{"id":"https://openalex.org/W4387411183","doi":"https://doi.org/10.1109/esscirc59616.2023.10268730","title":"93.89% Peak Efficiency 24V-to-1V DC-DC Converter with Fast In-Situ Efficiency Tracking and Power-FET Code Roaming","display_name":"93.89% Peak Efficiency 24V-to-1V DC-DC Converter with Fast In-Situ Efficiency Tracking and Power-FET Code Roaming","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387411183","doi":"https://doi.org/10.1109/esscirc59616.2023.10268730"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc59616.2023.10268730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc59616.2023.10268730","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088474365","display_name":"Zhaoqing Wang","orcid":"https://orcid.org/0000-0002-5548-3965"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhaoqing Wang","raw_affiliation_strings":["Columbia University,NY,USA","Columbia University, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University,NY,USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Columbia University, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100786430","display_name":"Mao Li","orcid":"https://orcid.org/0009-0009-5968-7250"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mao Li","raw_affiliation_strings":["Columbia University,NY,USA","Columbia University, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University,NY,USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Columbia University, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080332152","display_name":"Suhwan Kim","orcid":"https://orcid.org/0000-0001-9107-2963"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suhwan Kim","raw_affiliation_strings":["Intel,OR,USA","Intel, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel,OR,USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000682696","display_name":"Nachiket Desai","orcid":"https://orcid.org/0000-0002-6795-6440"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nachiket Desai","raw_affiliation_strings":["Intel,OR,USA","Intel, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel,OR,USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074107306","display_name":"Ram Krishnamurthy","orcid":"https://orcid.org/0000-0002-2428-7099"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ram K. Krishnamurthy","raw_affiliation_strings":["Intel,OR,USA","Intel, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel,OR,USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007950276","display_name":"Orlando Lazaro","orcid":"https://orcid.org/0000-0002-3203-0138"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Orlando Lazaro","raw_affiliation_strings":["Texas Instruments,TX,USA","Texas Instruments, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments,TX,USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103110653","display_name":"Andres Blanco","orcid":"https://orcid.org/0000-0002-9417-5893"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andres Blanco","raw_affiliation_strings":["Texas Instruments,TX,USA","Texas Instruments, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments,TX,USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051085669","display_name":"Xin Zhang","orcid":"https://orcid.org/0000-0002-0579-2268"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Zhang","raw_affiliation_strings":["Columbia University,NY,USA","IBM Research, NY, USA","Columbia University, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University,NY,USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"IBM Research, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"Columbia University, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Columbia University,NY,USA","Columbia University, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University,NY,USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Columbia University, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5088474365"],"corresponding_institution_ids":["https://openalex.org/I78577930"],"apc_list":null,"apc_paid":null,"fwci":0.2678,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54592546,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"437","last_page":"440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/roaming","display_name":"Roaming","score":0.7860448360443115},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.5556478500366211},{"id":"https://openalex.org/keywords/buck-converter","display_name":"Buck converter","score":0.5527294874191284},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5121219158172607},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5008795261383057},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.49953794479370117},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4821621775627136},{"id":"https://openalex.org/keywords/electrical-efficiency","display_name":"Electrical efficiency","score":0.4583946466445923},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4536345899105072},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4418479800224304},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34092628955841064},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3374934792518616},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2993057668209076},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13711434602737427},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11965110898017883}],"concepts":[{"id":"https://openalex.org/C194498986","wikidata":"https://www.wikidata.org/wiki/Q680016","display_name":"Roaming","level":2,"score":0.7860448360443115},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.5556478500366211},{"id":"https://openalex.org/C150818752","wikidata":"https://www.wikidata.org/wiki/Q83804","display_name":"Buck converter","level":3,"score":0.5527294874191284},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5121219158172607},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5008795261383057},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.49953794479370117},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4821621775627136},{"id":"https://openalex.org/C118993495","wikidata":"https://www.wikidata.org/wiki/Q5042828","display_name":"Electrical efficiency","level":3,"score":0.4583946466445923},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4536345899105072},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4418479800224304},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34092628955841064},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3374934792518616},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2993057668209076},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13711434602737427},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11965110898017883},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc59616.2023.10268730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc59616.2023.10268730","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2126098669","https://openalex.org/W2131911128","https://openalex.org/W3015303323","https://openalex.org/W3015925264","https://openalex.org/W3135317464","https://openalex.org/W4242751338","https://openalex.org/W4286571617","https://openalex.org/W4313120183","https://openalex.org/W6679413404","https://openalex.org/W6746233465"],"related_works":["https://openalex.org/W2369138185","https://openalex.org/W2118242884","https://openalex.org/W2945277231","https://openalex.org/W2388705066","https://openalex.org/W4210904806","https://openalex.org/W4312698066","https://openalex.org/W2015804271","https://openalex.org/W2896958856","https://openalex.org/W2355454848","https://openalex.org/W1967901653"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,19,44,62,67],"high-efficiency":[4],"24V-to-1V":[5],"buck":[6],"converter":[7,58],"featuring":[8],"two":[9],"techniques":[10],"to":[11,27,49,86,89],"improve":[12],"efficiency":[13,22,31,70,82,93],"and":[14,35,38],"reliability.":[15],"First,":[16],"we":[17,42],"propose":[18,43],"fast":[20],"in-situ":[21],"tracking":[23,78],"technique,":[24],"which":[25],"helps":[26],"maintain":[28],"high":[29],"power":[30,69],"across":[32],"load":[33,75],"conditions":[34],"process,":[36,65],"voltage,":[37],"temperature":[39],"variations.":[40],"Second,":[41],"power-FET":[45],"code":[46],"roaming":[47,98],"technique":[48,79,99],"avoid":[50],"excessive":[51],"aging":[52],"on":[53],"specific":[54],"segments.":[55],"The":[56,77],"proposed":[57],"was":[59],"fabricated":[60],"in":[61],"180nm":[63],"BCD":[64],"achieving":[66],"peak":[68],"of":[71,84],"93.89%":[72],"at":[73],"405-mA":[74],"current.":[76],"demonstrates":[80],"an":[81],"improvement":[83],"up":[85],"34.74%":[87],"compared":[88],"the":[90,97,102],"baseline":[91],"without":[92],"tracking.":[94],"In":[95],"addition,":[96],"slows":[100],"down":[101],"on-time":[103],"resistance":[104],"degradation":[105],"by":[106],"5.8X.":[107]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}