{"id":"https://openalex.org/W4387411128","doi":"https://doi.org/10.1109/esscirc59616.2023.10268716","title":"A 2MHz-BW 96.8dB-SNDR 98dB-SNR CT-Zoom ADC With Residue Feedforward, Redundancy and Fully LMS-Based Calibration","display_name":"A 2MHz-BW 96.8dB-SNDR 98dB-SNR CT-Zoom ADC With Residue Feedforward, Redundancy and Fully LMS-Based Calibration","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4387411128","doi":"https://doi.org/10.1109/esscirc59616.2023.10268716"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc59616.2023.10268716","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268716","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039983089","display_name":"Yijie Li","orcid":"https://orcid.org/0009-0004-3636-9624"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yijie Li","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047431234","display_name":"Lairong Fang","orcid":"https://orcid.org/0009-0008-7578-6913"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lairong Fang","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100656792","display_name":"Xiaoyang Zeng","orcid":"https://orcid.org/0000-0003-3986-137X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyang Zeng","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082092557","display_name":"Zhiliang Hong","orcid":"https://orcid.org/0000-0002-9968-5964"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Hong","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089070385","display_name":"Jiawei Xu","orcid":"https://orcid.org/0000-0002-4150-0971"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Xu","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5039983089"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.1125,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.41163977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"397","last_page":"400"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feed-forward","display_name":"Feed forward","score":0.5670228004455566},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5545133352279663},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5098437666893005},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.44106024503707886},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.4247349202632904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40503108501434326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33116114139556885},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.1854250431060791},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14422661066055298},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.12521502375602722},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08852279186248779}],"concepts":[{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.5670228004455566},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5545133352279663},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5098437666893005},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.44106024503707886},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.4247349202632904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40503108501434326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33116114139556885},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.1854250431060791},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14422661066055298},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12521502375602722},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08852279186248779},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc59616.2023.10268716","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/esscirc59616.2023.10268716","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1524535447","https://openalex.org/W2034059472","https://openalex.org/W2293521946","https://openalex.org/W2895895182","https://openalex.org/W2921756781","https://openalex.org/W4220965079","https://openalex.org/W6760674879"],"related_works":["https://openalex.org/W1976391040","https://openalex.org/W2157118673","https://openalex.org/W2913428688","https://openalex.org/W3097708393","https://openalex.org/W2016777110","https://openalex.org/W1624221390","https://openalex.org/W574432569","https://openalex.org/W2109445684","https://openalex.org/W2081082331","https://openalex.org/W1482165582"],"abstract_inverted_index":{"This":[0],"article":[1],"describes":[2],"a":[3,8,18,38,56,69,82,89],"continuous-time":[4],"(CT)-Zoom":[5],"ADC":[6,55,73],"utilizing":[7],"single-amplifier":[9],"biquad":[10],"(SAB)-based":[11],"integrator":[12],"to":[13,23,43,49,64,96],"achieve":[14],"fourth-order":[15],"noise":[16,33],"shaping,":[17],"residue":[19],"feedforward":[20],"(FF)":[21],"path":[22],"mitigate":[24],"both":[25],"signal":[26],"transfer":[27],"function":[28],"(STF)":[29],"peaking":[30],"and":[31,62,78,85,101],"quantization":[32],"leakage,":[34],"as":[35,37],"well":[36],"fully":[39],"LMS-based":[40],"digital":[41],"calibration":[42],"reduce":[44],"R-DAC":[45,52],"mismatch.":[46],"Applying":[47],"redundancy":[48],"the":[50,54,72],"split":[51],"provides":[53],"large":[57],"maximum":[58],"stable":[59],"amplitude":[60],"(MSA)":[61],"robustness":[63],"RC":[65],"variations.":[66],"Fabricated":[67],"in":[68,81],"40nm":[70],"CMOS,":[71],"achieves":[74],"96.":[75],"8dB":[76],"SNDR":[77],"98dB":[79],"SNR":[80],"2MHz":[83],"bandwidth,":[84],"consumes":[86],"21.1mW":[87],"at":[88],"1.":[90],"2V":[91],"supply.":[92],"These":[93],"results":[94],"correspond":[95],"state-of-the-art":[97],"$\\mathrm{F}\\mathrm{o}\\mathrm{M}\\mathrm{s}_{-}$SNDR":[98],"of":[99,103],"l76.6dB":[100],"$\\mathrm{F}\\mathrm{o}\\mathrm{M}\\mathrm{s}_{-}\\mathrm{S}\\mathrm{N}\\mathrm{R}$":[102],"l77.8dB.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}