{"id":"https://openalex.org/W2090106332","doi":"https://doi.org/10.1109/essderc.2014.6948846","title":"CMOS V<inf>T</inf> characterization by capacitance measurements in FDSOI PIN gated diodes","display_name":"CMOS V<inf>T</inf> characterization by capacitance measurements in FDSOI PIN gated diodes","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2090106332","doi":"https://doi.org/10.1109/essderc.2014.6948846","mag":"2090106332"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2014.6948846","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2014.6948846","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 44th European Solid State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045645277","display_name":"Carlos Navarro","orcid":"https://orcid.org/0000-0002-7846-4599"},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Carlos Navarro","raw_affiliation_strings":["Instltut d'\u00c9lectroniane du Sud, Montnellier, France","TMEP-LAHC, MINATEC CAMPUS, Grenohl, France","IES - Institut d\u2019Electronique et des Syst\u00e8mes (860, rue Saint Priest, B\u00e2timent 5 - CC 05001 -34095 Montpellier Cedex 5 - France)","M@CSEE - Micro \u00e9lectronique, Composants, Syst\u00e8mes, Efficacit\u00e9 Energ\u00e9tique (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instltut d'\u00c9lectroniane du Sud, Montnellier, France","institution_ids":["https://openalex.org/I4210134800"]},{"raw_affiliation_string":"TMEP-LAHC, MINATEC CAMPUS, Grenohl, France","institution_ids":[]},{"raw_affiliation_string":"IES - Institut d\u2019Electronique et des Syst\u00e8mes (860, rue Saint Priest, B\u00e2timent 5 - CC 05001 -34095 Montpellier Cedex 5 - France)","institution_ids":["https://openalex.org/I4210134800"]},{"raw_affiliation_string":"M@CSEE - Micro \u00e9lectronique, Composants, Syst\u00e8mes, Efficacit\u00e9 Energ\u00e9tique (France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107347332","display_name":"Maryline Bawedin","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Maryline Bawedin","raw_affiliation_strings":["Instltut d'\u00c9lectroniane du Sud, Montnellier, France","IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instltut d'\u00c9lectroniane du Sud, Montnellier, France","institution_ids":["https://openalex.org/I4210134800"]},{"raw_affiliation_string":"IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104440312","display_name":"Fran\u00e7ois Andrieu","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francois Andrieu","raw_affiliation_strings":["CEA-LETI, MINATEC CAMPUS, Grenoble, France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC CAMPUS, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I899635006","https://openalex.org/I106785703","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112559399","display_name":"J. Cluzel","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jacques Cluzel","raw_affiliation_strings":["CEA-LETI, MINATEC CAMPUS, Grenoble, France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC CAMPUS, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I899635006","https://openalex.org/I106785703","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082063555","display_name":"X. Garros","orcid":"https://orcid.org/0000-0002-1061-9515"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Xavier Garros","raw_affiliation_strings":["CEA-LETI, MINATEC CAMPUS, Grenoble, France","CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC CAMPUS, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I899635006","https://openalex.org/I106785703","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA-LETI - Commissariat \u00e0 l'\u00e9nergie atomique et aux \u00e9nergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060338075","display_name":"S. Cristoloveanu","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210139715","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","ror":"https://ror.org/03taa9n66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Sorin Cristoloveanu","raw_affiliation_strings":["TMEP-LAHC, MINATEC CAMPUS, Grenohl, France","IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TMEP-LAHC, MINATEC CAMPUS, Grenohl, France","institution_ids":[]},{"raw_affiliation_string":"IMEP-LAHC - Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique - Laboratoire d'Hyperfr\u00e9quences et Caract\u00e9risation (Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis N\u00e9el - CS 50257 - 38016 Grenoble Cedex 1 / Site Chamb\u00e9ry : Universit\u00e9 de Savoie - F73376 Le Bourget du Lac Cedex - France)","institution_ids":["https://openalex.org/I4210139715","https://openalex.org/I106785703"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6388,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74723121,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"30","issue":null,"first_page":"405","last_page":"408"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.759939968585968},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7017822861671448},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.685867428779602},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6640834808349609},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6577333807945251},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6349748969078064},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5883011817932129},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5127445459365845},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.481720507144928},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4742923080921173},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.47302746772766113},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.44236382842063904},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18351143598556519},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.173040509223938},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1710454821586609},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.12209680676460266},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.09102723002433777}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.759939968585968},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7017822861671448},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.685867428779602},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6640834808349609},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6577333807945251},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6349748969078064},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5883011817932129},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5127445459365845},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.481720507144928},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4742923080921173},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.47302746772766113},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.44236382842063904},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18351143598556519},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.173040509223938},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1710454821586609},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12209680676460266},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.09102723002433777},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/essderc.2014.6948846","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2014.6948846","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 44th European Solid State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01906146v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01906146","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"44th European Solid State Device Research Conference (ESSDERC), Sep 2014, Venice, Italy. ⟨10.1109/ESSDERC.2014.6948846⟩","raw_type":"Conference papers"},{"id":"pmh:oai:HAL:hal-02003867v1","is_oa":false,"landing_page_url":"https://hal.archives-ouvertes.fr/hal-02003867","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2014 ESSDERC Proceedings","raw_type":"\\ninfo:eu-repo/semantics/conferenceObject\\n"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1517947678","https://openalex.org/W1968450952","https://openalex.org/W1988180646","https://openalex.org/W2000637588","https://openalex.org/W2020330572","https://openalex.org/W2024700494","https://openalex.org/W2072938838","https://openalex.org/W2096652287","https://openalex.org/W2108519226","https://openalex.org/W2119143252","https://openalex.org/W2139424966"],"related_works":["https://openalex.org/W2326188151","https://openalex.org/W2031432268","https://openalex.org/W2386361943","https://openalex.org/W2149895879","https://openalex.org/W4250300609","https://openalex.org/W2010357007","https://openalex.org/W2545707786","https://openalex.org/W2473578222","https://openalex.org/W2264082943","https://openalex.org/W2102078456"],"abstract_inverted_index":{"We":[0,34],"present":[1],"a":[2,100],"powerful":[3],"technique":[4],"for":[5,21,41],"the":[6,16,38,65,110,114],"characterization":[7],"of":[8,18,44,67,70],"FDSOI":[9],"devices.":[10,33],"For":[11],"example,":[12],"in":[13,31,51],"CMOS":[14],"designs,":[15],"evaluation":[17],"threshold":[19,39,111],"voltage":[20,40,112],"N":[22],"and":[23,28,61,72,93],"also":[24,109],"P-MOSFETs":[25],"is":[26,29,96,105],"compulsory":[27],"performed":[30,92],"separate":[32],"propose":[35],"to":[36,82,107],"extract":[37,108],"both":[42,68],"types":[43,69],"transistors":[45],"simultaneously":[46],"by":[47],"using":[48],"capacitance":[49,102],"measurements":[50],"thin":[52],"fully":[53],"depleted":[54],"SOI":[55],"PIN":[56],"gated":[57],"diodes.":[58],"The":[59],"N+":[60],"P+":[62],"terminals":[63],"guarantee":[64],"availability":[66],"carrier":[71],"equilibrium":[73],"conditions":[74],"during":[75],"all":[76],"operation":[77],"modes:":[78],"from":[79,99],"strong":[80,83],"accumulation":[81],"inversion.":[84],"Experiments":[85],"together":[86],"with":[87],"numerical":[88],"TCAD":[89],"simulations":[90],"are":[91],"discussed.":[94],"It":[95],"shown":[97],"that,":[98],"single":[101],"curve,":[103],"it":[104],"possible":[106],"at":[113],"bottom":[115],"interface.":[116]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}