{"id":"https://openalex.org/W4308089745","doi":"https://doi.org/10.1109/esscirc55480.2022.9911507","title":"A $130\\mu \\mathrm{W}$ Three-Step DT Incremental $\\displaystyle \\Delta\\sum$ ADC Achieving 107.6dB DR and 99.3dB SNDR with Zoom and Extended-Range Counting","display_name":"A $130\\mu \\mathrm{W}$ Three-Step DT Incremental $\\displaystyle \\Delta\\sum$ ADC Achieving 107.6dB DR and 99.3dB SNDR with Zoom and Extended-Range Counting","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089745","doi":"https://doi.org/10.1109/esscirc55480.2022.9911507"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc55480.2022.9911507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911507","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047431234","display_name":"Lairong Fang","orcid":"https://orcid.org/0009-0008-7578-6913"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lairong Fang","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039983089","display_name":"Yijie Li","orcid":"https://orcid.org/0009-0004-3636-9624"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yijie Li","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029845198","display_name":"Yao Zhang","orcid":"https://orcid.org/0000-0003-1481-8826"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Zhang","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100777357","display_name":"Shuwen Zhang","orcid":"https://orcid.org/0009-0002-7825-8741"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuwen Zhang","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006214126","display_name":"Xiaoyang Zeng","orcid":"https://orcid.org/0009-0001-9928-8782"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyang Zeng","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082092557","display_name":"Zhiliang Hong","orcid":"https://orcid.org/0000-0002-9968-5964"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Hong","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089070385","display_name":"Jiawei Xu","orcid":"https://orcid.org/0000-0002-4150-0971"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Xu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5047431234"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":2.5652,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.91279421,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"554","last_page":"557"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.7567903399467468},{"id":"https://openalex.org/keywords/zoom","display_name":"Zoom","score":0.6479918360710144},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.5794082880020142},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4794960618019104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4573925733566284},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4120495021343231},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3296603560447693},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.21797719597816467},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19545087218284607},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16363981366157532},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0760636031627655},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.07322707772254944}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.7567903399467468},{"id":"https://openalex.org/C124913957","wikidata":"https://www.wikidata.org/wiki/Q1232548","display_name":"Zoom","level":3,"score":0.6479918360710144},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.5794082880020142},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4794960618019104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4573925733566284},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4120495021343231},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3296603560447693},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.21797719597816467},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19545087218284607},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16363981366157532},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0760636031627655},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.07322707772254944},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc55480.2022.9911507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911507","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2071848335","https://openalex.org/W2167563832","https://openalex.org/W2520964342","https://openalex.org/W2892210825","https://openalex.org/W2909134018","https://openalex.org/W2988509678","https://openalex.org/W3106996514","https://openalex.org/W3118295785","https://openalex.org/W3161100177"],"related_works":["https://openalex.org/W2040229502","https://openalex.org/W1580014081","https://openalex.org/W1523707702","https://openalex.org/W2421111280","https://openalex.org/W2097165798","https://openalex.org/W1497881430","https://openalex.org/W2599174517","https://openalex.org/W2117483815","https://openalex.org/W2170102475","https://openalex.org/W3175904419"],"abstract_inverted_index":{"This":[0,77],"paper":[1],"presents":[2],"an":[3],"incremental":[4,37],"<tex":[5,38,69],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[6,39,70],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\Delta\\Sigma$</tex>":[7,40],"ADC":[8],"(IADC)":[9],"utilizing":[10],"a":[11,35,49,52,57,62,74,80],"three-step":[12],"conversion.":[13],"By":[14],"combining":[15],"the":[16,23,27,45],"zoom-in":[17],"and":[18,31,56],"extended-range":[19],"(ER)":[20],"counting":[21],"techniques,":[22],"IADC":[24,47],"significantly":[25],"reduces":[26],"oversampling":[28],"ratio":[29],"(OSR)":[30],"power":[32],"consumption":[33],"of":[34,65,84],"standard":[36],"counterpart.":[41],"Clocked":[42],"at":[43],"512kHz,":[44],"prototype":[46],"achieves":[48],"107.6dB":[50],"DR,":[51],"104.9dB":[53],"peak":[54,59],"SNR,":[55],"99.3dB":[58],"SNDR":[60],"for":[61],"conversion":[63],"rate":[64],"2kS/s":[66],"while":[67],"consuming":[68],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$130{\\mu":[71],"W}$</tex>":[72],"from":[73],"1.8V":[75],"supply.":[76],"corresponds":[78],"to":[79],"state-of-the-art":[81],"Schreier":[82],"FoMDR":[83],"176.5dB.":[85]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}