{"id":"https://openalex.org/W2485363348","doi":"https://doi.org/10.1109/essderc.2016.7599608","title":"Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC","display_name":"Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2485363348","doi":"https://doi.org/10.1109/essderc.2016.7599608","mag":"2485363348"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2016.7599608","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2016.7599608","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 46th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/218892","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058276055","display_name":"A. Pezzotta","orcid":"https://orcid.org/0000-0001-9494-9396"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]},{"id":"https://openalex.org/I66752286","display_name":"University of Milano-Bicocca","ror":"https://ror.org/01ynf4891","country_code":"IT","type":"education","lineage":["https://openalex.org/I66752286"]}],"countries":["CH","IT"],"is_corresponding":true,"raw_author_name":"A. Pezzotta","raw_affiliation_strings":["Microelectronic Group, INFN & University of Milano-Bicocca, Italy","STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"Microelectronic Group, INFN & University of Milano-Bicocca, Italy","institution_ids":["https://openalex.org/I66752286"]},{"raw_affiliation_string":"STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038994597","display_name":"Chaopu Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"C.-M. Zhang","raw_affiliation_strings":["STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012272878","display_name":"Farzan Jazaeri","orcid":"https://orcid.org/0000-0001-9649-3572"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"F. Jazaeri","raw_affiliation_strings":["STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056190203","display_name":"Claudio Bruschini","orcid":"https://orcid.org/0000-0002-6636-6596"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"C. Bruschini","raw_affiliation_strings":["STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054580391","display_name":"G. Borghello","orcid":"https://orcid.org/0000-0002-6832-2458"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]},{"id":"https://openalex.org/I129043915","display_name":"University of Udine","ror":"https://ror.org/05ht0mh31","country_code":"IT","type":"education","lineage":["https://openalex.org/I129043915"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"G. Borghello","raw_affiliation_strings":["P-ESE Group, CERN, Switzerland","University of Udine, Italy"],"affiliations":[{"raw_affiliation_string":"P-ESE Group, CERN, Switzerland","institution_ids":["https://openalex.org/I67311998"]},{"raw_affiliation_string":"University of Udine, Italy","institution_ids":["https://openalex.org/I129043915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054759644","display_name":"F. Faccio","orcid":"https://orcid.org/0000-0001-6069-601X"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"F. Faccio","raw_affiliation_strings":["P-ESE Group, CERN, Switzerland"],"affiliations":[{"raw_affiliation_string":"P-ESE Group, CERN, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037493450","display_name":"S. Mattiazzo","orcid":"https://orcid.org/0000-0001-8255-3474"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Mattiazzo","raw_affiliation_strings":["Information Engineering Department, University of Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Information Engineering Department, University of Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038780136","display_name":"A. Bas\u00e7hirotto","orcid":"https://orcid.org/0000-0002-8844-5754"},"institutions":[{"id":"https://openalex.org/I66752286","display_name":"University of Milano-Bicocca","ror":"https://ror.org/01ynf4891","country_code":"IT","type":"education","lineage":["https://openalex.org/I66752286"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Baschirotto","raw_affiliation_strings":["Microelectronic Group, INFN & University of Milano-Bicocca, Italy"],"affiliations":[{"raw_affiliation_string":"Microelectronic Group, INFN & University of Milano-Bicocca, Italy","institution_ids":["https://openalex.org/I66752286"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069058393","display_name":"Christian Enz","orcid":"https://orcid.org/0000-0002-9968-5278"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"C. Enz","raw_affiliation_strings":["STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"STI IMT ICLAB, \u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5058276055"],"corresponding_institution_ids":["https://openalex.org/I5124864","https://openalex.org/I66752286"],"apc_list":null,"apc_paid":null,"fwci":1.6733,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.85591116,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"146","last_page":"149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/absorbed-dose","display_name":"Absorbed dose","score":0.7790957689285278},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.7150051593780518},{"id":"https://openalex.org/keywords/large-hadron-collider","display_name":"Large Hadron Collider","score":0.6593616604804993},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6236213445663452},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5926384925842285},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5781839489936829},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5663155317306519},{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.5498214364051819},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5463185906410217},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5059327483177185},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5032288432121277},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4738790690898895},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4419201910495758},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4195517897605896},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37265992164611816},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.35887908935546875},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33296817541122437},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.2544492483139038},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1781299114227295}],"concepts":[{"id":"https://openalex.org/C151337348","wikidata":"https://www.wikidata.org/wiki/Q215313","display_name":"Absorbed