{"id":"https://openalex.org/W2761644502","doi":"https://doi.org/10.1109/essderc.2017.8066647","title":"Physical modeling of the hysteresis in M0S2 transistors","display_name":"Physical modeling of the hysteresis in M0S2 transistors","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2761644502","doi":"https://doi.org/10.1109/essderc.2017.8066647","mag":"2761644502"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2017.8066647","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066647","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047987940","display_name":"Theresia Knobloch","orcid":"https://orcid.org/0000-0001-5156-9510"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Theresia Knobloch","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008613051","display_name":"G. Rzepa","orcid":"https://orcid.org/0000-0002-3711-1957"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Gerhard Rzepa","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003579890","display_name":"Yu. Yu. Illarionov","orcid":"https://orcid.org/0000-0003-4323-1389"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["AT","RU"],"is_corresponding":false,"raw_author_name":"Yury Yu. Illarionov","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria","Ioffe Physical-Technical Institute, St-Petersburg, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Ioffe Physical-Technical Institute, St-Petersburg, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077464890","display_name":"Michael Waltl","orcid":"https://orcid.org/0000-0001-6042-759X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Michael Waltl","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015142950","display_name":"F. Schanovsky","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Franz Schanovsky","raw_affiliation_strings":["Global TCAD Solutions, Wien, Austria","Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Global TCAD Solutions, Wien, Austria","institution_ids":[]},{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041086926","display_name":"Markus Jech","orcid":"https://orcid.org/0000-0003-3003-8168"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Markus Jech","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088631482","display_name":"Bernhard Stampfer","orcid":"https://orcid.org/0000-0001-5424-7488"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernhard Stampfer","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009096098","display_name":"Marco M. Furchi","orcid":"https://orcid.org/0000-0002-0502-7662"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Marco M. Furchi","raw_affiliation_strings":["Institute for Photonics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Photonics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110786944","display_name":"Thomas M\u00fcller","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Thomas Muller","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria","Institute for Photonics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Institute for Photonics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tibor Grasser","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5047987940"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":0.2913,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60598669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"284","last_page":"287"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hysteresis","display_name":"Hysteresis","score":0.8164966106414795},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6574181318283081},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.45493632555007935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45151662826538086},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.42556655406951904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40426260232925415},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3757118582725525},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35016047954559326},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33911532163619995},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.32647964358329773},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1992633044719696},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.1658603847026825},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16054651141166687}],"concepts":[{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.8164966106414795},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6574181318283081},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.45493632555007935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45151662826538086},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42556655406951904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40426260232925415},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3757118582725525},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35016047954559326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33911532163619995},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32647964358329773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1992633044719696},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.1658603847026825},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16054651141166687}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/essderc.2017.8066647","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066647","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321181","display_name":"Austrian Science Fund","ror":"https://ror.org/013tf3c58"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1515352072","https://openalex.org/W1609773151","https://openalex.org/W1968585013","https://openalex.org/W1970263000","https://openalex.org/W1976148968","https://openalex.org/W1978905540","https://openalex.org/W1985295683","https://openalex.org/W2021994802","https://openalex.org/W2026386847","https://openalex.org/W2030752519","https://openalex.org/W2036787352","https://openalex.org/W2052306257","https://openalex.org/W2055309078","https://openalex.org/W2066083252","https://openalex.org/W2071998162","https://openalex.org/W2079689884","https://openalex.org/W2086880071","https://openalex.org/W2093681061","https://openalex.org/W2109471502","https://openalex.org/W2112990349","https://openalex.org/W2119388984","https://openalex.org/W2134777311","https://openalex.org/W2137485331","https://openalex.org/W2150265823","https://openalex.org/W2151860561","https://openalex.org/W2157180100","https://openalex.org/W2176009997","https://openalex.org/W2223338285","https://openalex.org/W2278636676","https://openalex.org/W2293006339","https://openalex.org/W2327148831","https://openalex.org/W2328412715","https://openalex.org/W2335685603","https://openalex.org/W2465510599","https://openalex.org/W2468016554","https://openalex.org/W2474271862","https://openalex.org/W2524462216","https://openalex.org/W2528558896","https://openalex.org/W2544475833","https://openalex.org/W2560834721","https://openalex.org/W2583692340","https://openalex.org/W2620589294","https://openalex.org/W3098334655","https://openalex.org/W3103794823"],"related_works":["https://openalex.org/W2053668343","https://openalex.org/W2076353393","https://openalex.org/W2899703592","https://openalex.org/W2362940819","https://openalex.org/W2086745820","https://openalex.org/W1908385343","https://openalex.org/W1620532008","https://openalex.org/W3128948325","https://openalex.org/W3123452979","https://openalex.org/W3048822953"],"abstract_inverted_index":{"The":[0],"hysteresis":[1,40],"in":[2,41,71,133],"the":[3,16,28,72,78,82,116,120,125],"gate":[4,108],"transfer":[5],"characteristics":[6],"of":[7,10,15,20,130],"transistors":[8],"made":[9],"two-dimensional":[11,45],"materials":[12],"is":[13,49],"one":[14],"most":[17],"obvious":[18],"problems":[19],"this":[21,39,131],"novel":[22],"technology.":[23],"Here":[24],"we":[25],"attempt":[26],"for":[27,37,64,81,119],"first":[29],"time":[30],"to":[31,57],"develop":[32],"a":[33,52,58,93,107],"physical":[34,117],"modeling":[35],"approach":[36],"describing":[38,65],"devices":[42],"based":[43,50],"on":[44,51,92],"materials.":[46],"Our":[47,110],"model":[48,63,88],"drift-diffusion":[53],"TCAD":[54],"simulation":[55],"coupled":[56],"previously":[59],"established":[60],"non-radiative":[61],"multiphonon":[62],"charge":[66],"capture":[67],"and":[68],"emission":[69],"events":[70],"surrounding":[73],"dielectrics,":[74],"which":[75],"are":[76],"considered":[77],"main":[79],"cause":[80],"observed":[83,121],"hysteresis.":[84],"We":[85],"validate":[86],"our":[87],"against":[89],"measurement":[90],"data":[91],"back-gated":[94],"single-layer":[95],"MoS":[96],"<sub":[97,103],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[98,104],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[99,105],"transistor":[100],"with":[101],"SiO":[102],"as":[106],"dielectric.":[109],"study":[111],"provides":[112],"new":[113],"insights":[114],"into":[115],"reasons":[118],"hysteresis,":[122],"thereby":[123],"leading":[124],"way":[126],"towards":[127],"an":[128],"alleviation":[129],"problem":[132],"future":[134],"devices.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}