{"id":"https://openalex.org/W2078325643","doi":"https://doi.org/10.1109/essderc.2013.6818863","title":"Flicker noise in advanced CMOS technology: Effects of halo implant","display_name":"Flicker noise in advanced CMOS technology: Effects of halo implant","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2078325643","doi":"https://doi.org/10.1109/essderc.2013.6818863","mag":"2078325643"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2013.6818863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2013.6818863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057069982","display_name":"Navid Paydavosi","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Navid Paydavosi","raw_affiliation_strings":["Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","institution_ids":[]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108669319","display_name":"Sriramkumar Venugopalan","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sriramkumar Venugopalan","raw_affiliation_strings":["Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","institution_ids":[]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088108456","display_name":"Angada B. Sachid","orcid":"https://orcid.org/0000-0002-7596-2314"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Angada Sachid","raw_affiliation_strings":["Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A"],"affiliations":[{"raw_affiliation_string":"Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039764227","display_name":"Ali M. Niknejad","orcid":"https://orcid.org/0000-0002-9246-9791"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ali Niknejad","raw_affiliation_strings":["Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A"],"affiliations":[{"raw_affiliation_string":"Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058605789","display_name":"Chenming Hu","orcid":"https://orcid.org/0000-0003-0836-6296"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chenming Hu","raw_affiliation_strings":["Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A"],"affiliations":[{"raw_affiliation_string":"Advanced CMOS Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California Berkeley,Berkeley,CA,U.S.A","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080821307","display_name":"S. Dey","orcid":"https://orcid.org/0000-0003-0613-9233"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sagnik Dey","raw_affiliation_strings":["Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","institution_ids":[]},{"raw_affiliation_string":"Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113788930","display_name":"Samuel P. Martin","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel Martin","raw_affiliation_strings":["Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","institution_ids":[]},{"raw_affiliation_string":"Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100327327","display_name":"Xin Zhang","orcid":"https://orcid.org/0000-0001-5647-2777"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Zhang","raw_affiliation_strings":["Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science, University of California, Berkeley, CA, U.S.A","institution_ids":[]},{"raw_affiliation_string":"Advanced CMOS Technology Development Texas Instruments Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5057069982"],"corresponding_institution_ids":["https://openalex.org/I95457486"],"apc_list":null,"apc_paid":null,"fwci":0.4729,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.70132286,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"238","last_page":"241"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.903546929359436},{"id":"https://openalex.org/keywords/halo","display_name":"Halo","score":0.833280086517334},{"id":"https://openalex.org/keywords/flicker","display_name":"Flicker","score":0.7387599945068359},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6641760468482971},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6089299917221069},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4601583480834961},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44427043199539185},{"id":"https://openalex.org/keywords/noise-power","display_name":"Noise power","score":0.4237307012081146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41817033290863037},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4089902639389038},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3903641700744629},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3785037398338318},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34188586473464966},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32667845487594604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20350772142410278},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.16361141204833984},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13183414936065674},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.08649149537086487},{"id":"https://openalex.org/keywords/astrophysics","display_name":"Astrophysics","score":0.08060958981513977},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06235799193382263}],"concepts":[{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.903546929359436},{"id":"https://openalex.org/C184665706","wikidata":"https://www.wikidata.org/wiki/Q186310","display_name":"Halo","level":3,"score":0.833280086517334},{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.7387599945068359},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6641760468482971},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6089299917221069},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4601583480834961},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44427043199539185},{"id":"https://openalex.org/C203234222","wikidata":"https://www.wikidata.org/wiki/Q2133519","display_name":"Noise power","level":3,"score":0.4237307012081146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41817033290863037},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4089902639389038},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3903641700744629},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3785037398338318},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34188586473464966},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32667845487594604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20350772142410278},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.16361141204833984},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13183414936065674},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.08649149537086487},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.08060958981513977},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06235799193382263},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C98444146","wikidata":"https://www.wikidata.org/wiki/Q318","display_name":"Galaxy","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/essderc.2013.6818863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2013.6818863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.800000011920929,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W145867509","https://openalex.org/W1547953386","https://openalex.org/W1941198823","https://openalex.org/W1982641779","https://openalex.org/W2065981769","https://openalex.org/W2096067137","https://openalex.org/W2124869598","https://openalex.org/W2142423888","https://openalex.org/W2148032760","https://openalex.org/W2161933797","https://openalex.org/W2900620004","https://openalex.org/W2993104567","https://openalex.org/W6756623825"],"related_works":["https://openalex.org/W2552648693","https://openalex.org/W4245802979","https://openalex.org/W2158854703","https://openalex.org/W2085849726","https://openalex.org/W2542967769","https://openalex.org/W2904853649","https://openalex.org/W2762082833","https://openalex.org/W1993813543","https://openalex.org/W2324897795","https://openalex.org/W2157087401"],"abstract_inverted_index":{"A":[0],"new":[1],"model":[2,30,52],"and":[3,25,51],"a":[4],"theory":[5],"to":[6],"capture":[7,33],"the":[8,15,19,34,38,46,53],"effects":[9],"of":[10,18,37,57],"halo":[11],"(pocket)":[12],"implants":[13],"on":[14],"flicker":[16],"noise":[17],"advanced-node":[20],"MOSFETs":[21],"have":[22],"been":[23],"proposed":[24],"verified":[26],"with":[27],"measurements.":[28],"The":[29],"can":[31],"accurately":[32],"bias":[35],"dependence":[36,56],"drain-current":[39],"flicker-noise":[40],"(FN)":[41],"power":[42,59],"density.":[43],"Also":[44],"for":[45],"first":[47],"time,":[48],"we":[49],"explain":[50],"unexpected":[54],"channel-length":[55],"FN":[58],"density":[60],"in":[61],"strong-halo":[62],"devices.":[63]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}