{"id":"https://openalex.org/W2897948014","doi":"https://doi.org/10.1109/essderc.2018.8486847","title":"Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs","display_name":"Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2897948014","doi":"https://doi.org/10.1109/essderc.2018.8486847","mag":"2897948014"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2018.8486847","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2018.8486847","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 48th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Krishna Pradeep","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Krishna Pradeep","raw_affiliation_strings":["STMicroelectronics, Crolles Cedex, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]},{"raw_affiliation_string":"IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032246648","display_name":"T.A. Karatsori","orcid":"https://orcid.org/0000-0001-7518-3452"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. A. Karatsori","raw_affiliation_strings":["IMEP-LAHC, MINATEC Campus, Grenoble, Cedex 1, France","IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)"],"affiliations":[{"raw_affiliation_string":"IMEP-LAHC, MINATEC Campus, Grenoble, Cedex 1, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]},{"raw_affiliation_string":"IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071808895","display_name":"T. Poiroux","orcid":"https://orcid.org/0000-0002-9641-9652"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Poiroux","raw_affiliation_strings":["CEA-LETI, MINATEC Campus, France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)"],"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC Campus, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108450160","display_name":"A. Juge","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Juge","raw_affiliation_strings":["STMicroelectronics, Crolles Cedex, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074024839","display_name":"P. Scheer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Scheer","raw_affiliation_strings":["STMicroelectronics, Crolles Cedex, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081802519","display_name":"G. Gouget","orcid":"https://orcid.org/0000-0001-5435-0768"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Gouget","raw_affiliation_strings":["STMicroelectronics, Crolles Cedex, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091355788","display_name":"E. Josse","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"E. Josse","raw_affiliation_strings":["STMicroelectronics, Crolles Cedex, France","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075383895","display_name":"G. Ghibando","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Ghibando","raw_affiliation_strings":["IMEP-LAHC, MINATEC Campus, Grenoble, Cedex 1, France","IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)"],"affiliations":[{"raw_affiliation_string":"IMEP-LAHC, MINATEC Campus, Grenoble, Cedex 1, France","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]},{"raw_affiliation_string":"IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210104693","https://openalex.org/I4210139715"],"apc_list":null,"apc_paid":null,"fwci":0.2617,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.58490541,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"242","last_page":"245"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.8258540630340576},{"id":"https://openalex.org/keywords/wkb-approximation","display_name":"WKB approximation","score":0.6888018846511841},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6606401205062866},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5512489080429077},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.46841564774513245},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4574242830276489},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.441141813993454},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4370638430118561},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.428242027759552},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.41842350363731384},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.340426504611969},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3311220705509186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26559150218963623},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20418256521224976},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.19924378395080566},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19538772106170654},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.13306671380996704}],"concepts":[{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.8258540630340576},{"id":"https://openalex.org/C88030215","wikidata":"https://www.wikidata.org/wiki/Q907306","display_name":"WKB approximation","level":2,"score":0.6888018846511841},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6606401205062866},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5512489080429077},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.46841564774513245},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4574242830276489},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.441141813993454},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4370638430118561},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.428242027759552},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.41842350363731384},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.340426504611969},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3311220705509186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26559150218963623},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20418256521224976},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.19924378395080566},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19538772106170654},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.13306671380996704},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2018.8486847","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2018.8486847","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 48th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-02065295v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02065295","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2018 ESSDERC - 48th European Solid-State Device Research Conference (ESSDERC), Sep 2018, Dresden, Germany. pp.242-245, ⟨10.1109/ESSDERC.2018.8486847⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1961940038","https://openalex.org/W1998665022","https://openalex.org/W2021433466","https://openalex.org/W2055736060","https://openalex.org/W2081421305","https://openalex.org/W2097207701","https://openalex.org/W2109216548","https://openalex.org/W2129554481","https://openalex.org/W2140823559","https://openalex.org/W2159693031","https://openalex.org/W2605655851","https://openalex.org/W2727714210","https://openalex.org/W2735201660","https://openalex.org/W2796414489","https://openalex.org/W6640937299"],"related_works":["https://openalex.org/W2326188151","https://openalex.org/W2031432268","https://openalex.org/W2386361943","https://openalex.org/W2149895879","https://openalex.org/W4250300609","https://openalex.org/W2010357007","https://openalex.org/W2765340795","https://openalex.org/W2545707786","https://openalex.org/W2473578222","https://openalex.org/W2264082943"],"abstract_inverted_index":{"This":[0],"work":[1],"explores,":[2],"for":[3],"the":[4,11,30],"first":[5],"time,":[6],"wafer":[7],"level":[8],"variability":[9,37],"of":[10],"gate":[12,45],"leakage":[13,31],"current":[14,32,46],"in":[15],"advanced":[16],"FD-SOI":[17],"MOSFETs.":[18],"A":[19],"simple":[20],"model":[21,29],"based":[22],"on":[23],"WKB":[24],"approximation":[25],"is":[26,39],"introduced":[27],"to":[28],"and":[33,44],"its":[34],"variance.":[35],"IL/HK":[36],"segregation":[38],"presented":[40],"using":[41],"split":[42],"C-V":[43],"data":[47],"without":[48],"any":[49],"dedicated":[50],"test":[51],"structures.":[52]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}