{"id":"https://openalex.org/W2763880445","doi":"https://doi.org/10.1109/essderc.2017.8066640","title":"Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7","display_name":"Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2763880445","doi":"https://doi.org/10.1109/essderc.2017.8066640","mag":"2763880445"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2017.8066640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066640","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101885160","display_name":"Mohit Gupta","orcid":"https://orcid.org/0000-0002-1924-1264"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Mohit Kumar Gupta","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087726615","display_name":"Pieter Weckx","orcid":"https://orcid.org/0000-0003-4579-0571"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Pieter Weckx","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031630779","display_name":"Stefan Cosemans","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Stefan Cosemans","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017651762","display_name":"P. Schuddinck","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Pieter Schuddinck","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048621313","display_name":"Rogier Baert","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Rogier Baert","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082050068","display_name":"Dmitry Yakimets","orcid":"https://orcid.org/0000-0002-0772-7398"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Dmitry Yakimets","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101779807","display_name":"Doyoung Jang","orcid":"https://orcid.org/0000-0001-6128-7218"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Doyoung Jang","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088829611","display_name":"Yasser Sherazi","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Yasser Sherazi","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113820250","display_name":"Praveen Raghavan","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Praveen Raghavan","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019510660","display_name":"A. Spessot","orcid":"https://orcid.org/0000-0003-2381-0121"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Alessio Spessot","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111996467","display_name":"A. Mocuta","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anda Mocuta","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076274517","display_name":"Wim Dehaene","orcid":"https://orcid.org/0000-0002-6792-7965"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dehaene","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3792,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.50007173,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"256","last_page":"259"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9658775925636292},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.7092075943946838},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.561138927936554},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5598388314247131},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5278651118278503},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.519626796245575},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5071394443511963},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4999527931213379},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3981902301311493},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3802531361579895},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36726897954940796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3244349956512451},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.18326950073242188},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17985767126083374},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06857320666313171}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9658775925636292},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.7092075943946838},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.561138927936554},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5598388314247131},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5278651118278503},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.519626796245575},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5071394443511963},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4999527931213379},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3981902301311493},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3802531361579895},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36726897954940796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3244349956512451},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.18326950073242188},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17985767126083374},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06857320666313171},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2017.8066640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066640","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/585450","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/585450/1/ESSDERC_draft_9_v4.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium, 11-14 September 2017","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1910738982"],"related_works":["https://openalex.org/W2089002058","https://openalex.org/W1909296377","https://openalex.org/W3185029353","https://openalex.org/W2969498307","https://openalex.org/W3116379964","https://openalex.org/W2915176329","https://openalex.org/W2793465010","https://openalex.org/W2967161359","https://openalex.org/W2208608937","https://openalex.org/W2766443086"],"abstract_inverted_index":{"SRAM":[0,28,38,50],"paves":[1],"the":[2,43,59,86,95,99],"way":[3],"for":[4,53],"new":[5],"technology":[6,21],"nodes":[7,56,78],"as":[8],"it":[9],"is":[10,91],"more":[11],"prone":[12],"to":[13,16,84,93,102],"failure":[14],"due":[15],"intrinsic":[17],"devices":[18],"variability":[19,75],"and":[20,30,36,67,98,105],"process.":[22],"To":[23],"further":[24],"boost":[25],"high":[26],"density":[27],"yield":[29,96],"performance":[31],"we":[32],"need":[33,81],"assist":[34,68,82,107],"techniques":[35,83],"increased":[37],"bit":[39],"cell":[40],"size":[41],"at":[42],"expense":[44],"of":[45],"area.":[46],"This":[47],"paper":[48],"discusses":[49],"design":[51],"strategies":[52],"future":[54],"technologies":[55],"like":[57],"beyond":[58],"N7":[60],"node,":[61],"by":[62],"comparing":[63],"higher":[64,71],"height":[65,72],"cells":[66,73],"techniques.":[69],"Although,":[70],"improve":[74],"with":[76,104],"scaled":[77],"but":[79],"also":[80],"lower":[85],"operating":[87],"voltage.":[88],"Consequently,":[89],"122":[90],"shown":[92],"meet":[94],"requirement":[97],"preferred":[100],"option":[101],"use":[103],"without":[106],"circuitry.":[108]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}