{"id":"https://openalex.org/W2764034619","doi":"https://doi.org/10.1109/essderc.2017.8066599","title":"Analytical drain current model for non-ballistic Schottky-Barrier CNTFETs","display_name":"Analytical drain current model for non-ballistic Schottky-Barrier CNTFETs","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2764034619","doi":"https://doi.org/10.1109/essderc.2017.8066599","mag":"2764034619"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2017.8066599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ibn.idsi.md/vizualizare_articol/150793","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031185374","display_name":"Igor Bejenari","orcid":"https://orcid.org/0000-0003-1748-8156"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Igor Bejenari","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035970449","display_name":"M. Schr\u00f6ter","orcid":"https://orcid.org/0000-0002-5432-716X"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Schroter","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084366087","display_name":"Martin Claus","orcid":"https://orcid.org/0000-0001-8009-8463"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Claus","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits, Department of Electrical and Computer Engineering, Technische Universitat Dresden, 01062 Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5031185374"],"corresponding_institution_ids":["https://openalex.org/I78650965"],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.51771589,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"90","last_page":"93"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wkb-approximation","display_name":"WKB approximation","score":0.7225314378738403},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.6560049653053284},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5200017094612122},{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.45333489775657654},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.45243600010871887},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3510448932647705},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3349747359752655},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3312203288078308},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.329855352640152},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.25662434101104736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14551997184753418}],"concepts":[{"id":"https://openalex.org/C88030215","wikidata":"https://www.wikidata.org/wiki/Q907306","display_name":"WKB approximation","level":2,"score":0.7225314378738403},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.6560049653053284},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5200017094612122},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.45333489775657654},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.45243600010871887},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3510448932647705},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3349747359752655},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3312203288078308},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.329855352640152},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.25662434101104736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14551997184753418},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2017.8066599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2017.8066599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 47th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:ibn.idsi.md:150793","is_oa":true,"landing_page_url":"https://ibn.idsi.md/vizualizare_articol/150793","pdf_url":null,"source":null,"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"European Solid-State Device Research Conference (Edi\u021bia a 47-a)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:ibn.idsi.md:150793","is_oa":true,"landing_page_url":"https://ibn.idsi.md/vizualizare_articol/150793","pdf_url":null,"source":null,"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"European Solid-State Device Research Conference (Edi\u021bia a 47-a)","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1526219215","https://openalex.org/W1996079531","https://openalex.org/W2010202518","https://openalex.org/W2032556191","https://openalex.org/W2039040364","https://openalex.org/W2046078960","https://openalex.org/W2064535872","https://openalex.org/W2070750670","https://openalex.org/W2091767459","https://openalex.org/W2098874598","https://openalex.org/W2101526586","https://openalex.org/W2112333830","https://openalex.org/W2147516461","https://openalex.org/W2148293531","https://openalex.org/W2155228252","https://openalex.org/W2169745187","https://openalex.org/W2171742305","https://openalex.org/W2282908358","https://openalex.org/W2318902229","https://openalex.org/W2330171783","https://openalex.org/W2495572617","https://openalex.org/W2574149780","https://openalex.org/W2598114241","https://openalex.org/W2912203129","https://openalex.org/W3105874523","https://openalex.org/W6758491854"],"related_works":["https://openalex.org/W2147656057","https://openalex.org/W1540585561","https://openalex.org/W1981646027","https://openalex.org/W2917180890","https://openalex.org/W2614156624","https://openalex.org/W2911343812","https://openalex.org/W2124971553","https://openalex.org/W2064836534","https://openalex.org/W2610840581","https://openalex.org/W2289026509"],"abstract_inverted_index":{"A":[0],"new":[1],"analytical":[2,48],"static":[3],"drain":[4,52],"current":[5,53],"model":[6,85],"based":[7],"on":[8],"the":[9,26,40,51,55,65],"WKB":[10],"approximation":[11,37],"has":[12,28,58],"been":[13,29,59],"developed":[14],"for":[15,50,81],"Schottky-Barrier":[16],"CNTFETs.":[17],"Electron":[18],"scattering":[19],"by":[20],"acoustic":[21],"and":[22,44,70],"optical":[23],"phonons":[24],"in":[25,54],"channel":[27],"taken":[30],"into":[31],"account.":[32],"By":[33],"using":[34],"a":[35],"simple":[36],"of":[38,67],"both":[39],"Fermi-Dirac":[41],"distribution":[42],"function":[43],"transmission":[45],"probability,":[46],"an":[47],"expression":[49],"Landauer-Buttiker":[56],"formalism":[57],"obtained.":[60],"This":[61],"allows":[62],"to":[63,71],"overcome":[64],"limitations":[66],"existing":[68],"models":[69],"extend":[72],"their":[73],"applicability":[74],"toward":[75],"high":[76],"bias":[77],"voltages":[78],"as":[79],"needed":[80],"analog":[82],"applications.":[83],"The":[84],"results":[86],"agree":[87],"well":[88],"with":[89],"experimental":[90],"data.":[91]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}