dose","level":3,"score":0.7790957689285278},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.7150051593780518},{"id":"https://openalex.org/C87668248","wikidata":"https://www.wikidata.org/wiki/Q40605","display_name":"Large Hadron Collider","level":2,"score":0.6593616604804993},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6236213445663452},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5926384925842285},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5781839489936829},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5663155317306519},{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.5498214364051819},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5463185906410217},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5059327483177185},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5032288432121277},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4738790690898895},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4419201910495758},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4195517897605896},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37265992164611816},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.35887908935546875},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33296817541122437},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.2544492483139038},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1781299114227295}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.1109/essderc.2016.7599608","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2016.7599608","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 46th European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:air.uniud.it:11390/1089985","is_oa":false,"landing_page_url":"http://hdl.handle.net/11390/1089985","pdf_url":null,"source":{"id":"https://openalex.org/S4306401163","display_name":"Institutional Research Information System (University of Udine)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I129043915","host_organization_name":"University of Udine","host_organization_lineage":["https://openalex.org/I129043915"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:aisberg.unibg.it:10446/187141","is_oa":false,"landing_page_url":"http://hdl.handle.net/10446/187141","pdf_url":null,"source":{"id":"https://openalex.org/S4377196347","display_name":"Aisberg (University of Bergamo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I11039511","host_organization_name":"University of Bergamo","host_organization_lineage":["https://openalex.org/I11039511"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:boa.unimib.it:10281/290461","is_oa":false,"landing_page_url":"http://hdl.handle.net/10281/290461","pdf_url":null,"source":{"id":"https://openalex.org/S4306401259","display_name":"BOA (University of Milano-Bicocca)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66752286","host_organization_name":"University of Milano-Bicocca","host_organization_lineage":["https://openalex.org/I66752286"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:infoscience.epfl.ch:218892","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/218892","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},{"id":"pmh:oai:infoscience.epfl.ch:270047","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/270047","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference proceedings"},{"id":"pmh:oai:inspirehep.net:1592446","is_oa":false,"landing_page_url":"http://cds.cern.ch/record/2262307","pdf_url":null,"source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":{"id":"pmh:oai:infoscience.epfl.ch:218892","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/218892","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W599705812","https://openalex.org/W1974332486","https://openalex.org/W2017966364","https://openalex.org/W2125640276","https://openalex.org/W2134165724","https://openalex.org/W2175939036","https://openalex.org/W2260861174","https://openalex.org/W2328899558","https://openalex.org/W2542173156","https://openalex.org/W4235903482"],"related_works":["https://openalex.org/W2010066109","https://openalex.org/W2791897932","https://openalex.org/W2009852498","https://openalex.org/W2166758606","https://openalex.org/W2545707786","https://openalex.org/W2340131852","https://openalex.org/W1999741645","https://openalex.org/W3004587385","https://openalex.org/W1991521745","https://openalex.org/W2109147260"],"abstract_inverted_index":{"The":[0,60],"Large":[1],"Hadron":[2],"Collider":[3],"(LHC)":[4],"running":[5],"at":[6],"CERN":[7],"will":[8],"soon":[9],"be":[10],"upgraded":[11],"to":[12,18,69,77,122],"increase":[13,97],"its":[14],"luminosity":[15],"giving":[16],"rise":[17],"radiations":[19],"reaching":[20],"the":[21,32,50,56],"level":[22],"of":[23,34,52,64,88],"GigaRad":[24],"Total":[25],"Ionizing":[26],"Dose":[27],"(TID).":[28],"This":[29],"paper":[30],"investigates":[31],"impact":[33],"such":[35],"high":[36],"radiation":[37],"on":[38],"transistors":[39],"fabricated":[40],"in":[41],"a":[42,92,106],"commercial":[43],"28":[44],"nm":[45],"bulk":[46],"CMOS":[47],"process":[48],"with":[49,132],"perspective":[51],"using":[53],"it":[54],"for":[55],"future":[57],"silicon-based":[58],"detectors.":[59],"DC":[61],"electrical":[62],"behavior":[63],"nMOSFETs":[65],"is":[66,115],"studied":[67],"up":[68],"1":[70],"Grad":[71],"TID.":[72],"All":[73],"tested":[74],"devices":[75],"demonstrate":[76],"withstand":[78],"that":[79],"dose":[80],"without":[81],"any":[82],"radiation-hard":[83],"layout":[84],"techniques.":[85],"In":[86,104],"spite":[87],"that,":[89],"they":[90],"experience":[91],"significant":[93],"drain":[94],"leakage":[95],"current":[96],"which":[98],"may":[99],"affect":[100],"normal":[101],"device":[102],"operation.":[103],"addition,":[105],"moderate":[107],"threshold":[108],"voltage":[109],"shift":[110],"and":[111,127],"subthreshold":[112],"slope":[113],"degradation":[114],"observed.":[116],"These":[117],"phenomena":[118],"have":[119],"been":[120],"linked":[121],"radiation-induced":[123],"effects":[124],"like":[125],"interface":[126],"switching":[128],"oxide":[129],"traps,":[130],"together":[131],"parasitic":[133],"side-wall":[134],"transistors.":[135]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}