{"id":"https://openalex.org/W2156018060","doi":"https://doi.org/10.1109/etfa.2009.5347032","title":"Integration of Knowledge Discovery techniques in the Quality Management model to achieve higher target quality","display_name":"Integration of Knowledge Discovery techniques in the Quality Management model to achieve higher target quality","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2156018060","doi":"https://doi.org/10.1109/etfa.2009.5347032","mag":"2156018060"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2009.5347032","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2009.5347032","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Conference on Emerging Technologies & Factory Automation","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012844114","display_name":"Fazel Ansari","orcid":"https://orcid.org/0000-0002-2705-0396"},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Ansari Ch","raw_affiliation_strings":["University of Siegen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033065226","display_name":"C. Sassenberg","orcid":null},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Sassenberg","raw_affiliation_strings":["University of Siegen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037843564","display_name":"Madjid Fathi","orcid":"https://orcid.org/0000-0002-7602-9593"},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Fathi","raw_affiliation_strings":["University of Siegen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046667055","display_name":"Ralf Montino","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163975","display_name":"Elmos Semiconductor (Germany)","ror":"https://ror.org/05b3fmb74","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210163975"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Montino","raw_affiliation_strings":["ELMOS Central IT Services GmbH & Co KG Dortmund, Dortmund, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ELMOS Central IT Services GmbH & Co KG Dortmund, Dortmund, Germany","institution_ids":["https://openalex.org/I4210163975"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4687,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.85759125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"16","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11891","display_name":"Big Data and Business Intelligence","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/1404","display_name":"Management Information Systems"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11891","display_name":"Big Data and Business Intelligence","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/1404","display_name":"Management Information Systems"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11063","display_name":"Rough Sets and Fuzzy Logic","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10538","display_name":"Data Mining Algorithms and Applications","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.7122601270675659},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6547886729240417},{"id":"https://openalex.org/keywords/quality-management","display_name":"Quality management","score":0.6168046593666077},{"id":"https://openalex.org/keywords/total-quality-management","display_name":"Total quality management","score":0.5698009729385376},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5063842535018921},{"id":"https://openalex.org/keywords/knowledge-management","display_name":"Knowledge management","score":0.44965317845344543},{"id":"https://openalex.org/keywords/knowledge-extraction","display_name":"Knowledge extraction","score":0.4130091369152069},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3624851107597351},{"id":"https://openalex.org/keywords/process-management","display_name":"Process management","score":0.3554536700248718},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.20253050327301025},{"id":"https://openalex.org/keywords/management-system","display_name":"Management system","score":0.19586163759231567},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19535097479820251},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.17313745617866516},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.12127938866615295},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.09272769093513489}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.7122601270675659},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6547886729240417},{"id":"https://openalex.org/C71405471","wikidata":"https://www.wikidata.org/wiki/Q757012","display_name":"Quality management","level":3,"score":0.6168046593666077},{"id":"https://openalex.org/C138897024","wikidata":"https://www.wikidata.org/wiki/Q381001","display_name":"Total quality management","level":3,"score":0.5698009729385376},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5063842535018921},{"id":"https://openalex.org/C56739046","wikidata":"https://www.wikidata.org/wiki/Q192060","display_name":"Knowledge management","level":1,"score":0.44965317845344543},{"id":"https://openalex.org/C120567893","wikidata":"https://www.wikidata.org/wiki/Q1582085","display_name":"Knowledge extraction","level":2,"score":0.4130091369152069},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3624851107597351},{"id":"https://openalex.org/C195094911","wikidata":"https://www.wikidata.org/wiki/Q14167904","display_name":"Process management","level":1,"score":0.3554536700248718},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.20253050327301025},{"id":"https://openalex.org/C198783460","wikidata":"https://www.wikidata.org/wiki/Q629173","display_name":"Management system","level":2,"score":0.19586163759231567},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19535097479820251},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.17313745617866516},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.12127938866615295},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.09272769093513489},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C137335462","wikidata":"https://www.wikidata.org/wiki/Q380772","display_name":"Lean manufacturing","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2009.5347032","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2009.5347032","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Conference on Emerging Technologies & Factory Automation","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1540602613","https://openalex.org/W1570713908","https://openalex.org/W1589103605","https://openalex.org/W2014915963","https://openalex.org/W2033626294","https://openalex.org/W2116149996","https://openalex.org/W2131682353","https://openalex.org/W2143515036","https://openalex.org/W2163598528","https://openalex.org/W2166280719","https://openalex.org/W2530937985","https://openalex.org/W2799190477","https://openalex.org/W4239980998","https://openalex.org/W6603327141","https://openalex.org/W6684327724"],"related_works":["https://openalex.org/W2366201660","https://openalex.org/W3144843403","https://openalex.org/W2203311202","https://openalex.org/W1668465271","https://openalex.org/W4225369974","https://openalex.org/W1971532397","https://openalex.org/W3139586330","https://openalex.org/W2157142825","https://openalex.org/W2095235013","https://openalex.org/W2083903373"],"abstract_inverted_index":{"Improving":[0],"the":[1,10,25,40,57,87,90,97,104],"quality":[2,29,58],"of":[3,16,30,42,59,70,89,99,110],"products":[4],"is":[5,83],"an":[6,74],"important":[7],"issue":[8],"in":[9,46,80],"modern":[11],"business":[12],"world.":[13],"Traditional":[14],"approaches":[15,37],"Quality":[17,48],"Management":[18,44,49],"(QM)":[19],"are":[20],"not":[21],"adequate":[22],"to":[23,67,85,95],"fulfil":[24],"demands":[26],"on":[27,39,55],"target":[28],"products.":[31,60],"This":[32],"study":[33],"reveals":[34],"that":[35],"synergetic":[36,101],"based":[38],"integration":[41],"Knowledge":[43,78],"(KM)":[45],"Total":[47],"(TQM)":[50],"have":[51],"a":[52,64],"direct":[53],"impact":[54],"enhancing":[56],"We":[61],"also":[62],"propose":[63],"management":[65,92],"model":[66,93],"synthesize":[68],"elements":[69],"both":[71],"methodologies":[72],"under":[73],"integrative":[75],"framework.":[76],"Furthermore,":[77],"Discovery":[79],"Databases":[81],"(KDD)":[82],"introduced":[84],"realize":[86],"effectiveness":[88],"proposed":[91],"and":[94],"illustrate":[96],"influence":[98],"this":[100],"approach":[102],"taking":[103],"semiconductor":[105],"industry":[106],"as":[107],"exemplary":[108],"field":[109],"application.":[111]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}