{"id":"https://openalex.org/W2987009625","doi":"https://doi.org/10.1109/essderc.2019.8901703","title":"TCAD predictions of hot-electron injection in p-type LDMOS transistors","display_name":"TCAD predictions of hot-electron injection in p-type LDMOS transistors","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2987009625","doi":"https://doi.org/10.1109/essderc.2019.8901703","mag":"2987009625"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2019.8901703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2019.8901703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051781924","display_name":"Federico Giuliano","orcid":"https://orcid.org/0000-0001-8867-383X"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"F. Giuliano","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Bologna,Italy","ARCES and DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Bologna,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062495445","display_name":"Andrea Natale Tallarico","orcid":"https://orcid.org/0000-0003-1838-3276"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. N. Tallarico","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Cesena,Italy","Technology R&D, STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Cesena,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"Technology R&D, STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031723360","display_name":"Susanna Reggiani","orcid":"https://orcid.org/0000-0002-9616-8558"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Reggiani","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Bologna,Italy","Technology R&D, STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Bologna,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"Technology R&D, STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083737379","display_name":"A. Gnudi","orcid":"https://orcid.org/0000-0002-2186-3468"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Gnudi","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Bologna,Italy","ARCES and DEI, University of Bologna, Cesena, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Bologna,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Cesena, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041741378","display_name":"E. Sangiorgi","orcid":"https://orcid.org/0000-0001-7137-5852"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Sangiorgi","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Cesena,Italy","ARCES and DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Cesena,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040318538","display_name":"C. Fiegna","orcid":"https://orcid.org/0000-0001-7184-6570"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Fiegna","raw_affiliation_strings":["University of Bologna,ARCES and DEI,Cesena,Italy","ARCES and DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"University of Bologna,ARCES and DEI,Cesena,Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040987353","display_name":"Mattia Rossetti","orcid":"https://orcid.org/0000-0001-9280-5970"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["CZ","IT"],"is_corresponding":false,"raw_author_name":"M. Rossetti","raw_affiliation_strings":["STMicroelectronics,Technology R&D,Agrate Brianza,Italy","ARCES and DEI, University of Bologna, Cesena, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Technology R&D,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Cesena, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057094193","display_name":"Antonio Molfese","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["CZ","IT"],"is_corresponding":false,"raw_author_name":"A. Molfese","raw_affiliation_strings":["STMicroelectronics,Technology R&D,Agrate Brianza,Italy","ARCES and DEI, University of Bologna, Cesena, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Technology R&D,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ARCES and DEI, University of Bologna, Cesena, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042601047","display_name":"Stefano Manzini","orcid":"https://orcid.org/0000-0002-1232-2635"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CZ","IT"],"is_corresponding":false,"raw_author_name":"S. Manzini","raw_affiliation_strings":["STMicroelectronics,Technology R&D,Agrate Brianza,Italy","Technology R&D, STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Technology R&D,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Technology R&D, STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024452322","display_name":"Riccardo Depetro","orcid":"https://orcid.org/0000-0002-9419-9203"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CZ","IT"],"is_corresponding":false,"raw_author_name":"R. Depetro","raw_affiliation_strings":["STMicroelectronics,Technology R&D,Agrate Brianza,Italy","Technology R&D, STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Technology R&D,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Technology R&D, STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036610224","display_name":"Giuseppe Croce","orcid":"https://orcid.org/0000-0003-0115-7096"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CZ","IT"],"is_corresponding":false,"raw_author_name":"G. Croce","raw_affiliation_strings":["STMicroelectronics,Technology R&D,Agrate Brianza,Italy","Technology R&D, STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Technology R&D,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210124177","https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Technology R&D, STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5051781924"],"corresponding_institution_ids":["https://openalex.org/I9360294"],"apc_list":null,"apc_paid":null,"fwci":0.2413,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.56768828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"86","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ldmos","display_name":"LDMOS","score":0.9501299858093262},{"id":"https://openalex.org/keywords/impact-ionization","display_name":"Impact