ror":"https://ror.org/05r9t2t65","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210165188"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"B Robles","raw_affiliation_strings":["Fundaci\u00f2n Tekniker IK4, Gipuzkoa, Spain","Fundaci\u00f3n Tekniker - IK4, Avda. Otaola 20, Eibar, 20600, Gipuzkoa, Spain"],"affiliations":[{"raw_affiliation_string":"Fundaci\u00f2n Tekniker IK4, Gipuzkoa, Spain","institution_ids":["https://openalex.org/I4210136402"]},{"raw_affiliation_string":"Fundaci\u00f3n Tekniker - IK4, Avda. Otaola 20, Eibar, 20600, Gipuzkoa, Spain","institution_ids":["https://openalex.org/I4210165188","https://openalex.org/I4210136402"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091482754"],"corresponding_institution_ids":["https://openalex.org/I4210136402","https://openalex.org/I4210165188"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.17047923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"84","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/percussion","display_name":"Percussion","score":0.8958835005760193},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6323118209838867},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6212469935417175},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6047584414482117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6044591069221497},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.5784335136413574},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5149770379066467},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4845685064792633},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4757547080516815},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.1005125343799591}],"concepts":[{"id":"https://openalex.org/C81687914","wikidata":"https://www.wikidata.org/wiki/Q1501797","display_name":"Percussion","level":2,"score":0.8958835005760193},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6323118209838867},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6212469935417175},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6047584414482117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6044591069221497},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.5784335136413574},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5149770379066467},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4845685064792633},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4757547080516815},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.1005125343799591},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2010.5641069","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2010.5641069","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W34517023","https://openalex.org/W1585613664","https://openalex.org/W1627661227","https://openalex.org/W2063413791","https://openalex.org/W2091281415","https://openalex.org/W2119512999","https://openalex.org/W2153997154","https://openalex.org/W2502759836","https://openalex.org/W2799061466","https://openalex.org/W2966207845","https://openalex.org/W3198390318","https://openalex.org/W4244494905"],"related_works":["https://openalex.org/W4252429873","https://openalex.org/W566300690","https://openalex.org/W2186570258","https://openalex.org/W2175615870","https://openalex.org/W2376834036","https://openalex.org/W2419637333","https://openalex.org/W4307419505","https://openalex.org/W2181501457","https://openalex.org/W2415499330","https://openalex.org/W3207476082"],"abstract_inverted_index":{"The":[0],"exhaustive":[1],"quality":[2,18],"control":[3,19],"is":[4,22,93],"becoming":[5],"very":[6],"important":[7],"in":[8,36,69,84,122],"the":[9,23,51,54,70,77,97,118,123],"world's":[10],"globalized":[11],"market.":[12],"One":[13],"of":[14,53,57,76,117],"these":[15,90],"examples":[16],"where":[17],"becomes":[20],"critical":[21],"percussion":[24,58,71,85,124],"cap":[25,86],"mass":[26],"production.":[27],"These":[28],"elements":[29],"must":[30],"achieve":[31],"a":[32,42,47,106,114],"minimum":[33],"tolerance":[34],"deviation":[35],"their":[37],"fabrication.":[38],"This":[39,60],"paper":[40],"outlines":[41],"machine":[43],"vision":[44],"development":[45],"using":[46],"3D":[48],"camera":[49],"for":[50],"inspection":[52],"whole":[55],"production":[56],"caps.":[59,125],"system":[61,78],"presents":[62],"multiple":[63],"problems,":[64,91],"such":[65],"as":[66],"metallic":[67],"reflections":[68],"caps,":[72],"high":[73],"speed":[74],"movement":[75],"and":[79,82,104],"mechanical":[80],"errors":[81,120],"irregularities":[83],"placement.":[87],"Due":[88],"to":[89,95,112],"it":[92],"impossible":[94],"solve":[96],"problem":[98],"by":[99],"traditional":[100],"image":[101],"processing":[102],"methods,":[103],"hence,":[105],"neural":[107],"network":[108],"has":[109],"been":[110],"tested":[111],"provide":[113],"feasible":[115],"classification":[116],"possible":[119],"present":[121]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}