{"id":"https://openalex.org/W4387251272","doi":"https://doi.org/10.1109/essderc59256.2023.10268534","title":"Hot-Carrier Degradation modeling of DCR drift in SPADs","display_name":"Hot-Carrier Degradation modeling of DCR drift in SPADs","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387251272","doi":"https://doi.org/10.1109/essderc59256.2023.10268534"},"language":"en","primary_location":{"id":"doi:10.1109/essderc59256.2023.10268534","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/essderc59256.2023.10268534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029738777","display_name":"Mathieu Sicre","orcid":"https://orcid.org/0000-0003-2925-1850"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Mathieu Sicre","raw_affiliation_strings":["TR&D, STMicroelectronics,Crolles,France","CEA-Leti, Univ. Grenoble Alpes, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"TR&D, STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"CEA-Leti, Univ. Grenoble Alpes, Grenoble, France","institution_ids":["https://openalex.org/I899635006","https://openalex.org/I4210150049","https://openalex.org/I2738703131"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112356923","display_name":"David Roy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Roy","raw_affiliation_strings":["TR&D, STMicroelectronics,Crolles,France"],"affiliations":[{"raw_affiliation_string":"TR&D, STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064991349","display_name":"Fran\u00e7is Calmon","orcid":"https://orcid.org/0000-0001-5076-076X"},"institutions":[{"id":"https://openalex.org/I2800958632","display_name":"Institut des Nanotechnologies de Lyon","ror":"https://ror.org/04jsk0b74","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I2800958632","https://openalex.org/I4210095849","https://openalex.org/I48430043","https://openalex.org/I59692284"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francis Calmon","raw_affiliation_strings":["Université de Lyon,INL, UMR, CNRS 5270,Villeurbanne,France"],"affiliations":[{"raw_affiliation_string":"Université de Lyon,INL, UMR, CNRS 5270,Villeurbanne,France","institution_ids":["https://openalex.org/I2800958632","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5029738777"],"corresponding_institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210104693","https://openalex.org/I4210150049","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.4814,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.76679064,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"61","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6641907095909119},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5948655009269714},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5768706798553467},{"id":"https://openalex.org/keywords/photon","display_name":"Photon","score":0.46457868814468384},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4607395529747009},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.4243486225605011},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.4228660464286804},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.41149696707725525},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2975855767726898},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2587698698043823}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6641907095909119},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5948655009269714},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5768706798553467},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.46457868814468384},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4607395529747009},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4243486225605011},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.4228660464286804},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.41149696707725525},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2975855767726898},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2587698698043823},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/essderc59256.2023.10268534","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/essderc59256.2023.10268534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1974384738","https://openalex.org/W1985933569","https://openalex.org/W1988760266","https://openalex.org/W2031369996","https://openalex.org/W2042695504","https://openalex.org/W2055309078","https://openalex.org/W2065171052","https://openalex.org/W2067732381","https://openalex.org/W2102352834","https://openalex.org/W2109522465","https://openalex.org/W2128923591","https://openalex.org/W2144970115","https://openalex.org/W2155601603","https://openalex.org/W2809790947","https://openalex.org/W3108071383","https://openalex.org/W4255528151","https://openalex.org/W4308090231","https://openalex.org/W4319430502","https://openalex.org/W6682993767","https://openalex.org/W6803440298"],"related_works":["https://openalex.org/W2393870460","https://openalex.org/W2254578859","https://openalex.org/W4284894156","https://openalex.org/W2161803855","https://openalex.org/W3110774753","https://openalex.org/W2134539662","https://openalex.org/W2059096050","https://openalex.org/W3031634380","https://openalex.org/W2163602710","https://openalex.org/W2026609739"],"abstract_inverted_index":{"DCR":[0],"drift":[1],"(\u0394DCR)":[2],"modeling":[3],"in":[4],"Single-Photon":[5],"Avalanche":[6],"Diodes":[7],"(SPADs)":[8],"is":[9,22,85,104],"proposed":[10],"based":[11],"on":[12],"hot-carrier":[13],"degradation":[14,76],"(HCD)":[15],"mechanism.":[16],"The":[17,50,82],"bond":[18,47],"dissociation":[19,48],"rate":[20,112],"constant":[21],"modeled":[23],"at":[24],"various":[25],"stress":[26,132,141],"temperatures":[27],"and":[28,66,90,101,140],"voltages":[29],"by":[30,56,97,107],"the":[31,37,43,63,67,75,78,109,119],"carrier":[32,51,83,110],"energy":[33,53],"distribution":[34,52],"coupled":[35],"with":[36,94,118],"current":[38,96],"density":[39,84],"considering":[40],"carriers":[41],"reaching":[42],"mean":[44],"threshold":[45],"Si-H":[46],"energy.":[49],"was":[54],"achieved":[55],"a":[57,135],"Full-Band":[58],"Monte-Carlo":[59],"simulation":[60],"accounting":[61],"for":[62],"band":[64],"structure":[65],"scattering":[68],"mechanisms.":[69],"Hot":[70],"electrons":[71],"contributes":[72],"mostly":[73],"to":[74,128],"of":[77,99,138],"top":[79],"SPAD":[80],"interface.":[81],"then":[86,105],"extracted":[87],"from":[88,113],"dark-":[89],"photo-generated":[91],"currents":[92],"together":[93,117],"multiplication":[95],"means":[98],"experiment":[100],"modeling.":[102],"\u0394DCR":[103,130],"computed":[106],"integrating":[108],"generation":[111],"these":[114],"stress-induced":[115],"defects":[116],"position-dependent":[120],"breakdown":[121],"probability.":[122],"This":[123],"physic-based":[124],"compact":[125],"model":[126],"allows":[127],"predict":[129],"along":[131],"time":[133],"under":[134],"whole":[136],"set":[137],"characterization":[139],"conditions.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}