{"id":"https://openalex.org/W4312587813","doi":"https://doi.org/10.1109/essderc55479.2022.9947104","title":"Silicon-Impurity Defects in Calcium Fluoride: A First Principles Study","display_name":"Silicon-Impurity Defects in Calcium Fluoride: A First Principles Study","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4312587813","doi":"https://doi.org/10.1109/essderc55479.2022.9947104"},"language":"en","primary_location":{"id":"doi:10.1109/essderc55479.2022.9947104","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc55479.2022.9947104","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090077113","display_name":"Dominic Waldhoer","orcid":"https://orcid.org/0000-0002-8631-5681"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Dominic Waldhoer","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032017571","display_name":"Bibhas Manna","orcid":"https://orcid.org/0000-0003-2025-8992"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bibhas Manna","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005251190","display_name":"Al-Moatassem B. El-Sayed","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Al-Moatassem B. El-Sayed","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047987940","display_name":"Theresia Knobloch","orcid":"https://orcid.org/0000-0001-5156-9510"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Theresia Knobloch","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003579890","display_name":"Yu. Yu. Illarionov","orcid":"https://orcid.org/0000-0003-4323-1389"},"institutions":[{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]},{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT","RU"],"is_corresponding":false,"raw_author_name":"Yury Illarionov","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040","Ioffe Institute, St-Petersburg, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Ioffe Institute, St-Petersburg, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tibor Grasser","raw_affiliation_strings":["Institute for Microelectronics,TU Wien,Vienna,Austria,1040"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics,TU Wien,Vienna,Austria,1040","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5090077113"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":0.1204,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.30703147,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"15","issue":null,"first_page":"380","last_page":"383"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/impurity","display_name":"Impurity","score":0.5958364009857178},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5283337831497192},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5048244595527649},{"id":"https://openalex.org/keywords/van-der-waals-force","display_name":"van der Waals force","score":0.5039874911308289},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44988495111465454},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.36092954874038696},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3348275423049927},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3208572566509247},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22866004705429077},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.11100807785987854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09471392631530762}],"concepts":[{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.5958364009857178},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5283337831497192},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5048244595527649},{"id":"https://openalex.org/C126061179","wikidata":"https://www.wikidata.org/wiki/Q189627","display_name":"van der Waals force","level":3,"score":0.5039874911308289},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44988495111465454},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.36092954874038696},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3348275423049927},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3208572566509247},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22866004705429077},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.11100807785987854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09471392631530762},{"id":"https://openalex.org/C32909587","wikidata":"https://www.wikidata.org/wiki/Q11369","display_name":"Molecule","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/essderc55479.2022.9947104","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc55479.2022.9947104","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W64853285","https://openalex.org/W1631748941","https://openalex.org/W1965619162","https://openalex.org/W1989099817","https://openalex.org/W2015773728","https://openalex.org/W2016168218","https://openalex.org/W2025398520","https://openalex.org/W2067038503","https://openalex.org/W2086310984","https://openalex.org/W2096291806","https://openalex.org/W2110444559","https://openalex.org/W2157180100","https://openalex.org/W2561049761","https://openalex.org/W2797124026","https://openalex.org/W2804181865","https://openalex.org/W2949474005","https://openalex.org/W3027308092","https://openalex.org/W3040263581","https://openalex.org/W3084245782","https://openalex.org/W3129926333","https://openalex.org/W3208657846","https://openalex.org/W3214807145","https://openalex.org/W4241401368"],"related_works":["https://openalex.org/W2092872563","https://openalex.org/W3092585306","https://openalex.org/W2374646600","https://openalex.org/W2804544673","https://openalex.org/W2863738027","https://openalex.org/W4253731651","https://openalex.org/W1994753809","https://openalex.org/W2053508813","https://openalex.org/W4252547859","https://openalex.org/W2102244574"],"abstract_inverted_index":{"With":[0],"the":[1,11,40,95,134],"emergence":[2],"of":[3,99],"novel":[4],"nanoelectronic":[5],"devices":[6],"based":[7],"on":[8,79],"2D":[9,52],"materials,":[10],"need":[12],"for":[13,26,85],"suitable":[14],"dielectrics":[15,29],"has":[16],"become":[17],"apparent":[18],"in":[19,69,112,133,141],"recent":[20],"years.":[21],"One":[22],"particular":[23],"promising":[24],"candidate":[25],"future":[27,113],"device":[28,86],"is":[30,76],"calcium":[31],"fluoride":[32],"(CaF2)":[33],"due":[34],"to":[35,42,109],"its":[36],"inert":[37],"surface":[38],"and":[39,81,127,137],"possibility":[41],"form":[43],"a":[44,103,131],"quasi":[45],"van":[46],"der":[47],"Waals":[48],"(vdW)":[49],"interface":[50],"with":[51],"semiconductors":[53],"like":[54],"molybdenum":[55],"disulfide":[56],"(MoS":[57],"<inf":[58,71,143,147],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[59,72,144,148],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[60,73,145,149],").":[61],"In":[62],"this":[63],"work":[64],"we":[65],"explore":[66],"silicon-impurity":[67],"defects":[68,101,120],"CaF":[70],",":[74],"which":[75],"typically":[77],"grown":[78],"Si(111),":[80],"their":[82],"potential":[83],"relevance":[84],"reliability":[87],"using":[88],"density":[89],"functional":[90],"theory.":[91],"Defect":[92],"parameters":[93],"describing":[94],"charge":[96,125],"trapping":[97],"behavior":[98],"these":[100],"within":[102],"nonradiative":[104],"multiphonon":[105],"theory":[106],"are":[107],"provided":[108],"be":[110],"used":[111],"TCAD":[114],"simulations.":[115],"We":[116],"show":[117],"that":[118],"Si-impurity":[119],"can":[121],"act":[122],"as":[123],"amphoteric":[124],"traps":[126],"hence":[128],"might":[129],"play":[130],"role":[132],"observed":[135],"hysteresis":[136],"bias":[138],"temperature":[139],"instability":[140],"Si/CaF":[142],"/MOS":[146],"gate":[150],"stacks.":[151]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}