{"id":"https://openalex.org/W4308089788","doi":"https://doi.org/10.1109/esscirc55480.2022.9911509","title":"SIF-NPU: A 28nm 3.48 TOPS/W 0.25 TOPS/mm2 CNN Accelerator with Spatially Independent Fusion for Real-Time UHD Super-Resolution","display_name":"SIF-NPU: A 28nm 3.48 TOPS/W 0.25 TOPS/mm2 CNN Accelerator with Spatially Independent Fusion for Real-Time UHD Super-Resolution","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089788","doi":"https://doi.org/10.1109/esscirc55480.2022.9911509"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911509","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062224978","display_name":"Sumin Lee","orcid":"https://orcid.org/0000-0002-6204-0556"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sumin Lee","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088986232","display_name":"Ki-Beom Lee","orcid":"https://orcid.org/0000-0002-7251-0953"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki-Beom Lee","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039718583","display_name":"Sunghwan Joo","orcid":"https://orcid.org/0000-0003-0535-7853"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunghwan Joo","raw_affiliation_string":"Samsung Electronics,Republic of Korea,18448","raw_affiliation_strings":["Samsung Electronics,Republic of Korea,18448"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017873301","display_name":"Hong Keun Ahn","orcid":"https://orcid.org/0000-0001-6101-5386"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hong Keun Ahn","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011863469","display_name":"Junghyup Lee","orcid":"https://orcid.org/0000-0001-7941-8183"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junghyup Lee","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004040977","display_name":"Dohyung Kim","orcid":"https://orcid.org/0000-0003-0184-5681"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dohyung Kim","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054888241","display_name":"Bumsub Ham","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bumsub Ham","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]},{"author_position":"last","author":{"id":"https://openalex.org/A5037010076","display_name":"Seong\u2010Ook Jung","orcid":"https://orcid.org/0000-0003-0757-2581"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Ook Jung","raw_affiliation_string":"School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Yonsei University,Seoul,Republic of Korea,03722"]}],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"has_fulltext":false,"cited_by_count":1,"cited_by_percentile_year":{"min":69,"max":78},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11105","display_name":"Single Image Super-Resolution Techniques","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11105","display_name":"Single Image Super-Resolution Techniques","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Failure Analysis of Integrated Circuits","score":0.9942,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Autofocusing in Microscopy and Photography","score":0.991,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"keyword":"cnn accelerator","score":0.5511},{"keyword":"spatially independent fusion","score":0.3548},{"keyword":"sif-npu","score":0.25},{"keyword":"real-time","score":0.25},{"keyword":"super-resolution","score":0.25}],"concepts":[{"id":"https://openalex.org/C2777675136","wikidata":"https://www.wikidata.org/wiki/Q835642","display_name":"TOPS","level":3,"score":0.73693913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6567679},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4915863},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.4782447},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.46265346},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.453156},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.42029518},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.41509357},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38195074},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.32608825},{"id":"https://openalex.org/C459310","wikidata":"https://www.wikidata.org/wiki/Q117801","display_name":"Computational science","level":1,"score":0.3244043},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29701036},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21392271},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.102692306},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08861083},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C159737794","wikidata":"https://www.wikidata.org/wiki/Q124274","display_name":"Azimuth","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911509","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W54257720","https://openalex.org/W2503339013","https://openalex.org/W2886623847","https://openalex.org/W2966285227","https://openalex.org/W2966432437","https://openalex.org/W3015391117","https://openalex.org/W3025341614","https://openalex.org/W3135210127","https://openalex.org/W3183954477"],"related_works":["https://openalex.org/W2749468216","https://openalex.org/W3119610945","https://openalex.org/W2901465038","https://openalex.org/W4239686595","https://openalex.org/W2981179802","https://openalex.org/W2998526951","https://openalex.org/W2735477435","https://openalex.org/W3181746755","https://openalex.org/W2521062615","https://openalex.org/W3090822330"],"ngrams_url":"https://api.openalex.org/works/W4308089788/ngrams","abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3],"convolutional":[4],"neural":[5],"network":[6],"(CNN)-based":[7],"super-resolution":[8],"accelerator":[9,77,104],"for":[10],"up-scaling":[11,106],"to":[12,28,42,108],"ultra-HD":[13],"(UHD)":[14],"resolution":[15,49],"in":[16,18,32,58,80,111],"real-time":[17],"edge":[19],"devices.":[20],"A":[21],"novel":[22],"error-compensated":[23],"bit":[24,30],"quantization":[25],"is":[26,40,78],"adopted":[27],"reduce":[29],"depth":[31],"the":[33,59,63,69,81,98],"SR":[34],"task.":[35],"Spatially":[36],"independent":[37],"layer":[38],"fusion":[39],"exploited":[41],"satisfy":[43],"high":[44],"throughput":[45],"requirements":[46],"at":[47,86],"UHD":[48,112],"by":[50,67],"increasing":[51],"parallelism.":[52],"Burst":[53],"operation":[54],"with":[55],"write":[56],"mask":[57],"dual-port":[60],"SRAM":[61],"increases":[62],"process":[64],"element":[65],"utilization":[66],"allowing":[68],"concurrent":[70],"multi-access":[71],"without":[72],"exploiting":[73],"additional":[74],"memory.":[75],"The":[76,102],"implemented":[79,103],"28nm":[82],"technology":[83],"and":[84],"shows":[85],"least":[87],"4.3":[88],"times":[89],"higher":[90],"$\\text{FoM}(\\text{TOPS}/\\text{mm}^{2}\\times":[93],"\\text{TOPS/W)}$":[94],"of":[95],"0.87":[96],"than":[97],"state-of-art":[99],"CNN":[100],"accelerators.":[101],"supports":[105],"up":[107],"96":[109],"frames-per-seconds":[110],"resolution.":[113]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4308089788","counts_by_year":[],"updated_date":"2024-03-17T01:26:42.146468","created_date":"2022-11-08"}