{"id":"https://openalex.org/W1995379954","doi":"https://doi.org/10.1109/essderc.2013.6818852","title":"Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets","display_name":"Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W1995379954","doi":"https://doi.org/10.1109/essderc.2013.6818852","mag":"1995379954"},"language":"en","primary_location":{"id":"doi:10.1109/essderc.2013.6818852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2013.6818852","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044862213","display_name":"S. Makovejev","orcid":null},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Makovejev","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023762327","display_name":"Babak Kazemi Esfeh","orcid":"https://orcid.org/0000-0002-3104-890X"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kazemi Esfeh","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075705263","display_name":"Jean\u2010Pierre Raskin","orcid":"https://orcid.org/0000-0001-9715-9699"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J.-P. Raskin","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064026729","display_name":"Denis Flandre","orcid":"https://orcid.org/0000-0001-5298-5196"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"D. Flandre","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053011098","display_name":"Valeriya Kilchytska","orcid":"https://orcid.org/0000-0002-8540-3313"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Kilchytska","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"[ICTEAM Institute, Universit\u00e9 Catholique de Louvain, Louvain la neuve, Belgium]","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069215871","display_name":"F. Andrieu","orcid":"https://orcid.org/0000-0002-1951-1033"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Andrieu","raw_affiliation_strings":["CEA-Leti, MINATEC Campus, Grenoble, France","CEA-Leti, MINATEC Campus Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-Leti, MINATEC Campus, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I4210150049","https://openalex.org/I899635006"]},{"raw_affiliation_string":"CEA-Leti, MINATEC Campus Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I4210150049"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0265,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.85315446,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"194","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.5104002356529236},{"id":"https://openalex.org/keywords/extrapolation","display_name":"Extrapolation","score":0.47396036982536316},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3747086822986603},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.361322283744812},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3487657904624939},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26352426409721375},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.250630259513855},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15389543771743774},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14705625176429749},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1239292323589325},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.06951501965522766}],"concepts":[{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.5104002356529236},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.47396036982536316},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3747086822986603},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.361322283744812},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3487657904624939},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26352426409721375},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.250630259513855},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15389543771743774},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14705625176429749},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1239292323589325},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.06951501965522766}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/essderc.2013.6818852","is_oa":false,"landing_page_url":"https://doi.org/10.1109/essderc.2013.6818852","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","raw_type":"proceedings-article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:140997","is_oa":false,"landing_page_url":"http://hdl.handle.net/2078.1/140997","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1499569493","https://openalex.org/W1594017076","https://openalex.org/W1971662529","https://openalex.org/W1989624018","https://openalex.org/W1990575078","https://openalex.org/W2000774265","https://openalex.org/W2020330572","https://openalex.org/W2058217746","https://openalex.org/W2066387402","https://openalex.org/W2070007292","https://openalex.org/W2106941563","https://openalex.org/W2114644969","https://openalex.org/W2119082652","https://openalex.org/W2125385579","https://openalex.org/W2136468294","https://openalex.org/W2172094277","https://openalex.org/W6629982659"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W1968270095","https://openalex.org/W4296478327","https://openalex.org/W1960072520","https://openalex.org/W2042397106","https://openalex.org/W4361730764","https://openalex.org/W1965029248","https://openalex.org/W2220129715","https://openalex.org/W2387596242"],"abstract_inverted_index":{"Assessment":[0],"of":[1,14,35,73,93,101,114],"global":[2,102],"threshold":[3],"voltage":[4],"(Vth)":[5],"variability":[6,105,116],"in":[7],"advanced":[8],"silicon-on-insulator":[9],"devices":[10],"implies":[11],"careful":[12],"selection":[13],"a":[15],"Vthextraction":[16],"technique":[17],"as":[18,41],"different":[19,24],"methods":[20,55],"are":[21,119],"sensitive":[22,70],"to":[23,71],"parameters":[25],"and":[26,46,80],"effects.":[27,98],"Our":[28],"main":[29],"focus":[30],"is":[31,56,60,68,89,106],"on":[32],"experimental":[33],"assessment":[34],"most":[36],"widely":[37],"used":[38],"techniques,":[39],"such":[40],"constant":[42],"current,":[43],"transconductance":[44],"derivative":[45],"recently":[47],"introduced":[48],"gm/Idtechniques.":[49],"Some":[50],"comparison":[51],"with":[52],"linear":[53],"extrapolation":[54],"also":[57],"provided.":[58],"It":[59],"shown":[61],"that":[62],"gm/Idmethod,":[63],"using":[64],"data":[65],"near":[66],"threshold,":[67],"less":[69],"cross-impact":[72],"short":[74],"channel":[75],"effects":[76],"(i.e.":[77],"subthreshold":[78],"slope":[79],"drain":[81],"induced":[82],"barrier":[83],"lowering)":[84],"variability.":[85],"Therefore":[86],"this":[87],"method":[88],"preferred":[90],"for":[91,108],"extraction":[92],"intrinsic":[94],"Vthvariability":[95],"without":[96],"parasitic":[97],"Temperature":[99],"evolution":[100],"inter-die":[103],"parameter":[104],"assessed":[107],"the":[109],"first":[110],"time.":[111],"Possible":[112],"reasons":[113],"slight":[115],"temperature":[117],"dependence":[118],"discussed.":[120]},"counts_by_year":[{"year":2016,"cited_by_count":4},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}