{"id":"https://openalex.org/W2535056897","doi":"https://doi.org/10.1109/essderc.2016.7599636","title":"Random Telegraph Signal phenomena in avalanche mode diodes: Application to SPADs","display_name":"Random Telegraph Signal phenomena in avalanche mode diodes: Application to SPADs","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2535056897","doi":"https://doi.org/10.1109/essderc.2016.7599636","mag":"2535056897"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2016.7599636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2016.7599636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 46th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ris.utwente.nl/ws/files/5333726/ESSDERC_V._Agarwal.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065588210","display_name":"Vishal Agarwal","orcid":"https://orcid.org/0000-0002-8257-4168"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"V. Agarwal","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001455308","display_name":"Anne-Johan Annema","orcid":"https://orcid.org/0000-0001-8164-3064"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A.J. Annema","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020542060","display_name":"Satadal Dutta","orcid":"https://orcid.org/0000-0002-5817-5503"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S. Dutta","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051804648","display_name":"R.J.E. Hueting","orcid":"https://orcid.org/0000-0002-0773-8978"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R.J.E. Hueting","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023605915","display_name":"Lis K. Nanver","orcid":"https://orcid.org/0000-0003-3667-4077"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"L.K. Nanver","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035402438","display_name":"Bram Nauta","orcid":"https://orcid.org/0000-0001-6790-5873"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"B. Nauta","raw_affiliation_strings":["University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4017,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.93845435,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"264","last_page":"267"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-photon-avalanche-diode","display_name":"Single-photon avalanche diode","score":0.8275052309036255},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.7851537466049194},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.7697189450263977},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5735713243484497},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.5665387511253357},{"id":"https://openalex.org/keywords/avalanche-breakdown","display_name":"Avalanche breakdown","score":0.555304765701294},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5528898239135742},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4838024973869324},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4639992117881775},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46149811148643494},{"id":"https://openalex.org/keywords/zener-diode","display_name":"Zener diode","score":0.44022461771965027},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43556106090545654},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3533717691898346},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3247325122356415},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.29900026321411133},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.29835501313209534},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.25416678190231323},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.24930304288864136},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2356107234954834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.131710946559906}],"concepts":[{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.8275052309036255},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7851537466049194},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.7697189450263977},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5735713243484497},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.5665387511253357},{"id":"https://openalex.org/C33652038","wikidata":"https://www.wikidata.org/wiki/Q175906","display_name":"Avalanche breakdown","level":4,"score":0.555304765701294},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5528898239135742},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4838024973869324},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4639992117881775},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46149811148643494},{"id":"https://openalex.org/C50566616","wikidata":"https://www.wikidata.org/wiki/Q180586","display_name":"Zener diode","level":4,"score":0.44022461771965027},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43556106090545654},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3533717691898346},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3247325122356415},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.29900026321411133},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.29835501313209534},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.25416678190231323},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.24930304288864136},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2356107234954834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.131710946559906},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2016.7599636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2016.7599636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 46th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire/e9cb602a-1088-4e61-a0b5-f16ff40d23b7","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e9cb602a-1088-4e61-a0b5-f16ff40d23b7","pdf_url":"https://ris.utwente.nl/ws/files/5333726/ESSDERC_V._Agarwal.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Agarwal, V V, Annema, A J, Dutta, S, Hueting, R J E, Nanver, L K & Nauta, B 2016, Random telegraph signal phenomena in avalanche mode diodes : application to SPADs. in 2016 46th European Solid-State Device Research Conference (ESSDERC). IEEE, USA, pp. 264-267, 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, 12/09/16. https://doi.org/10.1109/ESSDERC.2016.7599636","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:openaire/e9cb602a-1088-4e61-a0b5-f16ff40d23b7","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e9cb602a-1088-4e61-a0b5-f16ff40d23b7","pdf_url":"https://ris.utwente.nl/ws/files/5333726/ESSDERC_V._Agarwal.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Agarwal, V V, Annema, A J, Dutta, S, Hueting, R J E, Nanver, L K & Nauta, B 2016, Random telegraph signal phenomena in avalanche mode diodes : application to SPADs. in 2016 46th European Solid-State Device Research Conference (ESSDERC). IEEE, USA, pp. 264-267, 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, 12/09/16. https://doi.org/10.1109/ESSDERC.2016.7599636","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7699999809265137}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321800","display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek","ror":"https://ror.org/04jsz6e67"},{"id":"https://openalex.org/F4320334893","display_name":"Stichting voor de Technische Wetenschappen","ror":"https://ror.org/057tq3593"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2535056897.pdf","grobid_xml":"https://content.openalex.org/works/W2535056897.grobid-xml"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W8519299","https://openalex.org/W1836615271","https://openalex.org/W1967455223","https://openalex.org/W1975496472","https://openalex.org/W1990749464","https://openalex.org/W1996214499","https://openalex.org/W2004214247","https://openalex.org/W2038054094","https://openalex.org/W2057486448","https://openalex.org/W2067672016","https://openalex.org/W2092387582","https://openalex.org/W2108664844","https://openalex.org/W2119053952","https://openalex.org/W2132255252","https://openalex.org/W2135260691","https://openalex.org/W2135902446","https://openalex.org/W2146274038","https://openalex.org/W3147289055","https://openalex.org/W6643802526"],"related_works":["https://openalex.org/W2189181247","https://openalex.org/W2324745772","https://openalex.org/W2063064243","https://openalex.org/W2087071651","https://openalex.org/W2029938807","https://openalex.org/W2041021839","https://openalex.org/W1977159673","https://openalex.org/W2067974824","https://openalex.org/W2020076751","https://openalex.org/W2142150594"],"abstract_inverted_index":{"The":[0,51],"current-voltage":[1],"(IV":[2],")":[3],"dependency":[4],"of":[5,63],"diodes":[6,80,85,114],"close":[7],"to":[8,14,29,56,92],"the":[9,32,45,61,64],"breakdown":[10],"voltage":[11],"is":[12,70,90],"shown":[13,91],"be":[15],"governed":[16],"by":[17],"Random":[18],"Telegraph":[19],"Signal":[20],"(RTS)":[21],"phenomena.":[22],"We":[23],"present":[24],"a":[25,116],"technology":[26],"independent":[27],"approach":[28],"accurately":[30,58],"characterize":[31],"bias":[33],"dependent":[34],"statistical":[35,52],"RTS":[36],"properties":[37,53],"and":[38,101,105],"show":[39],"that":[40,69],"these":[41],"can":[42],"fully":[43],"describe":[44,59],"steep":[46],"IV":[47],"-dependency":[48],"in":[49,72,103,115],"avalanche.":[50],"also":[54],"allow":[55,93],"more":[57],"e.g.":[60,96],"value":[62],"self":[65],"sustaining":[66],"avalanche":[67,78,84],"current":[68],"crucial":[71],"designing":[73],"optical":[74],"detection":[75],"systems":[76],"using":[77],"photo":[79],"or":[81],"single":[82],"photon":[83],"(SPADs).":[86],"More":[87],"accurate":[88],"modelling":[89],"improving":[94],"on":[95,113],"count":[97],"rates,":[98],"dead":[99],"time":[100],"afterpulsing":[102],"quenching":[104],"recharge":[106],"circuits":[107],"for":[108],"SPADs.":[109],"Measurements":[110],"are":[111],"performed":[112],"140":[117],"nm":[118],"SOI":[119],"CMOS":[120],"technology.":[121]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}