{"id":"https://openalex.org/W4303188590","doi":"https://doi.org/10.1109/essderc55479.2022.9947120","title":"A self-sustaining Single Photon Avalanche Diode Model","display_name":"A self-sustaining Single Photon Avalanche Diode Model","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4303188590","doi":"https://doi.org/10.1109/essderc55479.2022.9947120"},"language":"en","primary_location":{"id":"doi:10.1109/essderc55479.2022.9947120","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc55479.2022.9947120","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103186369","display_name":"Sven Rink","orcid":"https://orcid.org/0009-0003-3076-4829"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"S. Rink","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074707855","display_name":"V. Quenette","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"V. Quenette","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072202610","display_name":"Jean\u2013Robert Manouvrier","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.R. Manouvrier","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108450160","display_name":"A. Juge","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Juge","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081802519","display_name":"G. Gouget","orcid":"https://orcid.org/0000-0001-5435-0768"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Gouget","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112580890","display_name":"D. Rideau","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Rideau","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110991989","display_name":"R.A. Bianchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R.A. Bianchi","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060472357","display_name":"Dominique Golanski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Golanski","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084213770","display_name":"Bastien Mamdy","orcid":"https://orcid.org/0000-0003-1381-5447"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Mamdy","raw_affiliation_strings":["STMicroelectronics,Crolles,France","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070330499","display_name":"Jean-Baptiste Kammerer","orcid":"https://orcid.org/0000-0003-4430-5212"},"institutions":[{"id":"https://openalex.org/I68947357","display_name":"Universit\u00e9 de Strasbourg","ror":"https://ror.org/00pg6eq24","country_code":"FR","type":"education","lineage":["https://openalex.org/I68947357"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.B. Kammerer","raw_affiliation_strings":["*ICube, CNRS & Université de Strasbourg,Strasbourg,France"],"affiliations":[{"raw_affiliation_string":"*ICube, CNRS & Université de Strasbourg,Strasbourg,France","institution_ids":["https://openalex.org/I68947357","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086274977","display_name":"Wilfried Uhring","orcid":"https://orcid.org/0000-0002-6318-4500"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I68947357","display_name":"Universit\u00e9 de Strasbourg","ror":"https://ror.org/00pg6eq24","country_code":"FR","type":"education","lineage":["https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"W. Uhring","raw_affiliation_strings":["*ICube, CNRS & Université de Strasbourg,Strasbourg,France"],"affiliations":[{"raw_affiliation_string":"*ICube, CNRS & Université de Strasbourg,Strasbourg,France","institution_ids":["https://openalex.org/I68947357","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055580961","display_name":"Christophe Lallement","orcid":"https://orcid.org/0000-0002-0708-7212"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I68947357","display_name":"Universit\u00e9 de Strasbourg","ror":"https://ror.org/00pg6eq24","country_code":"FR","type":"education","lineage":["https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Lallement","raw_affiliation_strings":["*ICube, CNRS & Université de Strasbourg,Strasbourg,France"],"affiliations":[{"raw_affiliation_string":"*ICube, CNRS & Université de Strasbourg,Strasbourg,France","institution_ids":["https://openalex.org/I68947357","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103148737","display_name":"Sara Pellegrini","orcid":"https://orcid.org/0000-0002-1803-7528"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"S. Pellegrini","raw_affiliation_strings":["STMicroelectronics,Edinburgh,Scotland","STMicroelectronics, Edinburgh, Scotland"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Edinburgh,Scotland","institution_ids":["https://openalex.org/I4210124177"]},{"raw_affiliation_string":"STMicroelectronics, Edinburgh, Scotland","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112700355","display_name":"M. Agnew","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"M. Agnew","raw_affiliation_strings":["STMicroelectronics,Edinburgh,Scotland","STMicroelectronics, Edinburgh, Scotland"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Edinburgh,Scotland","institution_ids":["https://openalex.org/I4210124177"]},{"raw_affiliation_string":"STMicroelectronics, Edinburgh, Scotland","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106454841","display_name":"B. Rae","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"B. Rae","raw_affiliation_strings":["STMicroelectronics,Edinburgh,Scotland","STMicroelectronics, Edinburgh, Scotland"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Edinburgh,Scotland","institution_ids":["https://openalex.org/I4210124177"]},{"raw_affiliation_string":"STMicroelectronics, Edinburgh, Scotland","institution_ids":["https://openalex.org/I4210124177"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":15,"corresponding_author_ids":["https://openalex.org/A5103186369"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.7529,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.82446118,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"3","issue":null,"first_page":"281","last_page":"284"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-photon-avalanche-diode","display_name":"Single-photon