{"id":"https://openalex.org/W4387411241","doi":"https://doi.org/10.1109/esscirc59616.2023.10268720","title":"A 4.6nW Subthreshold Voltage Reference with 400\u00d7 Current Variation Reduction and 64-Step 0.11% Output Voltage Programmability","display_name":"A 4.6nW Subthreshold Voltage Reference with 400\u00d7 Current Variation Reduction and 64-Step 0.11% Output Voltage Programmability","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387411241","doi":"https://doi.org/10.1109/esscirc59616.2023.10268720"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc59616.2023.10268720","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025728433","display_name":"Yimai Peng","orcid":"https://orcid.org/0000-0001-9860-0175"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yimai Peng","raw_affiliation_strings":["University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039742451","display_name":"Ashwin Bhat","orcid":"https://orcid.org/0000-0002-6395-9345"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ashwin Bhat","raw_affiliation_strings":["NXP Semiconductors,Eindhoven,Netherlands","NXP Semiconductors, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven,Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018543857","display_name":"Sanjay Kumar Wadhwa","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Sanjay Wadhwa","raw_affiliation_strings":["NXP Semiconductors,Eindhoven,Netherlands","NXP Semiconductors, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven,Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026311377","display_name":"David Blaauw","orcid":"https://orcid.org/0000-0001-6744-7075"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Blaauw","raw_affiliation_strings":["University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000767141","display_name":"Dennis Sylvester","orcid":"https://orcid.org/0000-0003-2598-0458"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis Sylvester","raw_affiliation_strings":["University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan,Dept. of Electrical Engineering and Computer Science,Ann Arbor,MI,USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5025728433"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":0.3371,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.53940149,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"89","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.7006644010543823},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6323224902153015},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6224203109741211},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5761102437973022},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.5682628154754639},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5279616117477417},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.5055391788482666},{"id":"https://openalex.org/keywords/overdrive-voltage","display_name":"Overdrive voltage","score":0.49369367957115173},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.4886780083179474},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4803560972213745},{"id":"https://openalex.org/keywords/voltage-reduction","display_name":"Voltage reduction","score":0.46947988867759705},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41482290625572205},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38619428873062134},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36321645975112915},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3579332232475281},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2722886800765991},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20194214582443237}],"concepts":[{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.7006644010543823},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6323224902153015},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6224203109741211},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5761102437973022},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.5682628154754639},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5279616117477417},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5055391788482666},{"id":"https://openalex.org/C195905723","wikidata":"https://www.wikidata.org/wiki/Q7113634","display_name":"Overdrive voltage","level":5,"score":0.49369367957115173},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.4886780083179474},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4803560972213745},{"id":"https://openalex.org/C2780745134","wikidata":"https://www.wikidata.org/wiki/Q7940751","display_name":"Voltage reduction","level":3,"score":0.46947988867759705},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41482290625572205},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38619428873062134},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36321645975112915},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3579332232475281},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2722886800765991},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20194214582443237}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc59616.2023.10268720","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2114323486","https://openalex.org/W2128134737","https://openalex.org/W2584442328","https://openalex.org/W2592861018","https://openalex.org/W2883484217","https://openalex.org/W2898646670","https://openalex.org/W2899242563","https://openalex.org/W2948901988","https://openalex.org/W2965577611","https://openalex.org/W3041872181","https://openalex.org/W3157851941","https://openalex.org/W6756309172"],"related_works":["https://openalex.org/W2078126217","https://openalex.org/W2536407726","https://openalex.org/W2064668431","https://openalex.org/W2366864518","https://openalex.org/W4226184094","https://openalex.org/W2043350930","https://openalex.org/W2018896836","https://openalex.org/W4388130316","https://openalex.org/W4316814912","https://openalex.org/W1969301141"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,33,54,59,72,81,98,108],"nanowatt":[4],"subthreshold":[5],"voltage":[6,62,68,78,112,117],"reference":[7,35,61,79],"that":[8],"achieves":[9,80],"significant":[10],"reduction":[11],"of":[12,21,84],"temperature-induced":[13],"current":[14,44,92],"variation":[15,45,93],"and":[16,42,63,89],"with":[17,114],"fully":[18],"digital":[19],"programmability":[20,113],"its":[22],"output":[23,111],"voltage,":[24],"for":[25,58,65],"the":[26,66,76,91],"first":[27],"time.":[28],"The":[29],"proposed":[30,77],"circuit":[31],"uses":[32],"clock":[34],"to":[36,96],"achieve":[37],"adaptive":[38],"duty":[39],"cycled":[40],"operation":[41],"reduce":[43],"in":[46,71],"different":[47],"temperature":[48,82],"conditions.":[49],"In":[50],"addition,":[51],"it":[52],"integrates":[53],"programmable":[55],"DC-DC":[56],"converter":[57],"tunable":[60],"compensates":[64],"die-to-die":[67],"variation.":[69],"Fabricated":[70],"$0.18\\mu\\mathrm{m}$":[73],"CMOS":[74],"process,":[75],"coefficient":[83],"176ppm/\u00b0C":[85],"while":[86],"consuming":[87],"4.6nW,":[88],"reduces":[90],"between":[94],"temperatures":[95],"2.75%/\u00b0C,":[97],"$":[99],"400\\times$":[100],"improvement":[101],"over":[102],"prior":[103],"work.":[104],"It":[105],"also":[106],"provides":[107],"64":[109],"-step":[110],"1.2mV":[115],"LSB":[116],"step.":[118]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}