{"id":"https://openalex.org/W4387251359","doi":"https://doi.org/10.1109/essderc59256.2023.10268520","title":"ePCM reliability improvement through active material carbon implantation","display_name":"ePCM reliability improvement through active material carbon implantation","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387251359","doi":"https://doi.org/10.1109/essderc59256.2023.10268520"},"language":"en","primary_location":{"id":"doi:10.1109/essderc59256.2023.10268520","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc59256.2023.10268520","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108627464","display_name":"Elisabetta Palumbo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Elisabetta Palumbo","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082376758","display_name":"A. Motta","orcid":"https://orcid.org/0000-0003-4178-0843"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Motta","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067239485","display_name":"Elisa Petroni","orcid":"https://orcid.org/0000-0001-5534-6058"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Elisa Petroni","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013457678","display_name":"D. Gallinari","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Gallinari","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001244412","display_name":"Annalisa Gilardini","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Annalisa Gilardini","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004966365","display_name":"A. Galbiati","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Amos Galbiati","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060219430","display_name":"Massimo Borghi","orcid":"https://orcid.org/0000-0003-4137-0852"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Massimo Borghi","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057331399","display_name":"R. Annunziata","orcid":"https://orcid.org/0000-0002-4238-8002"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Annunziata","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072146941","display_name":"Andrea Redaelli","orcid":"https://orcid.org/0000-0002-9690-5052"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Redaelli","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":null,"apc_paid":null,"fwci":3.4739,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.92979901,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"29","last_page":"32"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/alloy","display_name":"Alloy","score":0.6578570604324341},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5439229011535645},{"id":"https://openalex.org/keywords/homogeneous","display_name":"Homogeneous","score":0.4990520477294922},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48877212405204773},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.4503253996372223},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3695683479309082},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.33598268032073975},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28133463859558105},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21345564723014832},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.18544793128967285},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.1741846203804016}],"concepts":[{"id":"https://openalex.org/C2780026712","wikidata":"https://www.wikidata.org/wiki/Q37756","display_name":"Alloy","level":2,"score":0.6578570604324341},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5439229011535645},{"id":"https://openalex.org/C66882249","wikidata":"https://www.wikidata.org/wiki/Q169336","display_name":"Homogeneous","level":2,"score":0.4990520477294922},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48877212405204773},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4503253996372223},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3695683479309082},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.33598268032073975},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28133463859558105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21345564723014832},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.18544793128967285},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.1741846203804016},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/essderc59256.2023.10268520","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc59256.2023.10268520","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2008925727","https://openalex.org/W3137434587","https://openalex.org/W4200276902","https://openalex.org/W4232130887","https://openalex.org/W4319338885","https://openalex.org/W4320905475"],"related_works":["https://openalex.org/W2082914599","https://openalex.org/W2756570351","https://openalex.org/W2383621719","https://openalex.org/W2606427896","https://openalex.org/W4211139140","https://openalex.org/W2007805353","https://openalex.org/W2132500134","https://openalex.org/W2387433897","https://openalex.org/W2008392873","https://openalex.org/W2390622580"],"abstract_inverted_index":{"Embedded":[0],"Phase":[1],"Change":[2],"Memories":[3],"(ePCM)":[4],"based":[5],"on":[6,54,84,94],"Ge-rich":[7],"Ge2Sb2Te5alloy":[8],"have":[9],"been":[10],"proven":[11],"to":[12,59,64],"guarantee":[13],"code":[14],"integrity":[15],"after":[16],"soldering":[17],"thermal":[18],"profile":[19],"and":[20,68,78,81,93],"data":[21],"retention":[22],"in":[23],"extended":[24],"temperature":[25],"range":[26],"for":[27],"automotive":[28],"application.":[29],"A":[30],"characteristic":[31],"of":[32,35],"this":[33,52],"kind":[34],"alloy":[36],"is":[37],"Ge":[38,61],"segregation":[39,62],"during":[40],"the":[41,82],"fabrication":[42],"process.":[43],"This":[44,71],"paper":[45],"shows":[46],"how":[47],"carbon":[48],"implantation":[49],"can":[50],"influence":[51],"phenomenon":[53],"a":[55,65,95],"process":[56],"not":[57],"optimized":[58],"contain":[60],"leading":[63],"more":[66],"homogeneous":[67],"stable":[69],"alloy.":[70],"effect":[72],"was":[73,87],"demonstrated":[74],"by":[75],"detailed":[76],"physical":[77],"chemical":[79],"analysis":[80],"impact":[83],"electrical":[85],"performances":[86],"investigated":[88],"at":[89],"intrinsic":[90],"cell":[91],"level":[92],"20Mbit":[96],"array.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}