ionization","score":0.7383246421813965},{"id":"https://openalex.org/keywords/hot-carrier-injection","display_name":"Hot-carrier injection","score":0.6005995273590088},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5057640075683594},{"id":"https://openalex.org/keywords/common-emitter","display_name":"Common emitter","score":0.4987015724182129},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49043962359428406},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.473969429731369},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4601143002510071},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42430949211120605},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4212470054626465},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.41761982440948486},{"id":"https://openalex.org/keywords/ionization","display_name":"Ionization","score":0.41367119550704956},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3568851947784424},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3287566900253296},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3007923364639282},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2436457872390747},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20657703280448914},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1169174313545227},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.061938464641571045}],"concepts":[{"id":"https://openalex.org/C31672976","wikidata":"https://www.wikidata.org/wiki/Q4042432","display_name":"LDMOS","level":4,"score":0.9501299858093262},{"id":"https://openalex.org/C32921249","wikidata":"https://www.wikidata.org/wiki/Q2001256","display_name":"Impact ionization","level":4,"score":0.7383246421813965},{"id":"https://openalex.org/C73500089","wikidata":"https://www.wikidata.org/wiki/Q2445876","display_name":"Hot-carrier injection","level":4,"score":0.6005995273590088},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5057640075683594},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.4987015724182129},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49043962359428406},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.473969429731369},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4601143002510071},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42430949211120605},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4212470054626465},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.41761982440948486},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.41367119550704956},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3568851947784424},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3287566900253296},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3007923364639282},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2436457872390747},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20657703280448914},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1169174313545227},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.061938464641571045},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2019.8901703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2019.8901703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:cris.unibo.it:11585/729173","is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/729173","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1581157347","https://openalex.org/W1995174031","https://openalex.org/W1997340478","https://openalex.org/W2041424982","https://openalex.org/W2064404588","https://openalex.org/W2100869539","https://openalex.org/W2154636434","https://openalex.org/W2172288086","https://openalex.org/W2186045379","https://openalex.org/W2734875335","https://openalex.org/W2782868302","https://openalex.org/W2782979829","https://openalex.org/W2895777759","https://openalex.org/W6686881472"],"related_works":["https://openalex.org/W2127328470","https://openalex.org/W1524243303","https://openalex.org/W4396688908","https://openalex.org/W2109036596","https://openalex.org/W4293066286","https://openalex.org/W2242538537","https://openalex.org/W2914174015","https://openalex.org/W2079419546","https://openalex.org/W2202664746","https://openalex.org/W2987009625"],"abstract_inverted_index":{"The":[0,110],"hole":[1,86],"impact-ionization":[2,84],"coefficient":[3],"and":[4,60,63,89],"the":[5,12,24,28,32,44,79,83,91,96,107,116],"hot-electron":[6,92],"injection":[7],"model":[8],"presently":[9],"available":[10],"in":[11,40,72],"Synopsys":[13],"TCAD":[14,112],"tool":[15],"have":[16,46,75,99],"been":[17,47,100],"calibrated,":[18],"as":[19,54],"a":[20],"necessary":[21],"step":[22],"towards":[23],"possibility":[25],"to":[26,74,78],"predict":[27],"long-term":[29],"reliability":[30],"of":[31,82,90,123],"new":[33],"generation":[34],"p-channel":[35,55,103],"power":[36,104],"LDMOS":[37,105],"devices":[38],"integrated":[39],"BCD":[41],"technology.":[42],"First,":[43],"models":[45,98],"calibrated":[48,97],"on":[49,102],"ad-hoc":[50],"test":[51],"structures":[52],"such":[53],"MOSFETs":[56,65],"with":[57,66],"separated":[58],"source":[59],"body":[61],"contacts":[62],"n-channel":[64],"an":[67,120],"additional":[68],"sub-surface":[69],"emitter":[70],"region":[71],"order":[73],"direct":[76],"access":[77],"experimental":[80],"characterization":[81],"under":[85],"avalanche":[87],"regime":[88],"injection,":[93],"respectively.":[94],"Then,":[95],"validated":[101],"featuring":[106],"STI":[108],"architecture.":[109],"proposed":[111],"approach":[113],"accurately":[114],"captures":[115],"relevant":[117],"effects":[118],"over":[119],"extended":[121],"range":[122],"electric":[124],"fields.":[125]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2020,"cited_by_count":2}],"updated_date":"2026-03-25T23:56:10.502304","created_date":"2025-10-10T00:00:00"}