{"id":"https://openalex.org/W4387411191","doi":"https://doi.org/10.1109/esscirc59616.2023.10268764","title":"A 3.8 mW 1.9 m \u03a9/\u221aHz Electrical Impedance Tomography Imaging with 28.4 M \u03a9 High Input Impedance and Loading Calibration","display_name":"A 3.8 mW 1.9 m \u03a9/\u221aHz Electrical Impedance Tomography Imaging with 28.4 M \u03a9 High Input Impedance and Loading Calibration","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387411191","doi":"https://doi.org/10.1109/esscirc59616.2023.10268764"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc59616.2023.10268764","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074016364","display_name":"Soyeon Um","orcid":"https://orcid.org/0000-0002-8526-2047"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Soyeon Um","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology (KAIST)"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology (KAIST)","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011205347","display_name":"Jaehyuk Lee","orcid":"https://orcid.org/0000-0001-7113-1161"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuk Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology (SAIT)"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology (SAIT)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-Jun Yoo","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology (KAIST)"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology (KAIST)","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5074016364"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.3918,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60544637,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"357","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7828620672225952},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.682658851146698},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.664762020111084},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.5925325751304626},{"id":"https://openalex.org/keywords/omega","display_name":"Omega","score":0.5388433933258057},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5233827829360962},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5120971202850342},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4998588562011719},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.4872647523880005},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4464867115020752},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.425403356552124},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.415620893239975},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4123057723045349},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3648155927658081},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22860687971115112},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17925581336021423}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7828620672225952},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.682658851146698},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.664762020111084},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5925325751304626},{"id":"https://openalex.org/C2779557605","wikidata":"https://www.wikidata.org/wiki/Q9890","display_name":"Omega","level":2,"score":0.5388433933258057},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5233827829360962},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5120971202850342},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4998588562011719},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.4872647523880005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4464867115020752},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.425403356552124},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.415620893239975},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4123057723045349},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3648155927658081},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22860687971115112},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17925581336021423},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc59616.2023.10268764","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1998025986","https://openalex.org/W2041556066","https://openalex.org/W2088350283","https://openalex.org/W2761309853","https://openalex.org/W2897807752","https://openalex.org/W3097609090","https://openalex.org/W7065563295"],"related_works":["https://openalex.org/W2058355111","https://openalex.org/W2126751867","https://openalex.org/W2015465229","https://openalex.org/W131967906","https://openalex.org/W2003265764","https://openalex.org/W2157668579","https://openalex.org/W2142686261","https://openalex.org/W2166143048","https://openalex.org/W1994958690","https://openalex.org/W2155280843"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"an":[3,96],"advanced":[4],"electrical":[5],"impedance":[6,19,43,98,112],"tomography":[7],"(EIT)":[8],"imaging":[9,147],"IC":[10,81,148],"that":[11],"is":[12,25,149],"designed":[13],"to":[14,120],"enhance":[15],"stability":[16],"against":[17],"contact":[18],"variations.":[20],"The":[21,79,110,141],"6":[22],"m$\\mathrm{m}^{2}$":[23],"chip":[24],"fabricated":[26],"using":[27,161],"a":[28,40,57,83,136,157,162],"TSMC":[29],"180":[30],"nm":[31],"CMOS":[32],"process":[33],"and":[34,55,94,126],"contains":[35],"2":[36],"key":[37],"features:":[38],"1)":[39],"high":[41,133],"input":[42,111],"instrumentation":[44],"amplifier":[45],"(IA)":[46],"with":[47,62],"auxiliary":[48],"source":[49],"followers":[50],"for":[51,67],"robust":[52],"voltage":[53],"sensing,":[54],"2)":[56],"Trans-Conductance":[58],"(TC)":[59],"current":[60,73],"driver":[61],"Trans-Impedance":[63],"(TI)":[64],"monitoring":[65],"circuit":[66],"precise":[68],"measurement":[69],"of":[70,87,100,113,139,143,156],"the":[71,76,91,114,144],"injected":[72],"while":[74],"eliminating":[75],"loading":[77],"effect.":[78],"proposed":[80,145],"has":[82,116],"low":[84],"power":[85],"dissipation":[86],"only3.8":[88],"mW,":[89],"excluding":[90],"injection":[92],"current,":[93],"offers":[95],"impressive":[97],"resolution":[99],"1.9":[101],"m$1.9":[102],"\\mathrm{~m}":[103],"\\Omega":[104],"/":[105],"\\sqrt{":[106],"}":[107],"\\mathbf{H":[108],"z}$.":[109],"IA":[115],"been":[117],"increased":[118],"up":[119],"2.9":[121],"G$\\Omega$":[122],"at":[123,129],"100":[124],"Hz":[125],"230":[127],"k$\\Omega$":[128],"1":[130],"MHz,":[131],"indicating":[132],"performance":[134],"over":[135],"wide":[137],"range":[138],"frequencies.":[140],"effectiveness":[142],"EIT":[146],"demonstrated":[150],"by":[151],"successfully":[152],"reconstructing":[153],"3D":[154],"images":[155],"human":[158],"body":[159],"phantom":[160],"mobile":[163],"device.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}