avalanche diode","score":0.8430694341659546},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6219342947006226},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.6154808402061462},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5576909780502319},{"id":"https://openalex.org/keywords/impact-ionization","display_name":"Impact ionization","score":0.5498480796813965},{"id":"https://openalex.org/keywords/photon","display_name":"Photon","score":0.538715660572052},{"id":"https://openalex.org/keywords/ionization","display_name":"Ionization","score":0.514879584312439},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5029117465019226},{"id":"https://openalex.org/keywords/zener-diode","display_name":"Zener diode","score":0.42872172594070435},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.41824251413345337},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39179015159606934},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3297600746154785},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.32784250378608704},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3252007067203522},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.26295292377471924},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.24067211151123047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19162487983703613},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.17167195677757263},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11264553666114807},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.10896062850952148}],"concepts":[{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.8430694341659546},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6219342947006226},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.6154808402061462},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5576909780502319},{"id":"https://openalex.org/C32921249","wikidata":"https://www.wikidata.org/wiki/Q2001256","display_name":"Impact ionization","level":4,"score":0.5498480796813965},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.538715660572052},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.514879584312439},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5029117465019226},{"id":"https://openalex.org/C50566616","wikidata":"https://www.wikidata.org/wiki/Q180586","display_name":"Zener diode","level":4,"score":0.42872172594070435},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.41824251413345337},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39179015159606934},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3297600746154785},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.32784250378608704},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3252007067203522},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.26295292377471924},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24067211151123047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19162487983703613},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.17167195677757263},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11264553666114807},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.10896062850952148},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.0},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc55479.2022.9947120","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc55479.2022.9947120","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03799502v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03799502","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ESSDERC 2022, Milan, Italy, octobre 2022, Oct 2022, Milan, Italy","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1610392186","https://openalex.org/W2001485802","https://openalex.org/W2089474231","https://openalex.org/W2156663575","https://openalex.org/W2773734633","https://openalex.org/W2915026262","https://openalex.org/W3027872888","https://openalex.org/W3096284879"],"related_works":["https://openalex.org/W2324745772","https://openalex.org/W2104678293","https://openalex.org/W2089087979","https://openalex.org/W2065463815","https://openalex.org/W2077917215","https://openalex.org/W2017125248","https://openalex.org/W2153102631","https://openalex.org/W2597022993","https://openalex.org/W1998896390","https://openalex.org/W2143450609"],"abstract_inverted_index":{"This":[0],"paper":[1],"is":[2],"describing":[3],"structure":[4],"of":[5,47],"a":[6,15,27],"Single":[7],"Photon":[8],"Avalanche":[9],"Diode":[10],"(SPAD)":[11],"compact":[12],"model.":[13],"Using":[14],"loop":[16],"architecture":[17],"to":[18,29],"describe":[19],"the":[20,45],"impact":[21],"ionization":[22],"phenomenon,":[23],"this":[24],"approach":[25],"yields":[26],"closer":[28],"physics":[30],"SPAD":[31,49],"model":[32],"using":[33],"minimal":[34],"fitting":[35],"adjustments":[36],"and":[37],"an":[38],"innovative":[39],"approach,":[40],"hence":[41],"differentiating":[42],"itself":[43],"from":[44],"majority":[46],"available":[48],"models.":[50]},"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}